Download or read book Jedec Standards No 25 Measurement of Small Signal Transistor Scattering written by Joint Electron Device Engineering Council and published by . This book was released on 1972 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Standard for the Measurement of Small signal Transistor Scattering Parameters written by and published by . This book was released on 1976 with total page 19 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book NBS Technical Note written by and published by . This book was released on 1972-12 with total page 64 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Methods of Measurement for Semiconductor Materials Process Control and Devices written by United States. National Bureau of Standards and published by . This book was released on 1972-04 with total page 64 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Methods of Measurement for Semiconductor Materials Process Control and Devices written by W. Murray Bullis and published by . This book was released on 1972 with total page 64 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Index and Directory of U S Industry Standards written by and published by . This book was released on 1985 with total page 788 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Designing with Field effect Transistors written by Edwin S. Oxner and published by McGraw-Hill Companies. This book was released on 1990 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt: projetos eletronicos utilizando transistor de efeito de campo (fet).

Download or read book Methods of Measurement for Semiconductor Materials Process Control and Devices written by United States. National Bureau of Standards and published by . This book was released on 1969-04 with total page 52 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book RF Circuit Design written by Christopher Bowick and published by Elsevier. This book was released on 2011-04-08 with total page 256 pages. Available in PDF, EPUB and Kindle. Book excerpt: It's Back! New chapters, examples, and insights; all infused with the timeless concepts and theories that have helped RF engineers for the past 25 years!RF circuit design is now more important than ever as we find ourselves in an increasingly wireless world. Radio is the backbone of today's wireless industry with protocols such as Bluetooth, Wi-Fi, WiMax, and ZigBee. Most, if not all, mobile devices have an RF component and this book tells the reader how to design and integrate that component in a very practical fashion. This book has been updated to include today's integrated circuit (IC) and system-level design issues as well as keeping its classic "wire lead" material. Design Concepts and Tools Include•The Basics: Wires, Resistors, Capacitors, Inductors•Resonant Circuits: Resonance, Insertion Loss •Filter Design: High-pass, Bandpass, Band-rejection•Impedance Matching: The L Network, Smith Charts, Software Design Tools•Transistors: Materials, Y Parameters, S Parameters•Small Signal RF Amplifier: Transistor Biasing, Y Parameters, S Parameters•RF Power Amplifiers: Automatic Shutdown Circuitry , Broadband Transformers, Practical Winding Hints•RF Front-End: Architectures, Software-Defined Radios, ADC's Effects•RF Design Tools: Languages, Flow, ModelingCheck out this book's companion Web site at: http://www.elsevierdirect.com/companion.jsp?ISBN=9780750685184 for full-color Smith Charts and extra content! - Completely updated but still contains its classic timeless information - Two NEW chapters on RF Front-End Design and RF Design Tools - Not overly math intensive, perfect for the working RF and digital professional that need to build analog-RF-Wireless circuits

Download or read book Power GaN Devices written by Matteo Meneghini and published by Springer. This book was released on 2016-09-08 with total page 383 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the first comprehensive overview of the properties and fabrication methods of GaN-based power transistors, with contributions from the most active research groups in the field. It describes how gallium nitride has emerged as an excellent material for the fabrication of power transistors; thanks to the high energy gap, high breakdown field, and saturation velocity of GaN, these devices can reach breakdown voltages beyond the kV range, and very high switching frequencies, thus being suitable for application in power conversion systems. Based on GaN, switching-mode power converters with efficiency in excess of 99 % have been already demonstrated, thus clearing the way for massive adoption of GaN transistors in the power conversion market. This is expected to have important advantages at both the environmental and economic level, since power conversion losses account for 10 % of global electricity consumption. The first part of the book describes the properties and advantages of gallium nitride compared to conventional semiconductor materials. The second part of the book describes the techniques used for device fabrication, and the methods for GaN-on-Silicon mass production. Specific attention is paid to the three most advanced device structures: lateral transistors, vertical power devices, and nanowire-based HEMTs. Other relevant topics covered by the book are the strategies for normally-off operation, and the problems related to device reliability. The last chapter reviews the switching characteristics of GaN HEMTs based on a systems level approach. This book is a unique reference for people working in the materials, device and power electronics fields; it provides interdisciplinary information on material growth, device fabrication, reliability issues and circuit-level switching investigation.

Download or read book The Photomultiplier Handbook written by A. G. Wright and published by Oxford University Press. This book was released on 2017 with total page 639 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Photomultipliers are extremely sensitive light detectors with the capability to detect single photons. In multiplying the charge produced by incident light by up to 100 million times, these devices are essential to a wide range of applications, from medical instrumentation to astronomical observations. This complete and authoritative guide will provide...a deeper understanding of the operating principles of these devices." -- Publisher's description, back cover.

Download or read book ESD in Silicon Integrated Circuits written by E. Ajith Amerasekera and published by John Wiley & Sons. This book was released on 2002-05-22 with total page 434 pages. Available in PDF, EPUB and Kindle. Book excerpt: * Examines the various methods available for circuit protection, including coverage of the newly developed ESD circuit protection schemes for VLSI circuits. * Provides guidance on the implementation of circuit protection measures. * Includes new sections on ESD design rules, layout approaches, package effects, and circuit concepts. * Reviews the new Charged Device Model (CDM) test method and evaluates design requirements necessary for circuit protection.

Download or read book Semiconductor Packaging written by Andrea Chen and published by CRC Press. This book was released on 2016-04-19 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: In semiconductor manufacturing, understanding how various materials behave and interact is critical to making a reliable and robust semiconductor package. Semiconductor Packaging: Materials Interaction and Reliability provides a fundamental understanding of the underlying physical properties of the materials used in a semiconductor package. By tying together the disparate elements essential to a semiconductor package, the authors show how all the parts fit and work together to provide durable protection for the integrated circuit chip within as well as a means for the chip to communicate with the outside world. The text also covers packaging materials for MEMS, solar technology, and LEDs and explores future trends in semiconductor packages.

Download or read book Semiconductor Laser Engineering Reliability and Diagnostics written by Peter W. Epperlein and published by John Wiley & Sons. This book was released on 2013-01-25 with total page 522 pages. Available in PDF, EPUB and Kindle. Book excerpt: This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.

Download or read book National Semiconductor Metrology Program written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1990 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Troubleshooting Analog Circuits written by Robert Pease and published by Newnes. This book was released on 1991-06-19 with total page 236 pages. Available in PDF, EPUB and Kindle. Book excerpt: Whether you are primarily an analog or digital engineer / technician, experienced or neophyte, this book has something for you. You'll find Bob's approach to problem identification and isolation to be applicable to a wide spectrum of engineering disciplines.

Download or read book Transistor Level Modeling for Analog RF IC Design written by Wladyslaw Grabinski and published by Springer Science & Business Media. This book was released on 2006-07-01 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt: The editors and authors present a wealth of knowledge regarding the most relevant aspects in the field of MOS transistor modeling. The variety of subjects and the high quality of content of this volume make it a reference document for researchers and users of MOSFET devices and models. The book can be recommended to everyone who is involved in compact model developments, numerical TCAD modeling, parameter extraction, space-level simulation or model standardization. The book will appeal equally to PhD students who want to understand the ins and outs of MOSFETs as well as to modeling designers working in the analog and high-frequency areas.