- Author : Chandra Shakher Pathak
- Publisher : BoD – Books on Demand
- Release : 2022-01-07
- ISBN : 1839682299
- Pages : 275 pages
Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
Download or read book Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization written by Chandra Shakher Pathak and published by BoD – Books on Demand. This book was released on 2022-01-07 with total page 275 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.