Download or read book Transmission Electron Microscopy written by David B. Williams and published by Springer Science & Business Media. This book was released on 2009-08-05 with total page 804 pages. Available in PDF, EPUB and Kindle. Book excerpt: This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, the book provides the necessary instructions for successful hands-on application of this versatile materials characterization technique.

Download or read book Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and published by Springer Science & Business Media. This book was released on 2011-03-24 with total page 764 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Download or read book Aberration Corrected Analytical Transmission Electron Microscopy written by Rik Brydson and published by John Wiley & Sons. This book was released on 2011-08-02 with total page 235 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

Download or read book Transmission Electron Microscopy written by C. Barry Carter and published by Springer. This book was released on 2016-08-24 with total page 543 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Download or read book Istfa 2003 written by ASM International and published by ASM International. This book was released on 2003-01-01 with total page 534 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microbeam Analysis written by D Williams and published by CRC Press. This book was released on 2000-01-01 with total page 546 pages. Available in PDF, EPUB and Kindle. Book excerpt: Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volume.

Download or read book Transmission Electron Microscopy written by David B. Williams and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 708 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.

Download or read book CURRENT TRENDS IN ADVANCEMENT OF SCIENTIFIC RESEARCH AND OPINION IN APPLIED MICROBIOLOGY AND BIOTECHNOLOGY written by Ramesh Raliya and J. C. Tarafdar and published by SCIENCE AND EDUCATION DEVELOPMENT INSTITUTE, NIGERIA. This book was released on 2013-06-16 with total page 79 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book provides an insight and detailed knowledge on the various aspects of applied microbiology and biotechnology as is going on in the present research trend. The book discusses on various integral issues related to microbiology and biotechnology which will prove to be of immense help to the academicians, scientists, researchers, technocrats and students worldwide. The book is a sincere work of compilation of new and recent advances in the topic of concern through various innovative researches and scientific opinion there from. The book is dedicated to the readers who will definitely find it interesting and knowledgeable in carrying out their respective researches in different aspects of applied microbiology and biotechnology. Lastly, the Science and Education Development Institute [SEDInst], Akure, Nigeria is coming up with more Book Projects very soon on other disciplines currently in demand for the advancement of science, education and technology.

Download or read book NBS Special Publication written by and published by . This book was released on 1978 with total page 964 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Smithells Metals Reference Book written by E A Brandes and published by Elsevier. This book was released on 2013-10-22 with total page 801 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reviews of previous editions: 'A publication of no equal that has become an essential reference during its 35 years of publication' ASLIB Book List 'All metallurgists will covet a copy of Smithells' Chemistry and Industry '(It) provides an invaluable reference source for all workers, libraries and research laboratories in the field of engineering and metallurgy' BNF Abstract Smithells is the only single volume that provides all the data and references needed by those practicing metallurgy. The seventh edition of this standard reference work for metallurgists includes important new chapters on powder metallurgy and superconductivity. All chapters have been thoroughly revised to bring them up to date with developments since the last edition in 1983. In all this is the most complete compendium of information for industrial and theoretical metallurgists, and it is now available in a more accessible format including current data to 1997. Also available is Smithells Light Metals Handbook (ISBN 0750636254).THE standard reference work for metallurgistsContains all data for researchers and professional metallurgistsFully updated to the latest revisions of international standards

Download or read book Handbook of Radioactivity Analysis written by Michael F. L'Annunziata and published by Academic Press. This book was released on 2012-08-16 with total page 1420 pages. Available in PDF, EPUB and Kindle. Book excerpt: Authoritative reference providing the principles, practical techniques, and procedures for the accurate measurement of radioactivity.

Download or read book Advanced Transmission Electron Microscopy written by Jian Min Zuo and published by Springer. This book was released on 2016-10-26 with total page 741 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.

Download or read book Concise Dictionary of Materials Science written by Vladimir Novikov and published by CRC Press. This book was released on 2002-09-25 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: A detailed knowledge of the terminology and its background is necessary for a fundamental understanding of the professional literature in the field of materials science. This sharply focused, authoritative lexicon affords the reader a coherent idea of microstructure formation and evolution. All the term definitions are supplied with explanations an

Download or read book Toxicity of Nanomaterials written by Suresh Pillai and published by CRC Press. This book was released on 2019-05-16 with total page 259 pages. Available in PDF, EPUB and Kindle. Book excerpt: Choice Recommended Title, April 2020 This comprehensive book, edited by two leading experts in nanotechnology and bioengineering with contributions from a global team of specialists, provides a detailed overview of the environmental and health impacts associated with the toxicology of nanomaterials. Special attention is given to nanomaterial toxicity during synthesis, production and application, and chapters throughout are focused on key areas that are important for future research and development of nanomaterials. This book will be of interest to advanced students studying biomedical engineering and materials science, PhD researchers, post-docs and academics working in the area of nanotechnology, medicine, manufacturing and regulatory bodies. Features: Collates and critically evaluates various aspects of the toxicology of nanomaterials in one comprehensive text Discusses the various effects of nanocrystals including the morphologies on cytotoxicity, in addition to the environmental and cytotoxicity risks of graphene and 2D nanomaterials Explores practical methods of detection and quantification, with applications in the environmental and healthcare fields

Download or read book Microscopy of Semiconducting Materials 2003 written by A.G. Cullis and published by CRC Press. This book was released on 2018-01-10 with total page 705 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronic devices rely on ever-greater miniaturization of components, and semiconductor processing is approaching the domain of nanotechnology. Studies of devices in this regime can only be carried out with the most advanced forms of microscopy. Accordingly, Microscopy of Semiconducting Materials focuses on international developments in semiconductor studies carried out by all forms of microscopy. It provides an overview of the latest instrumentation, analysis techniques, and state-of-the-art advances in semiconducting materials science for solid state physicists, chemists, and material scientists.

Download or read book Advances in Metal Oxides and Their Composites for Emerging Applications written by Sagar D. Delekar and published by Elsevier. This book was released on 2022-08-26 with total page 745 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Metal Oxides and their Composites for Emerging Applications reviews key properties of metal-oxide based composites, including their structural, physicochemical, optical, electrical components and resulting performance in a wide range of diverse applications. Synthetic protocols used to create metal oxides with desirable morphologies, properties and performance for applications in solar energy harvesting, energy storage and environmental remediation are emphasized. Emerging technologies that address important global challenges such as energy shortage, the hazardous effects of non-renewable energy sources, unaffordable energy technologies, and the contaminants present in air and water are also covered. This book is an ideal resource for materials scientists and engineers working in academia and R&D. In addition, it's appropriate for those who either need an introduction to potential research directions or for experienced researchers and practitioners looking for a key reference on the latest advances. - Introduces the fundamental properties of metal oxide-based composites, paying special attention to physicochemical, optical, electrical and structural characteristics - Provides an overview of the synthetic protocols used to design and tune the properties of metal oxide-based composites for key emerging applications - Discusses metal oxide-based composites and their use in energy applications such as energy storage, energy harvesting and environmental remediation

Download or read book Transmission Electron Microscopy in Micro nanoelectronics written by Alain Claverie and published by John Wiley & Sons. This book was released on 2013-01-29 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt: Today, the availability of bright and highly coherent electron sources and sensitive detectors has radically changed the type and quality of the information which can be obtained by transmission electron microscopy (TEM). TEMs are now present in large numbers not only in academia, but also in industrial research centers and fabs. This book presents in a simple and practical way the new quantitative techniques based on TEM which have recently been invented or developed to address most of the main challenging issues scientists and process engineers have to face to develop or optimize semiconductor layers and devices. Several of these techniques are based on electron holography; others take advantage of the possibility of focusing intense beams within nanoprobes. Strain measurements and mappings, dopant activation and segregation, interfacial reactions at the nanoscale, defect identification and specimen preparation by FIB are among the topics presented in this book. After a brief presentation of the underlying theory, each technique is illustrated through examples from the lab or fab.