Download or read book Proceedings of the European Symposium on Reliability of Electron Devices Failure Physics and Analysis written by and published by . This book was released on 1999 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book ISTFA 2019 Proceedings of the 45th International Symposium for Testing and Failure Analysis written by ASM International and published by ASM International. This book was released on 2019-12-01 with total page 540 pages. Available in PDF, EPUB and Kindle. Book excerpt: The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.
Download or read book Component Reliability for Electronic Systems written by Titu I. Băjenescu and published by Artech House. This book was released on 2010 with total page 706 pages. Available in PDF, EPUB and Kindle. Book excerpt: The main reason for the premature breakdown of today's electronic products (computers, cars, tools, appliances, etc.) is the failure of the components used to build these products. Today professionals are looking for effective ways to minimize the degradation of electronic components to help ensure longer-lasting, more technically sound products and systems. This practical book offers engineers specific guidance on how to design more reliable components and build more reliable electronic systems. Professionals learn how to optimize a virtual component prototype, accurately monitor product reliability during the entire production process, and add the burn-in and selection procedures that are the most appropriate for the intended applications. Moreover, the book helps system designers ensure that all components are correctly applied, margins are adequate, wear-out failure modes are prevented during the expected duration of life, and system interfaces cannot lead to failure.
Download or read book Hot Carrier Degradation in Semiconductor Devices written by Tibor Grasser and published by Springer. This book was released on 2014-10-29 with total page 518 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.
Download or read book Thirty fourth International Symposium for Testing and Failure Analysis written by ASM International and published by ASM International. This book was released on 2008-01-01 with total page 551 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Signal Integrity Effects in Custom IC and ASIC Designs written by Raminderpal Singh and published by John Wiley & Sons. This book was released on 2001-12-12 with total page 484 pages. Available in PDF, EPUB and Kindle. Book excerpt: "...offers a tutorial guide to IC designers who want to move to the next level of chip design by unlocking the secrets of signal integrity." —Jake Buurma, Senior Vice President, Worldwide Research & Development, Cadence Design Systems, Inc. Covers signal integrity effects in high performance Radio Frequency (RF) IC Brings together research papers from the past few years that address the broad range of issues faced by IC designers and CAD managers now and in the future A Wiley-IEEE Press publication
Download or read book Thermal Management of Electronic Systems II written by E. Beyne and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 358 pages. Available in PDF, EPUB and Kindle. Book excerpt: For the second time, the Eurotherm Committee has chosen Thermal Managment of Electronic Systems as the subject for its 45th Seminar, held at IMEC in Leuven, Belgium, from 20 to 22 September 1995. After the successfui first edition of this seminar in Delft, June 14-16, 1993, it was decided to repeat this event on a two year basis. This volume constitutes the edited proceedings of the Seminar. Thermal management of electronic systems is gaining importance. Whereas a few years ago papers on this subject where mainly devoted to applications in high end markets, such as mainframes and telecommunication switching equipment, we see a growing importance in the "lower" end applications. This may be understood from the growing impact of electronics on every day life, from car electronics, GSM phones, personal computers to electronic games. These applications add new requirements to the thermal design. The thermal problem and the applicable cooling strategies are quite different from those in high end products. In this seminar the latest developments in many of the different aspects of the thermal design of electronic systems were discussed. Particular attention was given to thermal modelling, experimental characterisation and the impact of thermal design on the reliability of electronic systems.
Download or read book Publications in Engineering written by and published by . This book was released on 2002 with total page 636 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Index of Conference Proceedings written by British Library. Document Supply Centre and published by . This book was released on 1998 with total page 890 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of the 13th European Symposium on the Reliability of Electron Devices Failure Physics and Analysis written by F. Fantini and published by Pergamon. This book was released on 2002-10 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Proceedings contains the papers presented at the 13th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2002), held in Bellaria, Italy, 7-11 Oct 2002. The Proceedings are being published concurrently as a special issue of Microelectronics Reliability . Since its foundation in 1990, the annual ESREF symposium has been the premier European forum for the discussion of research in all aspects of specification, technology and manufacturing, test, control and analysis for microelectronic devices and circuits. Researchers at top institutions, in Europe and elsewhere, present high-quality experimental results at ESREF. The ESREF Proceedings have been published by Elsevier Science since 1996. This year's Proceedings follow the format and style of previous books in the series, and as always the list of topics addressed changes to keep up with developments in the field. Two new topics this year are optical devices and microelectromechanical systems (MEMS); both have attracted a high number of scientific contributions. The Proceedings contains nine invited papers and approximately 100 submitted contributions on the following topics: bull; Quality and reliability techniques for components and system bull; Failure mechanisms in silicon devices bull; Failure mechanisms in compound semiconductors devices bull; Non-volatile and programmable device reliability bull; Power devices reliability bull; Photonics reliability bull; Packaging and assembly reliability bull; Advanced failure analysis: defect detection and analysis bull; Electron and optical beam testing (EOBT) bull; Electrostatic discharge (ESD) bull; MEMS/MOEMS (Special Session) All papers are reviewed prior to publication. In this, the 40th year of publication of the journal Microelectronics Reliability, two of the invited papers are contributed by senior members of the Journal's Editorial Board, and are dedicated to that anniversary. This Proceedings will be indispensable for scientists and engineers working on the quality and reliability of microelectronic devices and circuits, and for anyone with a general interest in microelectronics research. For more information on Microelectronics Reliability , visit http://www.elsevier.com/locate/microrel http://www.elsevier.com/locate/microrel
Download or read book Failure Analysis of Integrated Circuits written by Lawrence C. Wagner and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 256 pages. Available in PDF, EPUB and Kindle. Book excerpt: This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
Download or read book Chemical Abstracts Service Source Index written by American Chemical Society. Chemical Abstracts Service and published by . This book was released on 1907 with total page 2064 pages. Available in PDF, EPUB and Kindle. Book excerpt: A key source to journal and conference abbreviations in the sciences. Although it focuses on chemistry, other scientific and engineering disciplines are also well represented. In addition to the abbreviation and full title, each entry also contains publishing info, title changes, language and frequency of publication, and libraries owning that title. Over 130,000 entries representing more than 70,000 publications dating back to 1907 are included.
Download or read book Procedings of the 11th European Symposium on the Reliability of Electron Devices Failure Physics and Analysis written by L. J. Balk and published by Pergamon Press. This book was released on 2000-11-17 with total page 544 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains the papers presented at ESREF 2000, the 11th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis, which was held in Dresden, Germany, from October 2-6 2000. The papers are being published concurrently as a special issue of the journal http://www.elsevier.nl/locate/microrelMicroelectronics Reliability. The ESREF symposium is the annual European forum for reliability physics and analysis of electronic components. This Proceedings volume contains oral papers from the nine conference sessions in ESREF 2000. The session topics, reflecting the main areas of interest within the scope of the Symposium, are as follows: • Design for reliability • Failure mechanisms in metallizations and dielectrics • Fault localisation • Packaging, assemblies and reliability • Silicon devices • Product realisation • Power devices and high temperature electronics • Compound semiconductors • Physical failure analysis The Proceedings contains oral and poster papers from the Symposium, and includes a number of keynote and invited papers. The invited papers feature an international spread of authors and serve to introduce the conference sessions and focus on leading work in these areas. In addition, the Proceedings includes the winner of the Best Paper Award at the Reliability Center Japanese Conference (RCJ 99, Japan). These Proceedings are available as a CD. The CD-ROM is a hybrid disc allowing PC, Macintosh and UNIX users to share the same directory structure and access common files. All materials are published using Adobe® Acrobat technology. The CD includes versions of Acrobat® Reader 4.0 for Microsoft® Windows™, Apple® Macintosh™ and UNIX®.
Download or read book Electrical Electronics Abstracts written by and published by . This book was released on 1997 with total page 2240 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of the 13th European Symposium on the Reliability of Electron Devices Failure Physics and Analysis written by F. Fantini and published by Pergamon Press. This book was released on 2002 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: This Proceedings contains the papers presented at the 13th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2002), held in Bellaria, Italy, 7-11 Oct 2002. The Proceedings are being published concurrently as a special issue of Microelectronics Reliability. Since its foundation in 1990, the annual ESREF symposium has been the premier European forum for the discussion of research in all aspects of specification, technology and manufacturing, test, control and analysis for microelectronic devices and circuits. Researchers at top institutions, in Europe and elsewhere, present high-quality experimental results at ESREF. The ESREF Proceedings have been published by Elsevier Science since 1996. This year's Proceedings follow the format and style of previous books in the series, and as always the list of topics addressed changes to keep up with developments in the field. Two new topics this year are optical devices and microelectromechanical systems (MEMS); both have attracted a high number of scientific contributions. The Proceedings contains nine invited papers and approximately 100 submitted contributions on the following topics: • Quality and reliability techniques for components and system • Failure mechanisms in silicon devices • Failure mechanisms in compound semiconductors devices • Non-volatile and programmable device reliability • Power devices reliability • Photonics reliability • Packaging and assembly reliability • Advanced failure analysis: defect detection and analysis • Electron and optical beam testing (EOBT) • Electrostatic discharge (ESD) • MEMS/MOEMS (Special Session) All papers are reviewed prior to publication. In this, the 40th year of publication of the journal Microelectronics Reliability, two of the invited papers are contributed by senior members of the Journal's Editorial Board, and are dedicated to that anniversary. This Proceedings will be indispensable for scientists and engineers working on the quality and reliability of microelectronic devices and circuits, and for anyone with a general interest in microelectronics research. For more information on Microelectronics Reliability, visit http://www.elsevier.com/locate/microrelhttp://www.elsevier.com/locate/microrel
Download or read book The British National Bibliography written by Arthur James Wells and published by . This book was released on 2007 with total page 870 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 1996 IEEE MTT S International Microwave Symposium Digest written by Richard G. Ranson and published by . This book was released on 1996 with total page 776 pages. Available in PDF, EPUB and Kindle. Book excerpt:
