Download or read book 2014 IEEE International Integrated Reliability Workshop Final Report IIRW 2014 written by and published by . This book was released on 2014 with total page 187 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 2014 IEEE International Integrated Reliability Workshop Final Report IIRW written by IEEE Staff and published by . This book was released on 2014-10-12 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems
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Download or read book Reliability Prediction for Microelectronics written by Joseph B. Bernstein and published by John Wiley & Sons. This book was released on 2024-02-20 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.
Download or read book 1999 IEEE International Integrated Reliability Workshop Final Report written by International Integrated Reliability Workshop and published by . This book was released on 1999 with total page 188 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 1998 IEEE International Integrated Reliability Workshop Final Report written by IEEE Reliability Society and published by IEEE. This book was released on 1998 with total page 140 pages. Available in PDF, EPUB and Kindle. Book excerpt: The International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. Topics include: contributors to failure; waver level reliability; building in reliability; and reliability test structures.
Download or read book 2004 IEEE International Integrated Reliability Workshop Final Report written by and published by . This book was released on 2004 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Special Issue on the 2006 International Integrated Reliability Workshop written by Yuan Chen and published by . This book was released on 2007 with total page 118 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book International Integrated Reliability Workshop Final Report written by and published by . This book was released on 2005 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Special Issue Section on 2008 International Integrated Reliability Workshop IIRW written by Guoqiao Tao and published by . This book was released on 2009 with total page 41 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 1999 IEEE International Integrated Reliability Workshop Final Report written by IEEE Electron Devices Society and published by IEEE. This book was released on 1999 with total page 188 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text constitutes the final report produced from the IEEE International Integrated Reliability Workshop, which took part in 1999.
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Download or read book Heterogeneous Memory Organizations in Embedded Systems written by Miguel Peón Quirós and published by Springer Nature. This book was released on 2020-01-30 with total page 214 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book defines and explores the problem of placing the instances of dynamic data types on the components of the heterogeneous memory organization of an embedded system, with the final goal of reducing energy consumption and improving performance. It is one of the first to cover the problem of placement for dynamic data objects on embedded systems with heterogeneous memory architectures, presenting a complete methodology that can be easily adapted to real cases and work flows. The authors discuss how to improve system performance and energy consumption simultaneously. Discusses the problem of placement for dynamic data objects on embedded systems with heterogeneous memory architectures; Presents a complete methodology that can be adapted easily to real cases and work flows; Offers hints on how to improve system performance and energy consumption simultaneously.
Download or read book Conductive Atomic Force Microscopy written by Mario Lanza and published by John Wiley & Sons. This book was released on 2017-08-07 with total page 385 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.
Download or read book Metrology and Physical Mechanisms in New Generation Ionic Devices written by Umberto Celano and published by Springer. This book was released on 2016-06-18 with total page 191 pages. Available in PDF, EPUB and Kindle. Book excerpt: This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
Download or read book International Integrated Reliability Workshop Final Report written by and published by . This book was released on 2004 with total page 234 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 1993 International Integrated Reliability Workshop Final Report written by and published by . This book was released on 2000 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
