Download or read book Microcircuit Device Reliability Field Experience Data Book written by David J. Mahar and published by . This book was released on 1985 with total page 688 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability Field Experience Database written by David J. Mahar and published by . This book was released on 1985 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability written by Henry C. Rickers and published by . This book was released on 1977 with total page 273 pages. Available in PDF, EPUB and Kindle. Book excerpt: This compendia of Microcircuit Reliability data is divided into several sections. One section summarizes memory and LSI(Large Scale Integration) test and field data. These analyses include the summarization of screening and environmental test results, life test data, reliability demonstration data, failure summaries and the comparison of observed and MIL-HDBK-217B predicted failure rates. In another section, screening, environmental, life, reliability demonstration tests and field experience data are presented for memory and LSI devices in detail. The detailed data is presented in sections according to device function and further ordered by device technology and complexity.
Download or read book Microcircuit Device Reliability Linear Interface Data written by and published by . This book was released on 1984 with total page 342 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report, a compendium of linear/interface microcircuit reliability data, contains data accumulated on the testing and field experience of these part types. The data is separated into two major sections; one section containing the field activity, testing performed, and subsequent results; the other section contains only verified failure information obtained from failure analysis studies. In each of the two sections, the detailed data is presented along with summaries prepared from the detailed section for each functional group, linear or interface. The summaries of the field data along with residual plots provide a quick insight into a comparison of the observed field failure rates and MIL-HDBK-217 predicted values. Originator-supplied keywords include: Linear integrated circuits; Interface circuits; Reliability; Failure mode; and Failure analysis results.
Download or read book Microcircuit Device Reliability Hybrid Circuit Data written by Timothy E. Turner and published by . This book was released on 1978 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt: This compendium of Hybrid Microcircuit Reliability Data contains both detailed and summarized information. The detailed data have been collected from both military and commercial applications and consist of field experience, reliability demonstration results, screening fallout, life tests, and equipment check-out results. A full description of the construction of each device as well as the manufacturer and all test parameters have been included. The summarized data show the distribution of failure causes for hybrids subjected to various conditions, failure rates of components used within hybrids, the screening fallout distribution and a comparison between field data and MIL-HDBK-217B predictions. (Author).
Download or read book Microcircuit Device Reliability written by Mark R. Klein and published by . This book was released on 1976 with total page 225 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability written by Mark R. Klein and published by . This book was released on 1978 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt: This compendium of microcircuit device reliability is separated into two parts: Digital Failure Rate Summarized Data and Digital Device Data - Detailed Listings. The summaries pertain to warranty experience, plastic encapsulated I.C. lot acceptance information, and generic field, reliability demonstration, equipment checkout and life test data. The detailed listings consist of field, reliability demonstration, and equipment checkout experience as well as life test results arranged by operational type, manufacturer, and part number. MIL-HDBK-217B parameters have been incorporated into the entries to permit comparisons with predicted values. (Author).
Download or read book Microcircuit Device Reliability Memory LSI Data Summer 1979 written by Mark R. Klein and published by . This book was released on 1979 with total page 221 pages. Available in PDF, EPUB and Kindle. Book excerpt: This compendia of Microcircuit Reliability data is divided into two sections. Section one summarizes memory and LSI test and field data. These analyses include the summarization of life test data, reliability demonstration data, and the comparison of observed and MIL-HDBK-217C predicted failure rates. In section two, life, equipment level tests and field experience data are presented for memory and LSI devices in detail. The detailed data are presented in sections according to device function and are further order by device technology and complexity.
Download or read book Microcircuit Device Reliability written by and published by . This book was released on 1984 with total page 436 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability Digital Detailed Data written by Mark R. Klein and published by . This book was released on 1976 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability Digital Generic Data written by Roy C. Walker and published by . This book was released on 1975 with total page 260 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Field data written by David J. Mahar and published by . This book was released on 1985 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability written by Mark R. Klein and published by . This book was released on 1978 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability Hybrid Circuit Data written by Timothy E. Turner and published by . This book was released on 1976 with total page 407 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Hybrid Microcircuit Reliability Data written by Sam Stuart and published by Elsevier. This book was released on 2013-10-22 with total page 217 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent chapters focus on the screening summary for the hybrid devices, as well as the failure classifications involved. A tabulated test data on the device is also shown. This book will provide helpful data for government and industrial use.
Download or read book Microcircuit Device Reliability written by Thomas A. Ballou and published by . This book was released on 1983 with total page 333 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability written by David B. Nicholls and published by . This book was released on 1980 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
