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Book XI Airapt

Download or read book XI Airapt written by N. V. Novikov and published by CRC Press. This book was released on 1989 with total page 106 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book X Ray and Neutron Dynamical Diffraction

Download or read book X Ray and Neutron Dynamical Diffraction written by André Authier and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 419 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.

Book Whitaker s Book List

Download or read book Whitaker s Book List written by and published by . This book was released on 1989 with total page 1784 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Crystal Plasticity Finite Element Methods

Download or read book Crystal Plasticity Finite Element Methods written by Franz Roters and published by John Wiley & Sons. This book was released on 2011-08-04 with total page 188 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written by the leading experts in computational materials science, this handy reference concisely reviews the most important aspects of plasticity modeling: constitutive laws, phase transformations, texture methods, continuum approaches and damage mechanisms. As a result, it provides the knowledge needed to avoid failures in critical systems udner mechanical load. With its various application examples to micro- and macrostructure mechanics, this is an invaluable resource for mechanical engineers as well as for researchers wanting to improve on this method and extend its outreach.

Book Transmission Electron Microscopy

Download or read book Transmission Electron Microscopy written by C. Barry Carter and published by Springer. This book was released on 2016-08-24 with total page 543 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Book Whitaker s Books in Print

Download or read book Whitaker s Books in Print written by and published by . This book was released on 1998 with total page 2954 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Strain and Dislocation Gradients from Diffraction

Download or read book Strain and Dislocation Gradients from Diffraction written by Rozaliya Barabash and published by World Scientific. This book was released on 2014 with total page 478 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals. Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.

Book Children s Books in Print

Download or read book Children s Books in Print written by R R Bowker Publishing and published by R. R. Bowker. This book was released on 1999-12 with total page 1662 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Recent Developments in Gauge Theories

Download or read book Recent Developments in Gauge Theories written by G. 't Hooft and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 437 pages. Available in PDF, EPUB and Kindle. Book excerpt: Almost all theories of fundamental interactions are nowadays based on the gauge concept. Starting with the historical example of quantum electrodynamics, we have been led to the successful unified gauge theory of weak and electromagnetic interactions, and finally to a non abelian gauge theory of strong interactions with the notion of permanently confined quarks. The. early theoretical work on gauge theories was devoted to proofs of renormalizability, investigation of short distance behaviour, the discovery of asymptotic freedom, etc . . , aspects which were accessible to tools extrapolated from renormalised perturbation theory. The second phase of the subject is concerned with the problem of quark confinement which necessitates a non-perturbative understanding of gauge theories. This phase has so far been marked by the introduc tion of ideas from geometry, topology and statistical mechanics in particular the theory of phase transitions. The 1979 Cargese Institute on "Recent Developments on Gauge Theories" was devoted to a thorough discussion of these non-perturbative, global aspects of non-abelian gauge theories. In the lectures and seminars reproduced in this volume the reader wilf find detailed reports on most of the important developments of recent times on non perturbative gauge fields by some of the leading experts and innovators in this field. Aside from lectures on gauge fields proper, there were lectures on gauge field concepts in condensed matter physics and lectures by mathematicians on global aspects of the calculus of variations, its relation to geometry and topology, and related topics.

Book Quarks and Leptons

    Book Details:
  • Author : Maurice Lévy
  • Publisher : Springer
  • Release : 1980
  • ISBN :
  • Pages : 746 pages

Download or read book Quarks and Leptons written by Maurice Lévy and published by Springer. This book was released on 1980 with total page 746 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Metals Abstracts

Download or read book Metals Abstracts written by and published by . This book was released on 1984-07 with total page 1164 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book X Ray Metrology in Semiconductor Manufacturing

Download or read book X Ray Metrology in Semiconductor Manufacturing written by D. Keith Bowen and published by CRC Press. This book was released on 2018-10-03 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems. Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text. Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput.

Book Springer Handbook of Crystal Growth

Download or read book Springer Handbook of Crystal Growth written by Govindhan Dhanaraj and published by Springer Science & Business Media. This book was released on 2010-10-20 with total page 1823 pages. Available in PDF, EPUB and Kindle. Book excerpt: Over the years, many successful attempts have been chapters in this part describe the well-known processes made to describe the art and science of crystal growth, such as Czochralski, Kyropoulos, Bridgman, and o- and many review articles, monographs, symposium v- ing zone, and focus speci cally on recent advances in umes, and handbooks have been published to present improving these methodologies such as application of comprehensive reviews of the advances made in this magnetic elds, orientation of the growth axis, intro- eld. These publications are testament to the grow- duction of a pedestal, and shaped growth. They also ing interest in both bulk and thin- lm crystals because cover a wide range of materials from silicon and III–V of their electronic, optical, mechanical, microstructural, compounds to oxides and uorides. and other properties, and their diverse scienti c and The third part, Part C of the book, focuses on - technological applications. Indeed, most modern ad- lution growth. The various aspects of hydrothermal vances in semiconductor and optical devices would growth are discussed in two chapters, while three other not have been possible without the development of chapters present an overview of the nonlinear and laser many elemental, binary, ternary, and other compound crystals, KTP and KDP. The knowledge on the effect of crystals of varying properties and large sizes. The gravity on solution growth is presented through a c- literature devoted to basic understanding of growth parison of growth on Earth versus in a microgravity mechanisms, defect formation, and growth processes environment.

Book Physics Briefs

Download or read book Physics Briefs written by and published by . This book was released on 1992 with total page 1358 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Japanese Journal of Applied Physics

Download or read book Japanese Journal of Applied Physics written by and published by . This book was released on 2004 with total page 932 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book X Ray Diffraction by Polycrystalline Materials

Download or read book X Ray Diffraction by Polycrystalline Materials written by René Guinebretière and published by John Wiley & Sons. This book was released on 2013-03-01 with total page 290 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.