Download or read book 2015 IEEE 24th Asian Test Symposium ATS written by and published by . This book was released on with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Design and Testing of Reversible Logic written by Ashutosh Kumar Singh and published by Springer. This book was released on 2019-07-29 with total page 265 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book compiles efficient design and test methodologies for the implementation of reversible logic circuits. The methodologies covered in the book are design approaches, test approaches, fault tolerance in reversible circuits and physical implementation techniques. The book also covers the challenges and the reversible logic circuits to meet these challenges stimulated during each stage of work cycle. The novel computing paradigms are being explored to serve as a basis for fast and low power computation.
Download or read book VLSI Design and Test written by Brajesh Kumar Kaushik and published by Springer. This book was released on 2017-12-21 with total page 820 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Download or read book System on Chip Security written by Farimah Farahmandi and published by Springer Nature. This book was released on 2019-11-22 with total page 295 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes a wide variety of System-on-Chip (SoC) security threats and vulnerabilities, as well as their sources, in each stage of a design life cycle. The authors discuss a wide variety of state-of-the-art security verification and validation approaches such as formal methods and side-channel analysis, as well as simulation-based security and trust validation approaches. This book provides a comprehensive reference for system on chip designers and verification and validation engineers interested in verifying security and trust of heterogeneous SoCs.
Download or read book VLSI SoC Design and Engineering of Electronics Systems Based on New Computing Paradigms written by Nicola Bombieri and published by Springer. This book was released on 2019-06-25 with total page 281 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains extended and revised versions of the best papers presented at the 26th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2018, held in Verona, Italy, in October 2018. The 13 full papers included in this volume were carefully reviewed and selected from the 27 papers (out of 106 submissions) presented at the conference. The papers discuss the latest academic and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) design, considering the challenges of nano-scale, state-of-the-art and emerging manufacturing technologies. In particular they address cutting-edge research fields like heterogeneous, neuromorphic and brain-inspired, biologically-inspired, approximate computing systems.
Download or read book Architecture of Computing Systems ARCS 2020 written by André Brinkmann and published by Springer Nature. This book was released on 2020-07-09 with total page 264 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the proceedings of the 33rd International Conference on Architecture of Computing Systems, ARCS 2020, held in Aachen, Germany, in May 2020.* The 12 full papers in this volume were carefully reviewed and selected from 33 submissions. 6 workshop papers are also included. ARCS has always been a conference attracting leading-edge research outcomes in Computer Architecture and Operating Systems, including a wide spectrum of topics ranging from embedded and real-time systems all the way to large-scale and parallel systems. The selected papers focus on concepts and tools for incorporating self-adaptation and self-organization mechanisms in high-performance computing systems. This includes upcoming approaches for runtime modifications at various abstraction levels, ranging from hardware changes to goal changes and their impact on architectures, technologies, and languages. *The conference was canceled due to the COVID-19 pandemic.
Download or read book Sensors Fault Diagnosis Trends and Applications written by Piotr Witczak and published by MDPI. This book was released on 2021-09-01 with total page 236 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fault diagnosis has always been a concern for industry. In general, diagnosis in complex systems requires the acquisition of information from sensors and the processing and extracting of required features for the classification or identification of faults. Therefore, fault diagnosis of sensors is clearly important as faulty information from a sensor may lead to misleading conclusions about the whole system. As engineering systems grow in size and complexity, it becomes more and more important to diagnose faulty behavior before it can lead to total failure. In the light of above issues, this book is dedicated to trends and applications in modern-sensor fault diagnosis.
Download or read book Test Generation of Crosstalk Delay Faults in VLSI Circuits written by S. Jayanthy and published by Springer. This book was released on 2018-09-20 with total page 161 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
Download or read book Logic and Its Applications written by Mohua Banerjee and published by Springer Nature. This book was released on 2023-02-22 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt: Edited in collaboration with FoLLI, this book constitutes the refereed proceedings of the 10th Indian Conference on Logic and Its Applications, ICLA 2023, which was held in Indore, India, in March 2023. Besides 6 invited papers presented in this volume, there are 9 contributed full papers which were carefully reviewed and selected from 18 submissions. The volume covers a wide range of topics. These topics are related to modal and temporal logics, intuitionistic connexive and imperative logics, systems for reasoning with vagueness and rough concepts, topological quasi-Boolean logic and quasi-Boolean based rough set models, and first-order definability of path functions of graphs.
Download or read book Post Silicon Validation and Debug written by Prabhat Mishra and published by Springer. This book was released on 2018-09-01 with total page 393 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive coverage of System-on-Chip (SoC) post-silicon validation and debug challenges and state-of-the-art solutions with contributions from SoC designers, academic researchers as well as SoC verification experts. The readers will get a clear understanding of the existing debug infrastructure and how they can be effectively utilized to verify and debug SoCs.
Download or read book Approximate Circuits written by Sherief Reda and published by Springer. This book was released on 2018-12-05 with total page 495 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with a comprehensive, state-of-the-art overview of approximate computing, enabling the design trade-off of accuracy for achieving better power/performance efficiencies, through the simplification of underlying computing resources. The authors describe in detail various efforts to generate approximate hardware systems, while still providing an overview of support techniques at other computing layers. The book is organized by techniques for various hardware components, from basic building blocks to general circuits and systems.
Download or read book Redescription Mining written by Esther Galbrun and published by Springer. This book was released on 2018-01-10 with total page 88 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a gentle introduction to redescription mining, a versatile data mining tool that is useful to find distinct common characterizations of the same objects and, vice versa, to identify sets of objects that admit multiple shared descriptions. It is intended for readers who are familiar with basic data analysis techniques such as clustering, frequent itemset mining, and classification. Redescription mining is defined in a general way, making it applicable to different types of data. The general framework is made more concrete through many practical examples that show the versatility of redescription mining. The book also introduces the main algorithmic ideas for mining redescriptions, together with applications from various domains. The final part of the book contains variations and extensions of the basic redescription mining problem, and discusses some future directions and open questions.
Download or read book On Chip Current Sensors for Reliable Secure and Low Power Integrated Circuits written by Rodrigo Possamai Bastos and published by Springer Nature. This book was released on 2019-09-30 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with insight into an alternative approach for enhancing the reliability, security, and low power features of integrated circuit designs, related to transient faults, hardware Trojans, and power consumption. The authors explain how the addition of integrated sensors enables the detection of ionizing particles and how this information can be processed at a high layer. The discussion also includes a variety of applications, such as the detection of hardware Trojans and fault attacks, and how sensors can operate to provide different body bias levels and reduce power costs. Readers can benefit from these sensors-based approaches through designs with fast response time, non-intrusive integration on gate-level and reasonable design costs.
Download or read book Machine Learning in VLSI Computer Aided Design written by Ibrahim (Abe) M. Elfadel and published by Springer. This book was released on 2019-03-15 with total page 694 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with an up-to-date account of the use of machine learning frameworks, methodologies, algorithms and techniques in the context of computer-aided design (CAD) for very-large-scale integrated circuits (VLSI). Coverage includes the various machine learning methods used in lithography, physical design, yield prediction, post-silicon performance analysis, reliability and failure analysis, power and thermal analysis, analog design, logic synthesis, verification, and neuromorphic design. Provides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability; Discusses the use of machine learning techniques in the context of analog and digital synthesis; Demonstrates how to formulate VLSI CAD objectives as machine learning problems and provides a comprehensive treatment of their efficient solutions; Discusses the tradeoff between the cost of collecting data and prediction accuracy and provides a methodology for using prior data to reduce cost of data collection in the design, testing and validation of both analog and digital VLSI designs. From the Foreword As the semiconductor industry embraces the rising swell of cognitive systems and edge intelligence, this book could serve as a harbinger and example of the osmosis that will exist between our cognitive structures and methods, on the one hand, and the hardware architectures and technologies that will support them, on the other....As we transition from the computing era to the cognitive one, it behooves us to remember the success story of VLSI CAD and to earnestly seek the help of the invisible hand so that our future cognitive systems are used to design more powerful cognitive systems. This book is very much aligned with this on-going transition from computing to cognition, and it is with deep pleasure that I recommend it to all those who are actively engaged in this exciting transformation. Dr. Ruchir Puri, IBM Fellow, IBM Watson CTO & Chief Architect, IBM T. J. Watson Research Center
Download or read book The Test and Launch Control Technology for Launch Vehicles written by Zhengyu Song and published by Springer. This book was released on 2018-04-19 with total page 255 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents technologies and solutions related to the test and launch control of rockets and other vehicles, and offers the first comprehensive and systematic introduction to the contributions of the Chinese Long March (Chang Zheng in Chinese, or abbreviated as CZ) rockets in this field. Moreover, it discusses the role of this technology in responsive, reliable, and economical access to space, which is essential for the competitiveness of rockets. The need for rapid development of the aerospace industry for both governmental and commercial projects is addressed. This book is a valuable reference resource for practitioners, and many examples and resources are included, not only from Chinese rockets but also from many other vehicles. It covers guidelines, technologies, and solutions on testing and launch control before rocket takeoff, covering equipment-level testing, system-level testing, simulation tests, etc.
Download or read book Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Download or read book Delay Fault Testing for VLSI Circuits written by Angela Krstic and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 201 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test generation and fault simulation, and methods for design and synthesis for testability. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research. Now they do an even greater service to the profession by collecting the work of a large number of researchers. In addition to expounding such a great deal of information, they have delivered it with utmost clarity. To further the reader's understanding many key concepts are illustrated by simple examples. The basic ideas of delay testing have reached a level of maturity that makes them suitable for practice. In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.
