Download or read book The Board Designer s Guide to Testable Logic Circuits written by Colin M. Maunder and published by Addison Wesley Publishing Company. This book was released on 1992 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Designer s Guide to Testable Asic Devices written by Wayne M. Needham and published by Springer Science & Business Media. This book was released on 1991-01-10 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact of ASIC testability on total system cost and performance, and reviews the commercial test systems that are currently available. Annotation copyrighted by Book News, Inc., Portland, OR
Download or read book Design to Test written by John Turino and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 334 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the second edition of Design to Test. The first edition, written by myself and H. Frank Binnendyk and first published in 1982, has undergone several printings and become a standard in many companies, even in some countries. Both Frank and I are very proud of the success that our customers have had in utilizing the information, all of it still applicable to today's electronic designs. But six years is a long time in any technology field. I therefore felt it was time to write a new edition. This new edition, while retaining the basic testability prin ciples first documented six years ago, contains the latest material on state-of-the-art testability techniques for electronic devices, boards, and systems and has been completely rewritten and up dated. Chapter 15 from the first edition has been converted to an appendix. Chapter 6 has been expanded to cover the latest tech nology devices. Chapter 1 has been revised, and several examples throughout the book have been revised and updated. But some times the more things change, the more they stay the same. All of the guidelines and information presented in this book deal with the three basic testability principles-partitioning, control, and visibility. They have not changed in years. But many people have gotten smarter about how to implement those three basic test ability principles, and it is the aim of this text to enlighten the reader regarding those new (and old) testability implementation techniques.
Download or read book System Test and Diagnosis written by William R. Simpson and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 389 pages. Available in PDF, EPUB and Kindle. Book excerpt: System Test and Diagnosis is the first book on test and diagnosis at the system level, defined as any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail. The ideas presented emphasize that it is possible to diagnose complex systems efficiently. Since the notion of system is hierarchical, these ideas are applicable to all levels. The philosophy is presented in the context of a model-based approach, using the information flow model, that focuses on the information provided by the tests rather than the functions embedded in the system. Detailed algorithms are offered for evaluating system testability, performing efficient diagnosis, verifying and validating the models, and constructing an architecture for system maintenance. Several advanced algorithms, not commonly available in existing diagnosis tools, are discussed, including reasoning with inexact or uncertain test data, breaking large problems into manageable smaller problems, diagnosing systems with time sensitive information and time dependent tests and learning from experience. The book is divided into three parts. The first part provides motivation for careful development of the subject and the second part provides the tools necessary for analyzing system testability and computing diagnostic strategies. The third part presents advanced topics in diagnosis. Several case studies are provided, including a single detailed case study. Smaller case studies describe experiences from actual applications of the methods discussed. The detailed case study walks the reader through a complete analysis of a system to illustrate the concepts and describe the analyses that are possible. All case studies are based upon real systems that have been modeled for the purposes of diagnosis. System Test and Diagnosis is the culmination of nearly twelve years of research into diagnosis modeling and its applications. It is designed as a primary reference for engineers and practitioners interested in system test and diagnosis.
Download or read book Design of Testable Logic Circuits written by R. G. Bennetts and published by . This book was released on 2000 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Digital System Design with SystemVerilog written by Mark Zwolinski and published by Pearson Education. This book was released on 2009-10-23 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Definitive, Up-to-Date Guide to Digital Design with SystemVerilog: Concepts, Techniques, and Code To design state-of-the-art digital hardware, engineers first specify functionality in a high-level Hardware Description Language (HDL)—and today’s most powerful, useful HDL is SystemVerilog, now an IEEE standard. Digital System Design with SystemVerilog is the first comprehensive introduction to both SystemVerilog and the contemporary digital hardware design techniques used with it. Building on the proven approach of his bestselling Digital System Design with VHDL, Mark Zwolinski covers everything engineers need to know to automate the entire design process with SystemVerilog—from modeling through functional simulation, synthesis, timing simulation, and verification. Zwolinski teaches through about a hundred and fifty practical examples, each with carefully detailed syntax and enough in-depth information to enable rapid hardware design and verification. All examples are available for download from the book's companion Web site, zwolinski.org. Coverage includes Using electronic design automation tools with programmable logic and ASIC technologies Essential principles of Boolean algebra and combinational logic design, with discussions of timing and hazards Core modeling techniques: combinational building blocks, buffers, decoders, encoders, multiplexers, adders, and parity checkers Sequential building blocks: latches, flip- flops, registers, counters, memory, and sequential multipliers Designing finite state machines: from ASM chart to D flip-flops, next state, and output logic Modeling interfaces and packages with SystemVerilog Designing testbenches: architecture, constrained random test generation, and assertion-based verification Describing RTL and FPGA synthesis models Understanding and implementing Design-for-Test Exploring anomalous behavior in asynchronous sequential circuits Performing Verilog-AMS and mixed-signal modeling Whatever your experience with digital design, older versions of Verilog, or VHDL, this book will help you discover SystemVerilog’s full power and use it to the fullest.
Download or read book Design of Testable Logic Circuits written by R. G. Bennetts and published by . This book was released on 1984 with total page 182 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Engineering written by Alessandro Birolini and published by Springer. This book was released on 2017-05-19 with total page 666 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book shows how to build in and assess reliability, availability, maintainability, and safety (RAMS) of components, equipment, and systems. It presents the state of the art of reliability (RAMS) engineering, in theory & practice, and is based on over 30 years author's experience in this field, half in industry and half as Professor of Reliability Engineering at the ETH, Zurich. The book structure allows rapid access to practical results. Methods & tools are given in a way that they can be tailored to cover different RAMS requirement levels. Thanks to Appendices A6 - A8 the book is mathematically self-contained, and can be used as a textbook or as a desktop reference with a large number of tables (60), figures (210), and examples / exercises^ 10,000 per year since 2013) were the motivation for this final edition, the 13th since 1985, including German editions. Extended and carefully reviewed to improve accuracy, it represents the continuous improvement effort to satisfy reader's needs and confidence. New are an introduction to risk management with structurally new models based on semi-Markov processes & to the concept of mean time to accident, reliability & availability of a k-out-of-n redundancy with arbitrary repair rate for n - k=2, 10 new homework problems, and refinements, in particular, on multiple failure mechanisms, approximate expressions, incomplete coverage, data analysis, and comments on ë, MTBF, MTTF, MTTR, R, PA.
Download or read book A Designer s Guide to Built In Self Test written by Charles E. Stroud and published by Springer. This book was released on 2013-03-18 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Download or read book Design of Logic Systems written by DAVID PROTHEROE DOUGLAS LEWIN and published by Springer. This book was released on 2013-11-21 with total page 713 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Engineering written by A. Birolini and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 516 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reliability engineering is a rapidly evolving discipline, whose purpose is to develop methods and tools to predict, evaluate, and demonstrate reliability, maintainability, and availability of components, equipment, and systems, as well as to support development and production engineers in building in reliability and maintainability. To be cost and time effective, reliability engineering has to be coordinated with quality assurance activities, in agreement with Total Quality Management (TQM) and Concurrent Engineering efforts. To build in reliability and maintainability into complex equipment or systems, failure rate and failure mode analyses have to be performed early in the development phase and be supported by design guidelines for reliability, maintainability, and software quality as well as by extensive design reviews. Before production, qualification tests on prototypes are necessary to ensure that quality and reliability targets have been met. In the production phase, processes need to be selected and monitored to assure the required quality level. For many systems, availability requirements have also to be satisfied. In these cases, stochastic processes can be used to investigate and optimize availability. including logistical support as well. Software often plays a dominant role, requiring specific quality assurance activities. This book presents the state-of-the-art of reliability engineering, both in theory and practice. It is based on over 25 years experience of the author in this field, half of which was in industry and half as Professor for reliability engineering at the ETH (Swiss Federal Institute of Technology Zurich).
Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala and published by Morgan & Claypool Publishers. This book was released on 2009 with total page 111 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Download or read book VLSI Testing written by Stanley Leonard Hurst and published by IET. This book was released on 1998 with total page 560 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR
Download or read book The Boundary Scan Handbook written by Kenneth P. Parker and published by Springer Science & Business Media. This book was released on 2013-03-14 with total page 273 pages. Available in PDF, EPUB and Kindle. Book excerpt: Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, is a collection of design rules applied principally at the integrated circuit (IC) level that allow software to alleviate the growing cost of designing and producing digital systems. The primary benefit of the standard is its ability to transform extremely printed circuit board testing problems that could only be attacked with ad-hoc testing methods into well-structured problems that software can easily and swiftly deal with. The Boundary-Scan Handbook is for professionals in the electronics industry who are concerned with the practical problems of competing successfully in the face of rapid-fire technological change. Since many of these changes affect our ability to do testing and hence cost-effective production, the advent of the 1149.1 standard is rightly looked upon as a major breakthrough. However, there is a great deal of misunderstanding about what to expect of 1149.1 and how to use it. Because of this, The Boundary-Scan Handbook is not a rehash of the 1149.1 standard, nor does it intend to be a tutorial on the basics of its workings. The standard itself should always be consulted for this, being careful to follow supplements issued by the IEEE that clarify and correct it. Rather, The Boundary-Scan Handbook motivates proper expectations and explains how to use the standard successfully.
Download or read book Quality and Reliability of Technical Systems written by Alessandro Birolini and published by Springer Science & Business Media. This book was released on 2013-03-14 with total page 538 pages. Available in PDF, EPUB and Kindle. Book excerpt: High reliability, maintainability, and safety are expected from complex equipment and systems. To build these characteristics into an item, failure rate and failure mode analyses have to be performed early in the design phase, starting at the com ponent level, and have to be supported by a set of design guidelines for reliability and maintainability as well as by extensive design reviews. Before production, qualification tests of prototypes must ensure that quality and reliability targets have been reached. In the production phase, processes and procedures have to be selec ted and monitored to assure the required quality level. For many systems, availabi lity requirements must also be satisfied. In these cases, stochastic processes can be used to investigate and optimize availability, including logistical support. This book presents the state of the art of the methods and procedures necessary for a cost and time effective quality and reliability assurance during the design and production of equipment and systems. It takes into consideration that: 1. Quality and reliability assurance of complex equipment and systems requires that all engineers involved in a project undertake a set of specific activities from the definition to the operating phase, which are performed concurrently to achieve the best performance, quality, and reliability for given cost and time schedule targets.
Download or read book Logic Testing and Design for Testability written by Hideo Fujiwara and published by MIT Press (MA). This book was released on 1985-06-01 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt: Today's computers must perform with increasing reliability, which in turn depends onthe problem of determining whether a circuit has been manufactured properly or behaves correctly.However, the greater circuit density of VLSI circuits and systems has made testing more difficultand costly. This book notes that one solution is to develop faster and more efficient algorithms togenerate test patterns or use design techniques to enhance testability - that is, "design fortestability." Design for testability techniques offer one approach toward alleviating this situationby adding enough extra circuitry to a circuit or chip to reduce the complexity of testing. Becausethe cost of hardware is decreasing as the cost of testing rises, there is now a growing interest inthese techniques for VLSI circuits.The first half of the book focuses on the problem of testing:test generation, fault simulation, and complexity of testing. The second half takes up the problemof design for testability: design techniques to minimize test application and/or test generationcost, scan design for sequential logic circuits, compact testing, built-in testing, and variousdesign techniques for testable systems.Hideo Fujiwara is an associate professor in the Department ofElectronics and Communication, Meiji University. Logic Testing and Design for Testability isincluded in the Computer Systems Series, edited by Herb Schwetman.
Download or read book Digital Logic Testing and Simulation written by Alexander Miczo and published by Wiley. This book was released on 1985-12 with total page 480 pages. Available in PDF, EPUB and Kindle. Book excerpt: The new standard in the field, presenting the latest design and testing methods for logic circuits, and the development of a BASIC-based simulation. Offers designers and test engineers unique coverage of circuit design for testability, stressing the incorporation of hardware into designs that facilitate testing and diagnosis by allowing greater access to internal circuits. Examines various ways of representing a design, as well as external testing methods that apply this information.
