Download or read book Noise Temperature Measurements on Wafer Classic Reprint written by James Randa and published by Forgotten Books. This book was released on 2017-10-27 with total page 72 pages. Available in PDF, EPUB and Kindle. Book excerpt: Excerpt from Noise Temperature Measurements on Wafer Parameters on wafer, in particular the noise figure of a two - port device, such as some variety of low-noise transistor. The noise figure of a device is a measure of the noise added to the input signal by the device itself. It is determined by measuring the output noise power from the device for different known levels of input noise power. Because the noise figure of a device depends on the impedance of the input source, it must be measured for several different input impedances to characterize that dependence. Alternatively, if there is a single input impedance of interest, for example, 50 0, then the noise figure can be measured at just that one impedance. A good deal of work. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
Download or read book Noise Temperature Measurements on Wafer written by J. Randa and published by . This book was released on 1997 with total page 57 pages. Available in PDF, EPUB and Kindle. Book excerpt: The NIST Noise Project has developed the theoretical formalism and experimental methods for performing accurate noise-temperature measurements on wafer. This report presents the theoretical formulation and describes the design, methods, and results of tests performed to verify our ability to measure on-wafer noise temperature. With known off-wafer noise sources, several different configurations were used to obtain different, known, on-wafer noise temperatures. These were then measured, and the results were compared to predictions. Good agreement was found, with a worst-case disagreement of 2.6 percent. An uncertainty analysis of the measurements resulted in an estimated standard uncertainty (1o) of 1.1. percent or less for most vlues of noise temperature. The tests also confirm our ability to produce known noise temperatures on wafer.
Download or read book Precision Measurement of Microwave Thermal Noise written by James Randa and published by John Wiley & Sons. This book was released on 2022-11-02 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt: Precision Measurement of Microwave Comprehensive resource covering the foundations and analysis of precision noise measurements with a detailed treatment of their uncertainties Precision Measurement of Microwave Thermal Noise presents the basics of precise measurements of thermal noise at microwave frequencies and guides readers through how to evaluate the uncertainties in such measurement. The focus is on measurement methods used at the U.S. National Institute of Standards and Technology (NIST), but the general principles and methods are useful in a wide range of applications. Readers will learn how to perform accurate microwave noise measurements using the respected author’s expertise of calculations to aid understanding of the challenges and solutions. The text covers the background required for the analysis of the measurements and the standards employed to calibrate radiofrequency and microwave radiometers. It also covers measurements of noise temperature (power) and the noise characteristics of amplifiers and transistors. In addition to the usual room-temperature two-port devices, cryogenic devices and multiport amplifiers are also discussed. Finally, the connection of these lab-based measurements to remote-sensing measurement (especially from space) is considered, and possible contributions of the lab-based measurements to remote-sensing applications are discussed. Specific topics and concepts covered in the text include: Noise-temperature standards, covering ambient standards, hot (oven) standards, cryogenic standards, and other standards and noise sources Amplifier noise, covering definition of noise parameters, measurement of noise parameters, uncertainty analysis for noise-parameter measurements, and simulations and strategies On-wafer noise measurements, covering on-wafer microwave formalism, noise temperature, on-wafer noise-parameter measurements, and uncertainties Multiport amplifiers, covering formalism and noise matrix, definition of noise figure for multiports, and degradation of signal-to-noise ratio Containing some introductory material, Precision Measurement of Microwave Thermal Noise is an invaluable resource on the subject for advanced students and all professionals working in (or entering) the field of microwave noise measurements, be it in a standards lab, a commercial lab, or academic research.
Download or read book Journal of Research of the National Institute of Standards and Technology written by and published by . This book was released on 2000 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Detailed Study of Uncertainties in On wafer Transistor Noise parameter Measurements written by James Randa and published by . This book was released on 2016 with total page 33 pages. Available in PDF, EPUB and Kindle. Book excerpt: This paper uses a Monte Carlo simulation program to explore various aspects of uncertainties associated with the measurement of the noise parameters of transistors on wafers. The dependence of the noise-parameter uncertainties on the different input uncertainties is investigated in detail. Other issues that are considered include the effect of probe losses, the importance (or not) of including input terminations with reflection coefficients as near as possible to the edge of the Smith chart, improvements due to inclusion of an input termination with noise temperature well below ambient, and the effect of including a 'reverse' measurement. We also briefly consider the case of well-matched amplifiers on wafers.
Download or read book NISTIR written by and published by . This book was released on 2001 with total page 64 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book RF Measurements of Die and Packages written by Scott A. Wartenberg and published by Artech House. This book was released on 2002 with total page 256 pages. Available in PDF, EPUB and Kindle. Book excerpt: The recent explosion of the RF wireless integrated circuits (IC), coupled with higher operating speeds in digital IC's has made accurate RF testing of IC's vital. This ground-breaking resource explains the fundamentals of performing accurate RF measurements of die and packages. It offers you practical advice on how to use coplanar probes and test fixtures in the lab for RF on-wafer die and package characterization. It also details how to build separate RF test systems for noise, high-power, and thermal testing as well as de-embed the test system's parasitic effects to get the die's RF performance. This book is a handy, practical resource for RFIC and MMIC designers as well as high-frequency digital IC designers, IC test engineers, and IC manufacturing test engineers.
Download or read book Radiometric Temperature Measurements written by and published by Academic Press. This book was released on 2009-11-18 with total page 479 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes the practice of radiation thermometry, both at a primary level and for a variety of applications, such as in the materials processing industries and remote sensing. This book is written for those who will a) apply radiation thermometry in industrial practice b) use radiation thermometers for scientific research, c) the radiation thermometry specialist in a national measurement institute d) developers of radiation thermometers who are working to innovate products for instrument manufacturers and e) developers non-contact thermometry methods to address challenging thermometry problems. The author(s) of each chapter were chosen from a group of international scientists who are experts in the field and specialist(s) on the subject matter covered in the chapter. A large number of references are included at the end of each chapter as a resource for those seeking a deeper or more detailed understanding. This book is more than a practice guide. Readers will gain in-depth knowledge in: (1) the proper selection of the type of thermometer; (2) the best practice in using the radiation thermometers; (3) awareness of the error sources and subsequent appropriate procedure to reduce the overall uncertainty; and (4) understanding of the calibration chain and its current limitations. - Coverage of all fundamental aspects of the radiometric measurements - Coverage of practical applications with details on the instrumentation, calibration, and error sources - Authors are from the national labs internationally leading in R&D in temperature measurements - Comprehensive coverage with large number of references
Download or read book Eeel Technical Accomplishments 1998 written by JoAnne M. Surette and published by DIANE Publishing. This book was released on 1999-09 with total page 80 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Electronics and Electrical Engineering Laboratory (EEEL), working in concert with other NIST Laboratories, is providing measurement and other generic technology critical to the competitiveness of the U.S. electronics industry and the U.S. electricity-equipment industry. This report summarizes selected technical accomplishments and describes activities conducted by the Lab in FY 1998. Also included are profiles of EEEL's organization, customer interactions, and long-term goals. Appendix includes crosswalk of EEEL programs and projects; EEEL FY1998 resources; EEEL FY1998 CRADAS; and EEEL organization chart.
Download or read book Microwave Network Design Using the Scattering Matrix written by Janusz Dobrowolski and published by Artech House. This book was released on 2010 with total page 287 pages. Available in PDF, EPUB and Kindle. Book excerpt: This authoritative resource provides you with comprehensive and detailed coverage of the wave approach to microwave network characterization, analysis, and design using scattering parameters. For the first time in any book, all aspects and approaches to wave variables and the scattering matrix are explored. The book compares and contrasts voltage waves, travelling waves, pseudo waves, and power waves, and explains the differences between real scattering parameters, pseudo scattering parameters, and power scattering parameters. You find important discussions on standard scattering matrices and wave quantities, mixed mode wave variables, and noise wave variables with noise wave correlation matrices. Moreover, the book presents clear methods for standard single ended multiport network design and noise analysis. This in-depth reference is packed with over 1,100 equations and numerous illustrations.
Download or read book Advances in Rapid Thermal and Integrated Processing written by F. Roozeboom and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 568 pages. Available in PDF, EPUB and Kindle. Book excerpt: Rapid thermal and integrated processing is an emerging single-wafer technology in ULSI semiconductor manufacturing, electrical engineering, applied physics and materials science. Here, the physics and engineering of this technology are discussed at the graduate level. Three interrelated areas are covered. First, the thermophysics of photon-induced annealing of semiconductor and related materials, including fundamental pyrometry and emissivity issues, the modelling of reactor designs and processes, and their relation to temperature uniformity. Second, process integration, treating the advances in basic equipment design, scale-up, integrated cluster-tool equipment, including wafer cleaning and integrated processing. Third, the deposition and processing of thin epitaxial, dielectric and metal films, covering selective deposition and epitaxy, integrated processing of layer stacks, and new areas of potential application, such as the processing of III-V semiconductor structures and thin- film head processing for high-density magnetic data storage.
Download or read book The Telecommunications and Data Acquisition Progress Report written by and published by . This book was released on 1994-10 with total page 230 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book A Guide to Noise in Microwave Circuits written by Peter Heymann and published by John Wiley & Sons. This book was released on 2021-12-02 with total page 516 pages. Available in PDF, EPUB and Kindle. Book excerpt: A GUIDE TO NOISE IN MICROWAVE CIRCUITS A fulsome exploration of critical considerations in microwave circuit noise In A Guide to Noise in Microwave Circuits: Devices, Circuits, and Measurement, a team of distinguished researchers deliver a comprehensive introduction to noise in microwave circuits, with a strong focus on noise characterization of devices and circuits. The book describes fluctuations beginning with their physical origin and touches on the general description of noise in linear and non-linear circuits. Several chapters are devoted to the description of noise measurement techniques and the interpretation of measured data. A full chapter is dedicated to noise sources as well, including thermal, shot, plasma, and current. A Guide to Noise in Microwave Circuits offers examples of measurement problems—like low noise block (LNB) of satellite television – and explores equipment and measurement methods, like the Y, cold source, and 7-state method. This book also includes: A thorough introduction to foundational terms in microwave circuit noise, including average values, amplitude distribution, autocorrelation, cross-correlation, and noise spectra Comprehensive explorations of common noise sources, including thermal noise, the Nyquist formula and thermal radiation, shot noise, plasma noise, and more Practical discussions of noise and linear networks, including narrowband noise In-depth examinations of calculation methods for noise quantities, including noise voltages, currents, and spectra, the noise correlation matrix, and the noise of simple passive networks Perfect for graduate students specializing in microwave and wireless electronics, A Guide to Noise in Microwave Circuits: Devices, Circuits, and Measurement will also earn a place in the libraries of professional engineers working in microwave or wireless circuits and system design.
Download or read book Microwave Measurements written by R.J. Collier and published by IET. This book was released on 2007-10-24 with total page 506 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book covers the following areas: microwave measurement.
Download or read book Ninth International Conference on Noise in Physical Systems written by Carolyn M. Van Vliet and published by . This book was released on 1987 with total page 648 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Lock in Thermography written by Otwin Breitenstein and published by Springer. This book was released on 2019-01-09 with total page 339 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.
Download or read book Solid State Circuits Technologies written by Jacobus Swart and published by BoD – Books on Demand. This book was released on 2010-01-01 with total page 476 pages. Available in PDF, EPUB and Kindle. Book excerpt: The evolution of solid-state circuit technology has a long history within a relatively short period of time. This technology has lead to the modern information society that connects us and tools, a large market, and many types of products and applications. The solid-state circuit technology continuously evolves via breakthroughs and improvements every year. This book is devoted to review and present novel approaches for some of the main issues involved in this exciting and vigorous technology. The book is composed of 22 chapters, written by authors coming from 30 different institutions located in 12 different countries throughout the Americas, Asia and Europe. Thus, reflecting the wide international contribution to the book. The broad range of subjects presented in the book offers a general overview of the main issues in modern solid-state circuit technology. Furthermore, the book offers an in depth analysis on specific subjects for specialists. We believe the book is of great scientific and educational value for many readers. I am profoundly indebted to the support provided by all of those involved in the work. First and foremost I would like to acknowledge and thank the authors who worked hard and generously agreed to share their results and knowledge. Second I would like to express my gratitude to the Intech team that invited me to edit the book and give me their full support and a fruitful experience while working together to combine this book.
