Download or read book Asian Test Symposium written by and published by . This book was released on 2005 with total page 526 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 11th Asian Test Symposium ATS 02 written by and published by IEEE Computer Society Press. This book was released on 2002 with total page 464 pages. Available in PDF, EPUB and Kindle. Book excerpt: Held in Guam in November of 2002, the symposium on the test technologies and research issues related to silicon chip production, resulted in the 74 papers presented here. The papers are organized into sections related to the symposium sessions on test generation, on-line testing, analog and mixed si
Download or read book 10th Anniversary Compendium of Papers from Asian Test Symposium written by and published by . This book was released on 2001 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Power Aware Testing and Test Strategies for Low Power Devices written by Patrick Girard and published by Springer Science & Business Media. This book was released on 2010-03-11 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt: Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
Download or read book Defect and Fault Tolerance in VLSI Systems written by Robert Aitken and published by . This book was released on 2004 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt: DFT 2004 showcases the latest research results in the in the field of defect and fault tolerance in VLSI systems. Its papers cover yield, defect and fault tolerance, error correction, and circuit/system reliability and dependability.
Download or read book ATS 2003 written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2003 with total page 544 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Asian Test Symposium provides an international forum for engineers and researchers from all countries of the World, especially from Asia, to present and discuss various aspects of system, board and device testing with design, manufacturing and field considerations in mind. ATS 2003's papers shares state-of-the-art ideas and technologies in testing.
Download or read book Advances in Microelectronics Reviews Vol 1 written by Sergey Yurish and published by Lulu.com. This book was released on 2017-12-24 with total page 536 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 1st volume of 'Advances in Microelectronics: Reviews' Book Series contains 19 chapters written by 72 authors from academia and industry from 16 countries. With unique combination of information in each volume, the 'Advances in Microelectronics: Reviews' Book Series will be of value for scientists and engineers in industry and at universities. In order to offer a fast and easy reading of the state of the art of each topic, every chapter in this book is independent and self-contained. All chapters have the same structure: first an introduction to specific topic under study; second particular field description including sensing applications. Each of chapter is ending by well selected list of references with books, journals, conference proceedings and web sites. This book ensures that readers will stay at the cutting edge of the field and get the right and effective start point and road map for the further researches and developments.
Download or read book International Conference on Intelligent Computing and Applications written by Subhransu Sekhar Dash and published by Springer. This book was released on 2017-12-28 with total page 662 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book is a collection of best papers presented in International Conference on Intelligent Computing and Applications (ICICA 2016) organized by Department of Computer Engineering, D.Y. Patil College of Engineering, Pune, India during 20-22 December 2016. The book presents original work, information, techniques and applications in the field of computational intelligence, power and computing technology. This volume also talks about image language processing, computer vision and pattern recognition, machine learning, data mining and computational life sciences, management of data including Big Data and analytics, distributed and mobile systems including grid and cloud infrastructure.
Download or read book Introduction to Advanced System on Chip Test Design and Optimization written by Erik Larsson and published by Springer Science & Business Media. This book was released on 2006-03-30 with total page 397 pages. Available in PDF, EPUB and Kindle. Book excerpt: SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Download or read book Generative and Component Based Software Engineering written by Jan Bosch and published by Springer. This book was released on 2003-06-30 with total page 186 pages. Available in PDF, EPUB and Kindle. Book excerpt: The size, complexity, and integration level of software systems is increasing c- stantly. Companies in all domains identify that software de?nes the competitive edge of their products. These developments require us to constantly search for new approaches to increase the productivity and quality of our software - velopment and to decrease the cost of software maintenance. Generative and component-based technologies hold considerablepromise with respect to achi- ing these goals. GCSE 2001 constituted another important step forward and provided a platform for academic and industrial researchers to exchange ideas. These proceedings represent the third conference on generative and com- nent-based software engineering. The conference originated as a special track on generative programming from the Smalltalk and Java in Industry and - ucation Conference (STJA), organized by the working group “Generative and Component-Based Software Engineering” of the “Gesellschaft fur ̈ Informatik” FG 2.1.9 “Object-Oriented Software Engineering.” However, the conference has evolved substantially since then, with its own, independent stature, invited speakers, and, most importantly, a stable and growing community. This year’s conference attracted 43 submissions from all over the world, - dicating the broad, international interest in the research ?eld. Based on careful review by the program committee, 14 papers were selected for presentation. I would like to thank the members of the program committee, all renowned - perts, for their dedication in preparing thorough reviews of the submissions.
Download or read book Embedded and Ubiquitous Computing written by Edwin Sha and published by Springer. This book was released on 2006-10-06 with total page 1192 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the International Conference on Embedded and Ubiquitous Computing, EUC 2006, held in Seoul, Korea, August 2006. The book presents 113 revised full papers together with 3 keynote articles, organized in topical sections on power aware computing, security and fault tolerance, agent and distributed computing, wireless communications, real-time systems, embedded systems, multimedia and data management, mobile computing, network protocols, middleware and P2P, and more.
Download or read book Information Systems Design and Intelligent Applications written by Vikrant Bhateja and published by Springer. This book was released on 2018-03-01 with total page 1112 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book is a collection of high-quality peer-reviewed research papers presented at International Conference on Information System Design and Intelligent Applications (INDIA 2017) held at Duy Tan University, Da Nang, Vietnam during 15-17 June 2017. The book covers a wide range of topics of computer science and information technology discipline ranging from image processing, database application, data mining, grid and cloud computing, bioinformatics and many others. The various intelligent tools like swarm intelligence, artificial intelligence, evolutionary algorithms, bio-inspired algorithms have been well applied in different domains for solving various challenging problems.
Download or read book SOC System on a Chip Testing for Plug and Play Test Automation written by Krishnendu Chakrabarty and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt: System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
Download or read book Algorithms Architectures and Information Systems Security written by Bhargab B. Bhattacharya and published by World Scientific. This book was released on 2009 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains articles written by leading researchers in the fields of algorithms, architectures, and information systems security. The first five chapters address several challenging geometric problems and related algorithms. These topics have major applications in pattern recognition, image analysis, digital geometry, surface reconstruction, computer vision and in robotics. The next five chapters focus on various optimization issues in VLSI design and test architectures, and in wireless networks. The last six chapters comprise scholarly articles on information systems security covering privacy issues, access control, enterprise and network security, and digital image forensics.
Download or read book Advances in Engineering Design written by Rohit Sharma and published by Springer Nature. This book was released on with total page 816 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Fault Analysis in Cryptography written by Marc Joye and published by Springer Science & Business Media. This book was released on 2012-06-21 with total page 352 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the 1970s researchers noticed that radioactive particles produced by elements naturally present in packaging material could cause bits to flip in sensitive areas of electronic chips. Research into the effect of cosmic rays on semiconductors, an area of particular interest in the aerospace industry, led to methods of hardening electronic devices designed for harsh environments. Ultimately various mechanisms for fault creation and propagation were discovered, and in particular it was noted that many cryptographic algorithms succumb to so-called fault attacks. Preventing fault attacks without sacrificing performance is nontrivial and this is the subject of this book. Part I deals with side-channel analysis and its relevance to fault attacks. The chapters in Part II cover fault analysis in secret key cryptography, with chapters on block ciphers, fault analysis of DES and AES, countermeasures for symmetric-key ciphers, and countermeasures against attacks on AES. Part III deals with fault analysis in public key cryptography, with chapters dedicated to classical RSA and RSA-CRT implementations, elliptic curve cryptosystems and countermeasures using fault detection, devices resilient to fault injection attacks, lattice-based fault attacks on signatures, and fault attacks on pairing-based cryptography. Part IV examines fault attacks on stream ciphers and how faults interact with countermeasures used to prevent power analysis attacks. Finally, Part V contains chapters that explain how fault attacks are implemented, with chapters on fault injection technologies for microprocessors, and fault injection and key retrieval experiments on a widely used evaluation board. This is the first book on this topic and will be of interest to researchers and practitioners engaged with cryptographic engineering.
Download or read book Test Generation of Crosstalk Delay Faults in VLSI Circuits written by S. Jayanthy and published by Springer. This book was released on 2018-09-20 with total page 161 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
