Download or read book Proceedings Third National Symposium on Reliability Quality Control in Electronics written by and published by . This book was released on 1956 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Catalog of Copyright Entries Third Series written by Library of Congress. Copyright Office and published by Copyright Office, Library of Congress. This book was released on 1967 with total page 1282 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes Part 1, Number 1: Books and Pamphlets, Including Serials and Contributions to Periodicals (January - June)
Download or read book Training for Reliability and Quality Control written by G. O. Hawley and published by . This book was released on 1961 with total page 12 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book WADC Technical Report written by United States. Wright Air Development Division and published by . This book was released on 1960 with total page 1274 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Handbook Reliability Engineering written by United States. Bureau of Naval Weapons and published by . This book was released on 1964 with total page 370 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Quality Control and Reliability Technical Report written by United States. Office of the Assistant Secretary of Defense (Installations and Logistics) and published by . This book was released on 1961 with total page 66 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Conference Proceedings written by and published by . This book was released on 1964 with total page 494 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Assessments written by Franklin Richard Nash, Ph.D. and published by CRC Press. This book was released on 2017-07-12 with total page 784 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides engineers and scientists with a single source introduction to the concepts, models, and case studies for making credible reliability assessments. It satisfies the need for thorough discussions of several fundamental subjects. Section I contains a comprehensive overview of assessing and assuring reliability that is followed by discussions of: • Concept of randomness and its relationship to chaos • Uses and limitations of the binomial and Poisson distributions • Relationship of the chi-square method and Poisson curves • Derivations and applications of the exponential, Weibull, and lognormal models • Examination of the human mortality bathtub curve as a template for components Section II introduces the case study modeling of failure data and is followed by analyses of: • 5 sets of ideal Weibull, lognormal, and normal failure data • 83 sets of actual (real) failure data The intent of the modeling was to find the best descriptions of the failures using statistical life models, principally the Weibull, lognormal, and normal models, for characterizing the failure probability distributions of the times-, cycles-, and miles-to-failure during laboratory or field testing. The statistical model providing the preferred characterization was determined empirically by choosing the two-parameter model that gave the best straight-line fit in the failure probability plots using a combination of visual inspection and three statistical goodness-of-fit (GoF) tests. This book offers practical insight in dealing with single item reliability and illustrates the use of reliability methods to solve industry problems.
Download or read book IRE National Convention Record written by Institute of Radio Engineers and published by . This book was released on 1958 with total page 944 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Preindications of Failure in Electronic Components written by J. W. Klapheke and published by . This book was released on 1965 with total page 68 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report discusses state-of-the-art information and techniques concerned with indications of potential degradation and catastrophic failure in electronic components. The objective of this survey is to present a comprehensive description of past, present, and future planned work on preindicators of failure for certain electronic components. This study is intended to provide basic information for future development in automatic checkout equipment. The following electronic parts were covered in the survey: semiconductors (transistors, diodes, and microcircuits), resistors, capacitors, inductors, computer cores, other items used in a computer, and vacuum tubes. Such items as wire, insulation, lamps, relays, and rotary devices were not considered. Precursors of failure have been investigated for electronic components but few have been identified at the present time. Most of these investigations were undertaken as part of programs directed at physics of failure, screening, or accelerated testing. The results of this study show that predictors of failure for semiconductors (transistors, diodes, and microcircuits) have received more attention than other types of parts. Current noise (l/f noise) and infrared emission profiles show promise as precursors that would apply to all types of semiconductors. Apparently computer cores and inductors are the least considered. (Author).
Download or read book Electronic Reliability Design Handbook written by and published by . This book was released on 1988 with total page 1098 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Failure Data Handbook for Nuclear Power Facilities Failure data and applications technology written by and published by . This book was released on 1970 with total page 856 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Air Force Flight Test Center Reliability Literature Survey written by Clarence L. Roberts and published by . This book was released on 1963 with total page 244 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Circuit Classification and Evaluation written by R. E. Warr and published by . This book was released on 1961 with total page 78 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Nuclear Science Abstracts written by and published by . This book was released on 1974 with total page 554 pages. Available in PDF, EPUB and Kindle. Book excerpt:
- Author : University of California, Berkeley
- Publisher :
- Release : 1964
- ISBN :
- Pages : 34 pages
IBM 1401 Computer Produced and Maintained Printed Book Catalogs at the Lawrence Radiation Laboratory
Download or read book IBM 1401 Computer Produced and Maintained Printed Book Catalogs at the Lawrence Radiation Laboratory written by University of California, Berkeley and published by . This book was released on 1964 with total page 34 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Abstracts and Technical Reviews written by United States. National Aeronautics and Space Administration. Office of Reliability and Quality Assurance and published by . This book was released on 1962 with total page 730 pages. Available in PDF, EPUB and Kindle. Book excerpt: