Download or read book Trace Analysis of Semiconductor Materials written by J. Paul Cali and published by Elsevier. This book was released on 2013-10-22 with total page 295 pages. Available in PDF, EPUB and Kindle. Book excerpt: Trace Analysis of Semiconductor Materials is a guidebook concerned with procedures of ultra-trace analysis. This book discusses six distinct techniques of trace analysis. These techniques are the most common and can be applied to various problems compared to other methods. Each of the four chapters basically includes an introduction to the principles and general statements. The theoretical basis for the technique involved is then briefly discussed. Practical applications of the techniques and the different instrumentations are explained. Then, the applications to trace analysis as pertaining to semiconductor materials are discussed. Chapter 1 discusses radiochemical practice, the analysis of semiconductor materials, separation techniques, several qualitative radiochemical schemes, radiochemical purification procedures, and several earlier reported studies. Chapter 2 covers emission spectroscopy, including its potential for future applications. Discussions in Chapter 3 explain the benefits of each of the four mass spectrometric methods, namely, the isotope dilution method, complete thermal vaporization, vacuum spark technique, and the ion bombardment method. Chapter 4 focuses on the absorption, fluorescence, and polarographic methods used in general trace analysis, including examples of semiconductor material applications and other problems that result when certain impurities are introduced into the test sample. This monograph will be useful for researchers in ultra-trace analysis, nuclear physics, and analytical chemistry.

Download or read book Trace Analysis of Semiconductor Materials written by Stanley L. Shapiro and published by . This book was released on 1977 with total page 389 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Trace Analysis of Semiconductor Materials Edited by J Paul Cali By Various Authors written by J. Paul Cali and published by . This book was released on 1964 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Principles of Field Ionization and Field Desorption Mass Spectrometry written by G. Svehla and published by . This book was released on 1964 with total page 335 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Trace Analysis of Semiconductors Materials written by J. Paul Cali and published by . This book was released on 1964 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Trace Analysis of Semiconductor Materials written by George Chandler and published by . This book was released on 1964 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Progress in Materials Analysis written by M. Grasserbauer and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt: Vol. 2 of "Progress in Materials Analysis" contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level international participation from industry and research insti tutions the proceedings offer a survey of the present state and current trends in materials analysis of high actuality. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. According to the strategy of the meeting attention is focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and technol ogy. Therefore progress reports on modern analytical technique like SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA, STEM, LAMMS, etc. are contained as well as presentations on the development of materials. The majority of the contributions centers on the treatment of important problems in materials science and technology by a (mostly sophisticated) combination of physical and chemical analytical techniques. Vienna, July 1985 M. Grasserbauer Contents Page Hercules, D. M. Surface Characterization of Thin Organic Films on Metals ............................................. .

Download or read book Methods of Measurement for Semiconductor Materials Process Control and Devices written by United States. National Bureau of Standards and published by . This book was released on 1973 with total page 82 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Handbook of Surface Imaging and Visualization written by Arthur T. Hubbard and published by CRC Press. This book was released on 2022-04-13 with total page 928 pages. Available in PDF, EPUB and Kindle. Book excerpt: This exciting new handbook investigates the characterization of surfaces. It emphasizes experimental techniques for imaging of solid surfaces and theoretical strategies for visualization of surfaces, areas in which rapid progress is currently being made. This comprehensive, unique volume is the ideal reference for researchers needing quick access to the latest developments in the field and an excellent introduction to students who want to acquaint themselves with the behavior of electrons, atoms, molecules, and thin-films at surfaces. It's all here, under one cover! The Handbook of Surface Imaging and Visualization is filled with sixty-four of the most powerful techniques for characterization of surfaces and interfaces in the material sciences, medicine, biology, geology, chemistry, and physics. Each discussion is easy to understand, succinct, yet incredibly informative. Data illustrate present research in each area of study. A wide variety of the latest experimental and theoretical approaches are included with both practical and fundamental objectives in mind. Key references are included for the reader's convenience for locating the most recent and useful work on each topic. Readers are encouraged to contact the authors or consult the references for additional information. This is the best ready reference available today. It is a perfect source book or supplemental text on the subject.

Download or read book Analysis of Trace Impurities in Organometallic Semiconductor Grade Reagent Materials Using Electrothermal Vaporization inductively Coupled Plasma Spectrometry written by Mark D. Argentine and published by . This book was released on 1993 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Nuclear Science Abstracts written by and published by . This book was released on 1974 with total page 730 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Advances in Polarography written by Ian S. Longmuir and published by Elsevier. This book was released on 2013-10-22 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Polarography, Volume 2 covers the proceedings of the Second International Congress held at Cambridge in 1959 in honor of the 70th birthday of Professor Heyrovsky. This volume is composed of 35 chapters and begins with intensive discussions on the theoretical and fundamental aspects, as well as pertinent equations in polarography. Considerable chapters are devoted to the chemical and metallurgical applications of the technique, with emphasis on the trace determination of certain compounds. The remaining chapters explore other application of specific polarographic technique, such as nicotinic acid, iso-benzpyrylium salts, and metal complex analysis.

Download or read book Journal of Research of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1980 with total page 572 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Non Stoichiometry in Semiconductors written by K.J. Bachmann and published by Elsevier. This book was released on 2012-12-02 with total page 337 pages. Available in PDF, EPUB and Kindle. Book excerpt: Significant advances have occurred in the theory of non-stoichiometry problems and fundamentally new and wide-ranging applications have been developed, helping to better identify relevant issues. The contributions in this volume bring together the experience of specialists from different disciplines (materials scientists, physicists, chemists and device people) confronted with non-stoichiometry problems. The 40 papers, including 9 invited papers, give an advanced scenario of this wide interdisciplinary area, which is highly important in its diverse aspects of theory, implementation and applications. This work will be of interest not only to universities and laboratories engaged in studies and research in this field, but also to organizations and industrial centres concerned with implementations and applications. The diversity of the topics, as well as the extraordinary tempo in which Non-stoichiometry in Semiconductors has progressed in recent years attest to the permanent vitality of this field of research and development.

Download or read book Postdoctoral Research Associateships written by and published by . This book was released on 1981 with total page 196 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Download or read book Proceedings of the Royal Society of New Zealand written by Royal Society of New Zealand and published by . This book was released on 1985 with total page 676 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes Report of the 9th-10th Science Congress, 1960-64.