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Book Proceedings the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems November 13 15 1995 Lafayette Louisiana

Download or read book Proceedings the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems November 13 15 1995 Lafayette Louisiana written by and published by . This book was released on 1995 with total page 305 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems November 13 15 1995 Lafayette Louisiana

Download or read book The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems November 13 15 1995 Lafayette Louisiana written by IEEE Computer Society and published by . This book was released on 1995 with total page 305 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems

Download or read book The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems written by Duncan Moore Henry Walker and published by . This book was released on 2002 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems DFT

Download or read book 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems DFT written by IEEE Staff and published by . This book was released on 2016-09-19 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest

Book 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Download or read book 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems written by and published by IEEE. This book was released on 2001 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume features the proceedings of the International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001).

Book Defect and Fault Tolerance in VLSI Systems

Download or read book Defect and Fault Tolerance in VLSI Systems written by Israel Koren and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 362 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.

Book Selected Papers from IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems DFT

Download or read book Selected Papers from IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems DFT written by International Symposium on Defect and Fault Tolerance in VLSI Systems and published by . This book was released on 2003 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems DFTS

Download or read book 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems DFTS written by IEEE Staff and published by . This book was released on 2015-10-12 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest

Book 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Download or read book 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems written by and published by IEEE. This book was released on 2000 with total page 422 pages. Available in PDF, EPUB and Kindle. Book excerpt: This work constitutes the proceedings of the 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2000). Subjects addressed include: yield analysis and modelling; wafer scale/large area systems; fault-tolerant systems; tesitng strategies; and more.

Book Defect and Fault Tolerance in VLSI Systems

Download or read book Defect and Fault Tolerance in VLSI Systems written by C.H. Stapper and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 313 pages. Available in PDF, EPUB and Kindle. Book excerpt: Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an "International Workshop on Designing for Yield" at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the "IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems" in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.