Download or read book Logic Synthesis and Optimization written by Tsutomu Sasao and published by Springer Science & Business Media. This book was released on 1993-01-31 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt: Logic Synthesis and Optimization presents up-to-date research information in a pedagogical form. The authors are recognized as the leading experts on the subject. The focus of the book is on logic minimization and includes such topics as two-level minimization, multi-level minimization, application of binary decision diagrams, delay optimization, asynchronous circuits, spectral method for logic design, field programmable gate array (FPGA) design, EXOR logic synthesis and technology mapping. Examples and illustrations are included so that each contribution can be read independently. Logic Synthesis and Optimization is an indispensable reference for academic researchers as well as professional CAD engineers.

Download or read book VLSI Fault Modeling and Testing Techniques written by George W. Zobrist and published by Praeger. This book was released on 1993 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: VLSI systems are becoming very complex and difficult to test. Traditional stuck-at fault problems may be inadequate to model possible manufacturing defects in the integrated ciruit. Hierarchial models are needed that are easy to use at the transistor and functional levels. Stuck-open faults present severe testing problems in CMOS circuits, to overcome testing problems testable designs are utilized. Bridging faults are important due to the shrinking geometry of ICs. BIST PLA schemes have common features-controllability and observability - which are enhanced through additional logic and test points. Certain circuit topologies are more easily testable than others. The amount of reconvergent fan-out is a critical factor in determining realistic measures for determining test generation difficulty. Test implementation is usually left until after the VLSI data path has been synthesized into a structural description. This leads to investigation methodologies for performing design synthesis with test incorporation. These topics and more are discussed.

Download or read book On Line Testing for VLSI written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala and published by Springer Nature. This book was released on 2022-06-01 with total page 99 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

Download or read book Electronic Design Automation written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2009-03-11 with total page 971 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit from this book. - Covers complete spectrum of the EDA flow, from ESL design modeling to logic/test synthesis, verification, physical design, and test - helps EDA newcomers to get "up-and-running" quickly - Includes comprehensive coverage of EDA concepts, principles, data structures, algorithms, and architectures - helps all readers improve their VLSI design competence - Contains latest advancements not yet available in other books, including Test compression, ESL design modeling, large-scale floorplanning, placement, routing, synthesis of clock and power/ground networks - helps readers to design/develop testable chips or products - Includes industry best-practices wherever appropriate in most chapters - helps readers avoid costly mistakes

Download or read book Design systems for VLSI circuits written by Giovanni DeMicheli and published by Springer Science & Business Media. This book was released on 1987-07-31 with total page 668 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of the NATO Advanced Study Institute, L'Aquila, Italy, July 7-18, 1986

Download or read book Logic Minimization Algorithms for VLSI Synthesis written by Robert K. Brayton and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 204 pages. Available in PDF, EPUB and Kindle. Book excerpt: The roots of the project which culminates with the writing of this book can be traced to the work on logic synthesis started in 1979 at the IBM Watson Research Center and at University of California, Berkeley. During the preliminary phases of these projects, the impor tance of logic minimization for the synthesis of area and performance effective circuits clearly emerged. In 1980, Richard Newton stirred our interest by pointing out new heuristic algorithms for two-level logic minimization and the potential for improving upon existing approaches. In the summer of 1981, the authors organized and participated in a seminar on logic manipulation at IBM Research. One of the goals of the seminar was to study the literature on logic minimization and to look at heuristic algorithms from a fundamental and comparative point of view. The fruits of this investigation were surprisingly abundant: it was apparent from an initial implementation of recursive logic minimiza tion (ESPRESSO-I) that, if we merged our new results into a two-level minimization program, an important step forward in automatic logic synthesis could result. ESPRESSO-II was born and an APL implemen tation was created in the summer of 1982. The results of preliminary tests on a fairly large set of industrial examples were good enough to justify the publication of our algorithms. It is hoped that the strength and speed of our minimizer warrant its Italian name, which denotes both express delivery and a specially-brewed black coffee.

Download or read book A Designer s Guide to Built In Self Test written by Charles E. Stroud and published by Springer Science & Business Media. This book was released on 2005-12-27 with total page 338 pages. Available in PDF, EPUB and Kindle. Book excerpt: A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.

Download or read book Logic Synthesis for Asynchronous Controllers and Interfaces written by J. Cortadella and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 279 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the result of a long friendship, of a broad international co operation, and of a bold dream. It is the summary of work carried out by the authors, and several other wonderful people, during more than 15 years, across 3 continents, in the course of countless meetings, workshops and discus sions. It shows that neither language nor distance can be an obstacle to close scientific cooperation, when there is unity of goals and true collaboration. When we started, we had very different approaches to handling the mys terious, almost magical world of asynchronous circuits. Some were more theo retical, some were closer to physical reality, some were driven mostly by design needs. In the end, we all shared the same belief that true Electronic Design Automation research must be solidly grounded in formal models, practically minded to avoid excessive complexity, and tested "in the field" in the form of experimental tools. The results are this book, and the CAD tool petrify. The latter can be downloaded and tried by anybody bold (or desperate) enough to tread into the clockless (but not lawless) domain of small-scale asynchronicity. The URL is http://www.lsi. upc. esr j ordic/petrify. We believe that asynchronous circuits are a wonderful object, that aban dons some of the almost militaristic law and order that governs synchronous circuits, to improve in terms of simplicity, energy efficiency and performance.

Download or read book Practical Digital Logic Design and Testing written by Parag K. Lala and published by . This book was released on 1996 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text presents the essentials of modern logic design. The author conveys key concepts in a clear, informal manner, demonstrating theory through numerous examples to establish a theoretical basis for practical applications. All major topics, including PLD-based digital design, are covered, and detailed coverage of digital logic circuit testing methods critical to successful chip manufacturing, are included. The industry standard PLD programming language ABEL is fully integrated where appropriate. The work also includes coverage of test generation techniques and design methods for testability, a complete discussion of PLD (Programmable Logic Device) based digital design, and coverage of state assignment and minimization explained using computer aided techniques.

Download or read book Proceedings written by and published by . This book was released on 1996 with total page 574 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 531 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.

Download or read book Advanced Simulation and Test Methodologies for VLSI Design written by G. Russell and published by Springer Science & Business Media. This book was released on 1989-02-28 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Understanding Logic Locking written by Kimia Zamiri Azar and published by Springer Nature. This book was released on 2023-10-24 with total page 385 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book demonstrates the breadth and depth of IP protection through logic locking, considering both attacker/adversary and defender/designer perspectives. The authors draw a semi-chronological picture of the evolution of logic locking during the last decade, gathering and describing all the DO’s and DON’Ts in this approach. They describe simple-to-follow scenarios and guide readers to navigate/identify threat models and design/evaluation flow for further studies. Readers will gain a comprehensive understanding of all fundamentals of logic locking.

Download or read book SOC System on a Chip Testing for Plug and Play Test Automation written by Krishnendu Chakrabarty and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt: System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.

Download or read book Advanced Information Processing written by Heinz Schwärtzel and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last few years, computers have evolved from pure number crunching machines to "intelligent" problem solving tools. Increasing effort has been spent on the investigation of new approaches and the application of solutions to real world problems. In this way, exciting new techniques have evolved providing support for an increasing number of technical and economical aspects. Applications range from the design and development of ultra highly integrated circuits to totally new man-machine interfaces, from software engineering tools to fault diagnosis systems, from decision support to even the analysis of unemployment. Following a first joint workshop on Advanced Information Processing held in July 1988 at the Institute for Problems of Informatics of the USSR Academy of Sciences (IPIAN) at Moscow, this was the second time that scientists and researchers from the USSR Academy of Sciences and Siemens AG, Corporate Research and Development, exchanged results and discussed recent advances in the field of applied computer sciences. Initiated by Prof. Dr. I. Mizin, Corresponding Member of the USSR Academy of Sciences and Director of IPIAN, and Prof. Dr. H. Schwartzel, Vice President of the Siemens AG and Head of the Applied Computer Science & Software Department, a joint symposium was arranged at the USSR Academy of Sciences in Moscow on June 5th and 6th 1990. The meetings on Information Processing and Software and Systems Design Automation provided a basis both for presentations of ongoing research and for discussions about specific problems.