Download or read book On the Improving of the Gate Oxide Reliability written by P. Bellutti and published by . This book was released on 1996 with total page 24 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book VLSI Gate Oxide Reliability written by Chih-chieh King and published by . This book was released on 1996 with total page 200 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Improvement of reliability of ultra thin gate oxide and oxynitride using fluorine implantation written by Prasenjit Chowdhury and published by . This book was released on 1996 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Oxide Reliability A Summary Of Silicon Oxide Wearout Breakdown And Reliability written by David J Dumin and published by World Scientific. This book was released on 2002-01-18 with total page 281 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in the field. The book will be an invaluable aid to reliability engineers and manufacturing engineers, helping them to produce and characterize reliable oxides. It can be used as an introduction for new engineers interested in oxide reliability, besides being a reference for engineers already engaged in the field.

Download or read book The Physics and Chemistry of SiO2 and the Si SiO2 Interface 3 1996 written by Hisham Z. Massoud and published by . This book was released on 1996 with total page 804 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book A Method for Projecting Gate Oxide Reliability and Optimizing Reliability Screens written by Reza Moazzami and published by . This book was released on 1989 with total page 58 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Proceedings of the Symposium on Crystalline Defects and Contamination Their Impact and Control in Device Manufacturing II written by Bernd O. Kolbesen (Chemiker.) and published by . This book was released on 1997 with total page 536 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Advanced Reliability Modeling Ii Reliability Testing And Improvement Proceedings Of The 2nd International Workshop Aiwarm 2006 written by Tadashi Dohi and published by World Scientific. This book was released on 2006-07-31 with total page 814 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 2006 Asian International Workshop on Advanced Reliability Modeling (AIWARM) is the second symposium in a series of biennial workshops for the dissemination of state-of-art research and the presentation of practice in reliability and maintenance engineering in Asia. It brings together researchers and engineers from not only Asian countries but also all over world to discuss the state of research and practice in dealing with both reliability issues at the system design phase and maintenance issues at the system operation phase. The theme of AIWARM 2006 is “reliability testing and improvement”. The contributions in this volume cover all the main topics in reliability and maintenance engineering, providing an in-depth presentation of theory and practice.

Download or read book Proceedings of the Symposia on Reliability of Semiconductor Devices interconnections and Dielectric Breakdown and Laser Process for Microelectronic Applications written by Electrochemical Society. Dielectric Science and Technology Division and published by The Electrochemical Society. This book was released on 1992 with total page 346 pages. Available in PDF, EPUB and Kindle. Book excerpt: Papers in this volume are from the 180th ECS Meeting, held in held in Phoenix, Arizona, Fall 1991. This symposium addresses all aspects of reliability of semiconductor devices, multilevel interconnection and dielectric breakdown in VLSI and ULSI technologies. The symposium establishes reliability from design through manufacturing. The second part of the symposium addresses laser ablation/etching, laser planarization laser/UV. CVD of metal end dielectric films, laser/UV enhanced etching and deposition processesing liquid phase, and photomodification of surfaces.

Download or read book Mechanisms of Improved Reliability in Reoxidized Nitrided Oxide MOS Gate Dielectrics written by Kathleen Susan Krisch and published by . This book was released on 1993 with total page 270 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reliability Wearout Mechanisms in Advanced CMOS Technologies written by Alvin W. Strong and published by John Wiley & Sons. This book was released on 2009-10-13 with total page 642 pages. Available in PDF, EPUB and Kindle. Book excerpt: This invaluable resource tells the complete story of failure mechanisms—from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.

Download or read book Silicon Nitride and Silicon Dioxide Thin Insulating Films written by and published by . This book was released on 1999 with total page 306 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Silicon Nitride and Silicon Dioxide Thin Insulating Films VII written by Electrochemical Society. Meeting and published by The Electrochemical Society. This book was released on 2003 with total page 652 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Gate Oxide Reliability of Poly Si and Poly SiGe CMOS Devices written by Vincent Etienne Houtsma and published by . This book was released on 2000 with total page 174 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Belief Reliability Theory and Methodology written by Rui Kang and published by Springer Nature. This book was released on 2021-08-01 with total page 187 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book, from the perspective of reliability science construction, proposes a new theory called BELIEF RELIABILITY theory on the basis of probability theory, uncertainty theory and chance theory. The main topics include the philosophical basis of reliability science, the principles of reliability science, the criteria of reasonable reliability metrics and the basic theoretical framework and methodology of belief reliability theory. In this book, the belief reliability metric, analysis, design and evaluation methods will provide readers with a brand-new perspective on reliability applications and uncertainty quantification.

Download or read book Cooling Of Microelectronic And Nanoelectronic Equipment Advances And Emerging Research written by Madhusudan Iyengar and published by World Scientific. This book was released on 2014-08-25 with total page 471 pages. Available in PDF, EPUB and Kindle. Book excerpt: To celebrate Professor Avi Bar-Cohen's 65th birthday, this unique volume is a collection of recent advances and emerging research from various luminaries and experts in the field. Cutting-edge technologies and research related to thermal management and thermal packaging of micro- and nanoelectronics are covered, including enhanced heat transfer, heat sinks, liquid cooling, phase change materials, synthetic jets, computational heat transfer, electronics reliability, 3D packaging, thermoelectrics, data centers, and solid state lighting.This book can be used by researchers and practitioners of thermal engineering to gain insight into next generation thermal packaging solutions. It is an excellent reference text for graduate-level courses in heat transfer and electronics packaging.

Download or read book Springer Handbook of Engineering Statistics written by Hoang Pham and published by Springer Science & Business Media. This book was released on 2006 with total page 1135 pages. Available in PDF, EPUB and Kindle. Book excerpt: In today’s global and highly competitive environment, continuous improvement in the processes and products of any field of engineering is essential for survival. This book gathers together the full range of statistical techniques required by engineers from all fields. It will assist them to gain sensible statistical feedback on how their processes or products are functioning and to give them realistic predictions of how these could be improved. The handbook will be essential reading for all engineers and engineering-connected managers who are serious about keeping their methods and products at the cutting edge of quality and competitiveness.