Download or read book Measurement of Backscattered Electrons in an Electron Probe Microanalyzer written by Philip G. Burkhalter and published by . This book was released on 1965 with total page 30 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Measurement of Backscattered Electrons in an Electron Probe Microanalyzer written by Philip G. Burkhalter and published by . This book was released on 1965 with total page 22 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Electron Microbeam Analysis written by A. Boekestein and published by . This book was released on 1992 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Scanning Electron Probe Microanalysis written by Kurt F. J. Heinrich and published by . This book was released on 1967 with total page 48 pages. Available in PDF, EPUB and Kindle. Book excerpt: The combination of electron microprobe x-ray emission spectrometry with the scanning techniques first developed for the scanning electron microscope permits using the scanning electron probe as a microscope sensitive to elemental composition. This technique is particularly useful in the many applications in which spatial distribution of one or more elements in a specimen is more important than local composition. Although oscilloscope representation of probe scanning is usually obtained by the simple technique of producing a dot of light for each arriving photon, more sophisticated scanning techniques such as expanded contrast registration and concentration mapping can provide more quantitative information. Signals other than x-rays, such as target current, electron backscatter, or cathodoluminescence may be used for image formation. Electron beam scanning can also be performed in a discontinuous fashion, so that the electron beam irradiates in succession a number of spots arranged in a square or rectangular pattern, and the number of photons registered in each position is retained in the memory of a multichannel analyzer. The application of these diverse scanning techniques is illustrated. (Author).
Download or read book Practical Scanning Electron Microscopy written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 598 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.
Download or read book Scanning Electron Microscopy and X Ray Microanalysis written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 679 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Download or read book Electron Probe Microanalysis written by A. J. Tousimis and published by Elsevier. This book was released on 2013-11-06 with total page 463 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron Probe Microanalysis presents a collection of reviews on various aspects of electron probe microanalysis. This book discusses the model for quantitative electron probe analysis. Organized into 14 chapters, this book begins with an overview of the various kinds of microanalysis followed by a discussion of the advantages that can be derived from using the electron probe method. This text then examines the various applications of backscattered electron and specimen current methods for quantitative analysis. Other chapters consider the fundamental concepts for quantitative electron probe microanalysis utilizing pure elements as standards. This book discusses as well the absolute method of quantitative chemical analysis by emission X-ray spectroscopy. The final chapter deals with the main advantage of the Kossel technique in the study of the thermodynamic and mechanical characteristics of crystals. This book is a valuable resource for scientists and research workers. Non-specialists who need information on this excellent analytical tool will also find this book useful.
Download or read book Scanning Electron Microscopy and X Ray Microanalysis written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 708 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
Download or read book Scanning Electron Microscopy written by and published by . This book was released on 1985 with total page 482 pages. Available in PDF, EPUB and Kindle. Book excerpt: Vols. for 1968-77 include the proceedings of the annual Scanning Electron Microscope Symposium, sponsored by the IIT Research Institute, and other workshops.
Download or read book Electron Probe Microanalysis written by L. S. Birks and published by . This book was released on 1963 with total page 272 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Quantitative Electron Probe Microanalysis written by Kurt F. J. Heinrich and published by . This book was released on 1968 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The Use of the Electron Probe Microanalyzer in Materials Research and Development written by Lawrence Kobren and published by . This book was released on 1968 with total page 36 pages. Available in PDF, EPUB and Kindle. Book excerpt: The electron probe microanalyzer, a versatile tool for the analysis of areas as small as one micron in diameter, has been used at Goddard Space Flight Center in applications ranging from materials research to analysis of failures in mechanical parts. Methods of using the probe and representative results obtained are illustrated by several examples that include bonding of thermoelectric materials, alloy development, and analysis of materials failure.
Download or read book Quantitative Electron Microprobe Analysis written by Roger Theisen and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 173 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Electron Probe Quantitation written by K.F.J. Heinrich and published by Springer Science & Business Media. This book was released on 1991-06-30 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.
Download or read book Electron Microprobe Analysis and Scanning Electron Microscopy in Geology written by S. J. B. Reed and published by Cambridge University Press. This book was released on 2005-08-25 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt: Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
Download or read book Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy written by Kurt F. J. Heinrich and published by . This book was released on 1976 with total page 188 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Advanced Scanning Electron Microscopy and X Ray Microanalysis written by Patrick Echlin and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 463 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.
