Download or read book Proceedings of the EMRS 2007 Fall Meeting Symposium H Current Trends in Optical and X Ray Metrology of Advanced Materials and Devices II written by Bernard Servet and published by . This book was released on 2008 with total page 6 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of the EMRS 2007 Fall Meeting Symposium H Current Trends in Optical and X Ray Metrology of Advanced Materials and Devices II written by and published by . This book was released on 2008 with total page 6 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Development and Characterization of a Dispersion Encoded Method for Low Coherence Interferometry written by Christopher Taudt and published by Springer Nature. This book was released on 2021-11-16 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Open Access book discusses an extension to low-coherence interferometry by dispersion-encoding. The approach is theoretically designed and implemented for applications such as surface profilometry, polymeric cross-linking estimation and the determination of thin-film layer thicknesses. During a characterization, it was shown that an axial measurement range of 79.91 μm with an axial resolution of 0.1 nm is achievable. Simultaneously, profiles of up to 1.5 mm in length were obtained in a scan-free manner. This marked a significant improvement in relation to the state-of-the-art in terms of dynamic range. Also, the axial and lateral measurement range were decoupled partially while functional parameters such as surface roughness were estimated. The characterization of the degree of polymeric cross-linking was performed as a function of the refractive index. It was acquired in a spatially-resolved manner with a resolution of 3.36 x 10-5. This was achieved by the development of a novel mathematical analysis approach.
Download or read book European Physical Journal written by and published by . This book was released on 2006 with total page 838 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of Symposium M on Optical and X Ray Metrology for Advanced Device Materials Characterization of the E MRS 2003 Spring Conference written by Daniel Chateigner and published by . This book was released on 2004 with total page 231 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Current trends in optical and X ray metrology of advanced materials for nanoscale devices written by and published by . This book was released on 2006 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of Symposium M on Optical and X ray Metrology for Advanced Device Materials Characterization written by D. Chateigner and published by . This book was released on 2004 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Current Trends in Optical and X ray Metrology of Advanced Materials for Nanoscale Devices written by Bernard Servet and published by . This book was released on 2010 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of Symposium M on Optical and X Ray Metrology for Advanced Device Materials Characterization of the E MRS 2003 Spring Conference written by and published by . This book was released on 2004 with total page 231 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of Symposium M on Optical and X ray Metrology for Advanced Device Materials Characterization of the E MRS 2003 Spring Conference written by and published by . This book was released on 2004 with total page 231 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Current Trends in Optical and X ray Metrology of Advanced Materials for Nanoscale Devices III written by and published by . This book was released on 2013 with total page 141 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Advances in Metrology for X Ray and EUV Optics II written by and published by . This book was released on 2007 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Advances in Metrology for X Ray and EUV Optics VII written by Lahsen Assoufid and published by . This book was released on 2017 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Advances in Metrology for X ray and EUV Optics written by Lahsen Assoufid and published by Society of Photo Optical. This book was released on 2005-01-01 with total page 184 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes Proceedings Vol. 7821
Download or read book Proceedings of the International Symposium on Optical Metrology in Industrial Medical and Daily Life Applications written by International symposium on optical metrology in industrial, medical, and daily life applications and published by . This book was released on 2008 with total page 501 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Applications of Optical Metrology techniques and Measurements II written by John J. Lee and published by . This book was released on 1983 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Advances in Metrology Proceedings of the Annual ISA Metrology Symposium written by International ISA Metrology Symposium and published by . This book was released on 1980 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
