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Book NBS Technical Note

Download or read book NBS Technical Note written by and published by . This book was released on 1972 with total page 130 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Metallography

Download or read book Metallography written by Abrams H. and published by ASTM International. This book was released on 1986 with total page 244 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Nuclear Science Abstracts

Download or read book Nuclear Science Abstracts written by and published by . This book was released on 1974 with total page 764 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Metallography     A Practical Tool for Correlating the Structure and Properties of Materials

Download or read book Metallography A Practical Tool for Correlating the Structure and Properties of Materials written by and published by ASTM International. This book was released on 1974 with total page 242 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Electron Beam Microanalysis

Download or read book Electron Beam Microanalysis written by and published by ASTM International. This book was released on with total page 86 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Fifty Years of Progress in Metallographic Techniques

Download or read book Fifty Years of Progress in Metallographic Techniques written by American Society for Testing and Materials Annual Meeting and published by ASTM International. This book was released on 1968 with total page 414 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Characterization of Solid Surfaces

Download or read book Characterization of Solid Surfaces written by Philip F. Kane and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 675 pages. Available in PDF, EPUB and Kindle. Book excerpt: Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, "Materials Character ization," to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.

Book Vth International Congress on X Ray Optics and Microanalysis   V  Internationaler Kongre   f  r R  ntgenoptik und Mikroanalyse   Ve Congr  s International sur l   Optique des Rayons X et la Microanalyse

Download or read book Vth International Congress on X Ray Optics and Microanalysis V Internationaler Kongre f r R ntgenoptik und Mikroanalyse Ve Congr s International sur l Optique des Rayons X et la Microanalyse written by Gottfried Möllenstedt and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 624 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.

Book Applications of Modern Metallographic Techniques

Download or read book Applications of Modern Metallographic Techniques written by American Society for Metals and published by ASTM International. This book was released on 1970 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Advances in X Ray Analysis

    Book Details:
  • Author : Charles Barrett
  • Publisher : Springer Science & Business Media
  • Release : 2013-06-29
  • ISBN : 1461399661
  • Pages : 582 pages

Download or read book Advances in X Ray Analysis written by Charles Barrett and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 582 pages. Available in PDF, EPUB and Kindle. Book excerpt: The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference.

Book Quantitative X Ray Spectrometry

Download or read book Quantitative X Ray Spectrometry written by Ron Jenkins and published by CRC Press. This book was released on 1995-04-26 with total page 502 pages. Available in PDF, EPUB and Kindle. Book excerpt: This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals

Book Characterization of Particles

Download or read book Characterization of Particles written by Microbeam Analysis Society and published by . This book was released on 1980 with total page 236 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book NBS Special Publication

Download or read book NBS Special Publication written by and published by . This book was released on 1980 with total page 236 pages. Available in PDF, EPUB and Kindle. Book excerpt: