Download or read book Digital failure rate data written by David B. Nicholls and published by . This book was released on 1979 with total page 416 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability written by Mark R. Klein and published by . This book was released on 1978 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt: This compendium of microcircuit device reliability is separated into two parts: Digital Failure Rate Summarized Data and Digital Device Data - Detailed Listings. The summaries pertain to warranty experience, plastic encapsulated I.C. lot acceptance information, and generic field, reliability demonstration, equipment checkout and life test data. The detailed listings consist of field, reliability demonstration, and equipment checkout experience as well as life test results arranged by operational type, manufacturer, and part number. MIL-HDBK-217B parameters have been incorporated into the entries to permit comparisons with predicted values. (Author).

Download or read book Microcircuit Device Reliability written by Mark R. Klein and published by . This book was released on 1978 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability written by and published by . This book was released on 1984 with total page 436 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability written by David B. Nicholls and published by . This book was released on 1979 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability written by Kieron A. Dey and published by . This book was released on 1981 with total page 462 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains data on memory and digital LSI device failure rates. The raw data is presented as well as a series of summaries designed to bring out the salient points. Where possible, graphical aids are used to depict the data. Comparison of predicted with observed failure rates is given, predictions being carried out to MIL-HDBK-217C. This book includes a new section on failure analysis results not included in previous editions. (Author).

Download or read book Microcircuit Device Reliability written by Thomas A. Ballou and published by . This book was released on 1983 with total page 333 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability Digital Evaluation and Generic Failure Analysis Data written by David B. Nicholls and published by . This book was released on 1979 with total page 354 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report of digital evaluation and generic failure analysis data is one of a series of annual microcircuit device reliability data publications compiled by the Reliability Analysis Center. This compendium provides burn-in and environmental/screening data on SSI and MSI digital microcircuits. Each document in the series contains analyzed reliability information in addition to a detailed presentation of field and test results. This information aids in determining device fallout rates and the operational test and field characteristics of devices. Life test results can be reviewed. The relative risks of screening decisions may also be determined. Additionally, information is available to form the foundation for failure mode effects and criticality analyses(FMECA). Through the data presented, these publications are intended to actively complement such publications as MIL-STD-883 and MIL-HDBK-217B. The user is cautioned, however, that the listed data may not be used in lieu of contractually cited references.

Download or read book Microcircuit Device Reliability Linear Interface Data written by RELIABILITY ANALYSIS CENTER GRIFFISS AFB NY. and published by . This book was released on 1979 with total page 274 pages. Available in PDF, EPUB and Kindle. Book excerpt: This microcircuit device reliability compendium provides failure rate data on linear and interface monolithic microcircuits.

Download or read book Microcircuit Device Reliability Trend Analysis written by and published by . This book was released on 1985 with total page 371 pages. Available in PDF, EPUB and Kindle. Book excerpt: MDR-21 is a study of microcircuit field failure data based on various microcircuit types (digital SSI, MSI, LSI, linear, interface, memory and VLSI). The report includes failure rate data based on actual field failure records (data acquired from MDR-21A) calculated with Bayesian statistics. Failure distribution information is also presented in a quantifiable assembly of descriptive failure-related terms. Equipment-level comparisons were made to determine the impact on reliability relative to variations in manufacturers requirements. The text is complete with graphical representations and narratives in support of the study findings. Keywords include: Reliability trends; Bayesian statistics; Failure indicator/Mode distributions; Chi-square; Equipment manufacturer; and Influences.

Download or read book Microcircuit Device Reliability Digital Evaluation and Failure Analysis Data Parts 1 and 2 Summer 1980 written by and published by . This book was released on 1980 with total page 765 pages. Available in PDF, EPUB and Kindle. Book excerpt: This compendium of digital SSI/MSI microcircuit device reliability is separated into two volumes. Part I deals with general summaries and detailed listings which address the various aspects of burn-in and environmental/ screening tests at the component level. Devices are classified according to test types and are arranged by test source, device function, operational type, device manufacturer, and commercial part number. Part II contains summaries of failure analysis data based upon failure indicators, failure modes, failure defects, failure defect causes, and failure activating stresses, as well as a detailed listing of verified failure events as derived from device- and equipment-level testing.

Download or read book Digital Generic Data Summer 1975 written by Roy C. Walker and published by . This book was released on 1975 with total page 259 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Microcircuit Device Reliability compendium provides failure rates on digital monolithic microcircuits. Long-term part-level test and equipment-level operational test and field data collected industry-wide by the Reliability Analysis Center are analyzed and organized by generic device properties. The parameters of MIL-HDBK-217B have been incorporated into the entries to permit comparisons with predicted values. Summarized failure rates are presented on field data, part-level test data, equipment-level checkout data, equipment-level reliability demonstration data, and logic-type. (Author).

Download or read book Digital Evaluation and Failure Analysis Data written by David B. Nicholls and published by . This book was released on 1980 with total page 352 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability Digital Detailed Data written by Mark R. Klein and published by . This book was released on 1976 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability written by Henry C. Rickers and published by . This book was released on 1977 with total page 273 pages. Available in PDF, EPUB and Kindle. Book excerpt: This compendia of Microcircuit Reliability data is divided into several sections. One section summarizes memory and LSI(Large Scale Integration) test and field data. These analyses include the summarization of screening and environmental test results, life test data, reliability demonstration data, failure summaries and the comparison of observed and MIL-HDBK-217B predicted failure rates. In another section, screening, environmental, life, reliability demonstration tests and field experience data are presented for memory and LSI devices in detail. The detailed data is presented in sections according to device function and further ordered by device technology and complexity.

Download or read book Microcircuit Device Reliability written by David B. Nicholls and published by . This book was released on 1980 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electronic Reliability Design Handbook written by and published by . This book was released on 1988 with total page 1098 pages. Available in PDF, EPUB and Kindle. Book excerpt: