Download or read book Quantitative Data Processing in Scanning Probe Microscopy written by Petr Klapetek and published by Elsevier. This book was released on 2018-02-03 with total page 418 pages. Available in PDF, EPUB and Kindle. Book excerpt: Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from http://gwyddion.net/qspm/ Features step-by-step guidance to aid readers in progressing from a general understanding of SPM principles to a greater mastery of complex data measurement techniques Includes a focus on metrology aspects of measurements, arming readers with a solid grasp of instrumentation and measuring methods accuracy Worked examples show quantitative data processing for different SPM analytical techniques

Download or read book Quantitative Data Processing in Scanning Probe Microscopy written by Petr Klapetek and published by William Andrew. This book was released on 2012-12-31 with total page 335 pages. Available in PDF, EPUB and Kindle. Book excerpt: Accurate measurement at the nano-scale – nanometrology – is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such as the complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences. Klapetek's considerable experience of Quantitive Data Processing, using software tools, enables him to not only explain the microscopy techniques, but also to demystify the analysis and interpretation of the data collected. In addition to the essential principles and theory of SPM metrology, Klapetek provides readers with a number of worked examples to demonstrate typical ways of solving problems in SPM analysis. Source data for the examples as well as most of the described open source software tools are available on a companion website. Unlocks the use of Scanning Probe Microscopy (SPM) for nanometrology applications in engineering, physics, life science and earth science settings Provides practical guidance regarding areas of difficulty such as tip/sample interaction and calibration – making metrology applications achievable Gives guidance on data collection and interpretation, including the use of software-based modeling (using applications that are mostly freely available)

Download or read book Acoustic Scanning Probe Microscopy written by Francesco Marinello and published by Springer Science & Business Media. This book was released on 2012-10-04 with total page 513 pages. Available in PDF, EPUB and Kindle. Book excerpt: The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.

Download or read book Scanning Probe Microscopy in Industrial Applications written by Dalia G. Yablon and published by John Wiley & Sons. This book was released on 2013-10-24 with total page 337 pages. Available in PDF, EPUB and Kindle. Book excerpt: Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others. Scanning Probe Microscopy in Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments. The second half of the book describes applications of nanomechanical characterization in industry, including: New formulation development for pharmaceuticals Measurement of critical dimensions and thin dielectric films in the semiconductor industry Effect of humidity and temperature on biomaterials Characterization of polymer blends to guide product formulation in the chemicals sector Unraveling links between food structure and function in the food industry Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems. By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy in Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.

Download or read book Scanning Probe Microscopy written by Laurene Tetard and published by American Chemical Society. This book was released on 2023-05-22 with total page 203 pages. Available in PDF, EPUB and Kindle. Book excerpt: Techniques of nanoscale functional imaging and spectroscopy have blossomed since the invention of scanning probe microscopy (SPM) tools, starting with scanning tunneling microscopy in the early 1980s. The ability to resolve topographical features with nanoscale—sometimes atomic—precision has revolutionized our understanding of molecules, matter, and living systems. These observations have led scientists to pose increasingly more complex questions about properties beyond morphology and their evolution upon external stimuli. Overall, SPM-based schemes provide versatile ways to probe structural, electrical, mechanical, and chemical properties of materials at the nanoscale. Getting started with SPM can be intimidating. This digital primer aims to provide undergraduate and graduate students majoring in various fields of science and engineering with a practical guide to grasp essential concepts and principles related to SPM image and spectra formation and their interpretation. This guide may also be helpful to researchers who are considering new ways of evaluating nanoscale properties of materials, devices, or living systems as applicable to their respective fields. Because of the extensive literature on the developments and applications of SPM, it was impossible to comprehensively cover all aspects of the field. Hence, deliberate choices were made to emphasize some techniques that have not been discussed as extensively in the literature but hold great promise to understand complex systems at the nanoscale.

Download or read book Applied Scanning Probe Methods XI written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-22 with total page 281 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.

Download or read book Design Modeling and Control of Nanopositioning Systems written by Andrew J. Fleming and published by Springer. This book was released on 2014-05-15 with total page 418 pages. Available in PDF, EPUB and Kindle. Book excerpt: Covering the complete design cycle of nanopositioning systems, this is the first comprehensive text on the topic. The book first introduces concepts associated with nanopositioning stages and outlines their application in such tasks as scanning probe microscopy, nanofabrication, data storage, cell surgery and precision optics. Piezoelectric transducers, employed ubiquitously in nanopositioning applications are then discussed in detail including practical considerations and constraints on transducer response. The reader is then given an overview of the types of nanopositioner before the text turns to the in-depth coverage of mechanical design including flexures, materials, manufacturing techniques, and electronics. This process is illustrated by the example of a high-speed serial-kinematic nanopositioner. Position sensors are then catalogued and described and the text then focuses on control. Several forms of control are treated: shunt control, feedback control, force feedback control and feedforward control (including an appreciation of iterative learning control). Performance issues are given importance as are problems limiting that performance such as hysteresis and noise which arise in the treatment of control and are then given chapter-length attention in their own right. The reader also learns about cost functions and other issues involved in command shaping, charge drives and electrical considerations. All concepts are demonstrated experimentally including by direct application to atomic force microscope imaging. Design, Modeling and Control of Nanopositioning Systems will be of interest to researchers in mechatronics generally and in control applied to atomic force microscopy and other nanopositioning applications. Microscope developers and mechanical designers of nanopositioning devices will find the text essential reading.

Download or read book Quantitative Microscopy and Image Analysis written by David J. Diaz and published by ASM International(OH). This book was released on 1994 with total page 148 pages. Available in PDF, EPUB and Kindle. Book excerpt: Sponsored by Materials Characterization Committee of Materials Testing and Quality Control Division ASM Publication More precise data for quality control Accurate analysis of complex images Relationship between ultrasonic and metallographic measurements Correlation between 2- and 3- dimensional distributions. Sixteen selected papers examine theories, concepts and recent advances which will help you fill the need for more precise quality control and microstructure evaluation data through automatic image analysis. Computer-aided techniques now allow you to make fast, accurate quantification of morphological features recorded through optical metallography and scanning electron/transmission electron microscopy. Learn how accurate, reproducible measurements are being made from complex images which were previously difficult to analyze. Visual assessment of global properties and correlation with ultrasonic measurements are discussed. Subjects include: Mathematical Morphology Processing, Scanning Probe Microscopy, Infrared Sensing of Weld Penetration, Stereology of Anisotropic Microstructures Digital X-Ray Mapping.

Download or read book Data Science in Scanning Probe Microscopy written by William George Dusch and published by . This book was released on 2019 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning probe microscopy (SPM) has allowed researchers to measure materials structural andfunctional properties, such as atomic displacements and electronic properties at the nanoscale. Over thepast decade, great leaps in the ability to acquire large, high resolution datasets have opened up thepossibility of even deeper insights into materials. Unfortunately, these large datasets pose a problem fortraditional analysis techniques (and software), necessitating the development of new techniques inorder to better understand this new wealth of data.Fortunately, these developments are paralleled by the general rise of big data and the development ofmachine learning techniques that can help us discover and automate the process of extracting usefulinformation from this data. My thesis research has focused on bringing these techniques to all aspects ofSPM usage, from data collection through analysis. In this dissertation I present results from three ofthese efforts: the improvement of a vibration cancellation system developed in our group via theintroduction of machine learning, the classification of SPM images using machine vision, and thecreation of a new data analysis software package tailored for large, multidimensional datasets which ishighly customizable and eases performance of complex analyses.Each of these results stand on their own in terms of scientific impact for example, the machinelearning approach discussed here enables a roughly factor of two to three improvement over ouralready uniquely successful vibration cancellation system. However, together they represent somethingmore a push to bring machine learning techniques into the field of SPM research, where previouslyonly a handful of research groups have reported any attempts, and where all efforts to date havefocused on analysis, rather than collection, of data. These results also represent first steps in thedevelopment of a driverless SPM where the SPM could, on its own, identify, collect, and begin analysisof scientifically important data.

Download or read book Scanning Probe Microscopy written by Ernst Meyer and published by Springer Nature. This book was released on 2021-05-31 with total page 330 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Download or read book Scanning Probe Microscopy written by Nikodem Tomczak and published by World Scientific. This book was released on 2010-12-13 with total page 277 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Probe Microscopy (SPM) is the enabling tool for nano(bio)technology, which has opened new vistas in many interdisciplinary research areas. Concomitant with the developments in SPM instrumentation and techniques are new and previously unthought-of opportunities in materials nanofabrication and characterisation. In particular, the developments in addressing and manipulating matter at the level of single atoms or molecules, and studies of biological materials (e.g. live cells, or cell membranes) result in new and exciting discoveries.The rising importance of SPM demands a concise treatment in the form of a book which is accessible to interdisciplinary practitioners. This book highlights recent advances in the field of SPM with sufficient depth and breadth to provide an intellectually stimulating overview of the current state of the art. The book is based on a set of carefully selected original works from renowned contributors on topics that range from atom technology, scanning tunneling spectroscopy of self-assembled nanostructures, SPM probe fabrication, scanning force microscopy applications in biology and materials science down to the single molecule level, novel scanning probe techniques, and nanolithography.The variety of topics underlines the strong interdisciplinary character of SPM related research and the combined expertise of the contributors gives us a unique opportunity to discuss possible future trends in SPM related research. This makes the book not merely a collection of already published material but an enlightening insight into cutting edge research and global SPM research trends.

Download or read book Scanning Probe Microscopy written by Bert Voigtländer and published by Springer. This book was released on 2015-02-24 with total page 375 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Download or read book Roadmap of Scanning Probe Microscopy written by Seizo Morita and published by Springer Science & Business Media. This book was released on 2006-12-30 with total page 207 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.

Download or read book Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and published by Springer Science & Business Media. This book was released on 2011-03-24 with total page 764 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Download or read book Scanning Probe Microscopy written by Sergei V. Kalinin and published by Springer Science & Business Media. This book was released on 2007-04-03 with total page 1002 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.

Download or read book Scanning Probe Microscopy written by Adam Foster and published by Springer Science & Business Media. This book was released on 2006-10-14 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.

Download or read book Scanning Probe Microscopy written by Bert Voigtländer and published by . This book was released on 2015 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.