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Download or read book 1997 IEEE International Conference on Microelectronic Test Structures Proceedings written by IEEE Electron Devices Society and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1997 with total page 276 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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Download or read book 2017 International Conference of Microelectronic Test Structures ICMTS written by IEEE Staff and published by . This book was released on 2017-03-27 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The scope of this conference is to bring together designers and users of test structures to discuss recent developments and futures directions
Download or read book 1997 IEEE International Conference on Microelectronic Test Structures Proceedings written by IEEE Electron Devices Society and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1997 with total page 225 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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Download or read book Special Section on the International Conference on Microelectronic Test Structures written by International Conference on Microelectronic Test Structures (18, 2005, Louvain) and published by . This book was released on 2006 with total page 155 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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Download or read book 2002 International Conference on Microelectronic Test Structures written by IEEE, Electron Devices Society Staff and published by . This book was released on 2002 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
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Download or read book 1996 IEEE International Conference on Microelectronic Test Structures written by IEEE Electron Devices Society and published by IEEE. This book was released on 1996 with total page 313 pages. Available in PDF, EPUB and Kindle. Book excerpt: The papers included in this leading international conference examine test structures for microelectronic devices, their recent progress and future directions. Included is a detailed treatment of current developments in silicon and gallium arsenide microelectronic test structure research, implementation, and applications. Also addressed are advances in device characterization, such as increased miniaturization, reduced operating voltages and reduced power requirements through improved measurement and test techniques. Topics highlighted include: Process Characterization, Dimensional Measurements, Interconnection, SOI & Material Characterization, Reliability, Device Characterization, Capacitance Measurements, Statistics.
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