Download or read book Reliability Evaluation of ECL Microcircuits written by E. T. Lewis and published by . This book was released on 1976 with total page 308 pages. Available in PDF, EPUB and Kindle. Book excerpt: The objective of this study was to undertake a detailed analysis and reliability evaluation of ECL microcircuits available for use in high speed digital circuits. Special emphasis was placed on the effects of electromigration. The selected devices included SSI and MSI integration, one and two level metallization from a total of four major vendors. Metallization included aluminum with a silicon dopant, aluminum with copper and silicon dopants and pure aluminum with a titanium-tungsten barrier. Detail construction analysis and electrical characterization including thermal resistances were performed on all devices. Devices which failed during the performance of life testing were electrically categorized and physically analyzed to establish failure modes and mechanisms.
Download or read book Microcircuit Reliability Bibliography written by and published by . This book was released on 1978 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability Digital Evaluation and Generic Failure Analysis Data written by David B. Nicholls and published by . This book was released on 1979 with total page 354 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report of digital evaluation and generic failure analysis data is one of a series of annual microcircuit device reliability data publications compiled by the Reliability Analysis Center. This compendium provides burn-in and environmental/screening data on SSI and MSI digital microcircuits. Each document in the series contains analyzed reliability information in addition to a detailed presentation of field and test results. This information aids in determining device fallout rates and the operational test and field characteristics of devices. Life test results can be reviewed. The relative risks of screening decisions may also be determined. Additionally, information is available to form the foundation for failure mode effects and criticality analyses(FMECA). Through the data presented, these publications are intended to actively complement such publications as MIL-STD-883 and MIL-HDBK-217B. The user is cautioned, however, that the listed data may not be used in lieu of contractually cited references.
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1994 with total page 892 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Government Reports Announcements Index written by and published by . This book was released on 1976-11 with total page 796 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Handbook for Silicon Monolithic Microcircuits Reliability assessment of monolithic microcircuits by J D Adams et al written by Texas Instruments Incorporated and published by . This book was released on 1969 with total page 116 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Technical Abstract Bulletin written by and published by . This book was released on 1978 with total page 314 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The GEC Journal of Research written by and published by . This book was released on 1984 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Assessment of Microcircuits and Microelectronic Systems written by Eldon C. Hall and published by . This book was released on 1966 with total page 75 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Physics 1982 written by and published by . This book was released on 1982 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Assessment of Monolithic Microcircuits written by Jim D. Adams and published by . This book was released on 1969 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Government reports annual index written by and published by . This book was released on 199? with total page 1048 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Government Reports Annual Index Keyword A L written by and published by . This book was released on 1976 with total page 1052 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability Digital Evaluation and Failure Analysis Data Parts 1 and 2 Summer 1980 written by and published by . This book was released on 1980 with total page 765 pages. Available in PDF, EPUB and Kindle. Book excerpt: This compendium of digital SSI/MSI microcircuit device reliability is separated into two volumes. Part I deals with general summaries and detailed listings which address the various aspects of burn-in and environmental/ screening tests at the component level. Devices are classified according to test types and are arranged by test source, device function, operational type, device manufacturer, and commercial part number. Part II contains summaries of failure analysis data based upon failure indicators, failure modes, failure defects, failure defect causes, and failure activating stresses, as well as a detailed listing of verified failure events as derived from device- and equipment-level testing.
Download or read book Reliability Handbook for Silicon Monolithic Microcircuits written by Jim D. Adams and published by . This book was released on 1969 with total page 102 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuits Semiconductor Reliability Assessment Program written by Reliability Analysis Center (U.S.) and published by . This book was released on 1982 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Considerations in Plastic Encapsulated Microcircuits written by H. C. Edfors and published by . This book was released on 1971 with total page 112 pages. Available in PDF, EPUB and Kindle. Book excerpt: The monograph provides the potential user of plastic encapsulated microcircuits with a firm understanding of the materials, design, and performance capability achievable with current industry practices in order that he may determine their suitability and reliability for a particular application. (Author).
