Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1022 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Download or read book Digital Systems Testing and Testable Design written by Miron Abramovici and published by Wiley-IEEE Press. This book was released on 1994-09-27 with total page 672 pages. Available in PDF, EPUB and Kindle. Book excerpt: This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.
Download or read book Digital System Test and Testable Design written by Zainalabedin Navabi and published by Springer Science & Business Media. This book was released on 2010-12-10 with total page 452 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.
Download or read book Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala and published by Springer Nature. This book was released on 2022-06-01 with total page 99 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Download or read book Digital Systems Design with FPGAs and CPLDs written by Ian Grout and published by Elsevier. This book was released on 2011-04-08 with total page 763 pages. Available in PDF, EPUB and Kindle. Book excerpt: Digital Systems Design with FPGAs and CPLDs explains how to design and develop digital electronic systems using programmable logic devices (PLDs). Totally practical in nature, the book features numerous (quantify when known) case study designs using a variety of Field Programmable Gate Array (FPGA) and Complex Programmable Logic Devices (CPLD), for a range of applications from control and instrumentation to semiconductor automatic test equipment.Key features include:* Case studies that provide a walk through of the design process, highlighting the trade-offs involved.* Discussion of real world issues such as choice of device, pin-out, power supply, power supply decoupling, signal integrity- for embedding FPGAs within a PCB based design.With this book engineers will be able to:* Use PLD technology to develop digital and mixed signal electronic systems* Develop PLD based designs using both schematic capture and VHDL synthesis techniques* Interface a PLD to digital and mixed-signal systems* Undertake complete design exercises from design concept through to the build and test of PLD based electronic hardwareThis book will be ideal for electronic and computer engineering students taking a practical or Lab based course on digital systems development using PLDs and for engineers in industry looking for concrete advice on developing a digital system using a FPGA or CPLD as its core. Case studies that provide a walk through of the design process, highlighting the trade-offs involved. Discussion of real world issues such as choice of device, pin-out, power supply, power supply decoupling, signal integrity- for embedding FPGAs within a PCB based design.
Download or read book Testing and Diagnosis of Analog Circuits and Systems written by Ruey-wen Liu and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 290 pages. Available in PDF, EPUB and Kindle. Book excerpt: IS THE TOPIC ANALOG TESTING AND DIAGNOSIS TIMELY? Yes, indeed it is. Testing and Diagnosis is an important topic and fulfills a vital need for the electronic industry. The testing and diagnosis of digital electronic circuits has been successfuIly developed to the point that it can be automated. Unfortu nately, its development for analog electronic circuits is still in its Stone Age. The engineer's intuition is still the most powerful tool used in the industry! There are two reasons for this. One is that there has been no pressing need from the industry. Analog circuits are usuaIly small in size. Sometimes, the engineer's experience and intuition are sufficient to fulfill the need. The other reason is that there are no breakthrough results from academic re search to provide the industry with critical ideas to develop tools. This is not because of a lack of effort. Both academic and industrial research groups have made major efforts to look into this problem. Unfortunately, the prob lem for analog circuits is fundamentally different from and much more diffi cult than its counterpart for digital circuits. These efforts have led to some important findings, but are still not at the point of being practicaIly useful. However, these situations are now changing. The current trend for the design of VLSI chips is to use analog/digital hybrid circuits, instead of digital circuits from the past. Therefore, even Ix x Preface though the analog circuit may be small, the total circuit under testing is large.
Download or read book Design and Analysis of Fault tolerant Digital Systems written by Barry W. Johnson and published by . This book was released on 1989 with total page 696 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Digital Systems Design written by and published by Bookboon. This book was released on with total page 130 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Digital Systems Design Using Verilog written by Lizy Kurian John and published by . This book was released on 2015-02 with total page 608 pages. Available in PDF, EPUB and Kindle. Book excerpt: Master the process of designing and testing new hardware configurations with DIGITAL SYSTEMS DESIGN USING VERILOG. This practical book integrates coverage of logic design principles, Verilog as a hardware design language, and FPGA implementation. The authors present Verilog constructs side-by-side with hardware, encouraging you to think in terms of desired hardware while writing synthesizable Verilog. Following a review of the basic concepts of logic design, the authors introduce the basics of Verilog using simple combinational circuit examples, followed by models for simple sequential circuits. Subsequent chapters ask you to tackle more and more complex designs.
Download or read book Principles of Testing Electronic Systems written by Samiha Mourad and published by John Wiley & Sons. This book was released on 2000-07-25 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references
Download or read book Design of Digital Systems and Devices written by Marian Adamski and published by Springer Science & Business Media. This book was released on 2011-02-04 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt: Logic design of digital devices is a very important part of the Computer Science. It deals with design and testing of logic circuits for both data-path and control unit of a digital system. Design methods depend strongly on logic elements using for implementation of logic circuits. Different programmable logic devices are wide used for implementation of logic circuits. Nowadays, we witness the rapid growth of new and new chips, but there is a strong lack of new design methods. This book includes a variety of design and test methods targeted on different digital devices. It covers methods of digital system design, the development of theoretical base for construction and designing of the PLD–based devices, application of UML for digital design. A considerable part of the book is devoted to design methods oriented on implementing control units using FPGA and CPLD chips. Such important issues as design of reliable FSMs, automatic design of concurrent logic controllers, the models and methods for creating infrastructure IP services for the SoCs are also presented. The editors of the book hope that it will be interesting and useful for experts in Computer Science and Electronics, as well as for students, who are viewed as designers of future digital devices and systems.
Download or read book VHDL written by Zainalabedin Navabi and published by McGraw Hill Professional. This book was released on 1998 with total page 668 pages. Available in PDF, EPUB and Kindle. Book excerpt: Complete with coverage of the latest VHDL93 standard, this edition offers engineers a thorough guide to the use of VHDL hardware description language in the analysis, simulation, and modeling of complicated microelectronic circuits. Extensive worked problems and examples listed in Verilog as well as VHDL set this edition apart from other VHDL texts.
Download or read book Systematic Software Testing written by Rick David Craig and published by Artech House. This book was released on 2002 with total page 584 pages. Available in PDF, EPUB and Kindle. Book excerpt: Gain an in-depth understanding of software testing management and process issues that are critical for delivering high-quality software on time and within budget. Written by leading experts in the field, this book offers those involved in building and maintaining complex, mission-critical software systems a flexible, risk-based process to improve their software testing capabilities. Whether your organization currently has a well-defined testing process or almost no process, Systematic Software Testing provides unique insights into better ways to test your software.This book describes how to use a preventive method of testing, which parallels the software development lifecycle, and explains how to create and subsequently use test plans, test design, and test metrics. Detailed instructions are presented to help you decide what to test, how to prioritize tests, and when testing is complete. Learn how to conduct risk analysis and measure test effectiveness to maximize the efficiency of your testing efforts. Because organizational structure, the right people, and management are keys to better software testing, Systematic Software Testing explains these issues with the insight of the authorsOCO more than 25 years of experience."
Download or read book Common System and Software Testing Pitfalls written by Donald G. Firesmith and published by Addison-Wesley Professional. This book was released on 2014-01-17 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: “Don’s book is a very good addition both to the testing literature and to the literature on quality assurance and software engineering... . [It] is likely to become a standard for test training as well as a good reference for professional testers and developers. I would also recommend this book as background material for negotiating outsourced software contracts. I often work as an expert witness in litigation for software with very poor quality, and this book might well reduce or eliminate these lawsuits....” –Capers Jones, VP and CTO, Namcook Analytics LLC Software and system testers repeatedly fall victim to the same pitfalls. Think of them as “anti-patterns”: mistakes that make testing far less effective and efficient than it ought to be. In Common System and Software Testing Pitfalls, Donald G. Firesmith catalogs 92 of these pitfalls. Drawing on his 35 years of software and system engineering experience, Firesmith shows testers and technical managers and other stakeholders how to avoid falling into these pitfalls, recognize when they have already fallen in, and escape while minimizing their negative consequences. Firesmith writes for testing professionals and other stakeholders involved in large or medium-sized projects. His anti-patterns and solutions address both “pure software” applications and “software-reliant systems,” encompassing heterogeneous subsystems, hardware, software, data, facilities, material, and personnel. For each pitfall, he identifies its applicability, characteristic symptoms, potential negative consequences and causes, and offers specific actionable recommendations for avoiding it or limiting its consequences. This guide will help you Pinpoint testing processes that need improvement–before, during, and after the project Improve shared understanding and collaboration among all project participants Develop, review, and optimize future project testing programs Make your test documentation far more useful Identify testing risks and appropriate risk-mitigation strategies Categorize testing problems for metrics collection, analysis, and reporting Train new testers, QA specialists, and other project stakeholders With 92 common testing pitfalls organized into 14 categories, this taxonomy of testing pitfalls should be relatively complete. However, in spite of its comprehensiveness, it is also quite likely that additional pitfalls and even missing categories of pitfalls will be identified over time as testers read this book and compare it to their personal experiences. As an enhancement to the print edition, the author has provided the following location on the web where readers can find major additions and modifications to this taxonomy of pitfalls: http://donald.firesmith.net/home/common-testing-pitfalls Please send any recommended changes and additions to dgf (at) sei (dot) cmu (dot) edu, and the author will consider them for publication both on the website and in future editions of this book.
Download or read book Logic Testing and Design for Testability written by Hideo Fujiwara and published by MIT Press (MA). This book was released on 1985-06-01 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt: Today's computers must perform with increasing reliability, which in turn depends onthe problem of determining whether a circuit has been manufactured properly or behaves correctly.However, the greater circuit density of VLSI circuits and systems has made testing more difficultand costly. This book notes that one solution is to develop faster and more efficient algorithms togenerate test patterns or use design techniques to enhance testability - that is, "design fortestability." Design for testability techniques offer one approach toward alleviating this situationby adding enough extra circuitry to a circuit or chip to reduce the complexity of testing. Becausethe cost of hardware is decreasing as the cost of testing rises, there is now a growing interest inthese techniques for VLSI circuits.The first half of the book focuses on the problem of testing:test generation, fault simulation, and complexity of testing. The second half takes up the problemof design for testability: design techniques to minimize test application and/or test generationcost, scan design for sequential logic circuits, compact testing, built-in testing, and variousdesign techniques for testable systems.Hideo Fujiwara is an associate professor in the Department ofElectronics and Communication, Meiji University. Logic Testing and Design for Testability isincluded in the Computer Systems Series, edited by Herb Schwetman.
Download or read book Digital Systems Design Using VHDL written by Lizy Kurian John and published by . This book was released on 2017-01-01 with total page 592 pages. Available in PDF, EPUB and Kindle. Book excerpt: