Download or read book Interferometric Metrology written by N. A. Massie and published by . This book was released on 1988 with total page 254 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Field Guide to Displacement Measuring Interferometry written by Jonathan D. Ellis and published by SPIE-International Society for Optical Engineering. This book was released on 2014 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides a practical treatment of the fundamental theory of displacement measuring interferometry, with examples of interferometry systems and uses. It outlines alignment techniques for optical components, signal processing systems for phase measurements, and laser stabilisation for homodyne and heterodyne sources.
Download or read book Optical Metrology with Interferometry written by Dahi Ghareab Abdelsalam Ibrahim and published by Cambridge Scholars Publishing. This book was released on 2019-07-31 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt: The accurate measurements of surface topography are becoming important to many applications in both engineering and science. Optical interferometry is considered a preferable technique for featuring accurate 3D surface profiling since it is non-contacting, non-destructive and highly accurate. In combination with computers and other electronic devices, optical interferometry has become faster, more reliable, more convenient and more robust. There is now a wealth of new optical interferometry techniques on the market, or being developed in academia, that can measure surface topography with high precision. Each method has both its strong points and its limitations. This book explains in detail the basics of optical interferometry, their common language, generic features and limitations, and their simulation and uncertainties. Moreover, it provides an introduction to new frontiers in optical interferometry, including terahertz technology and optical frequency combs.
Download or read book Optical Interferometry written by Alexandr Banishev and published by BoD – Books on Demand. This book was released on 2017-02-15 with total page 262 pages. Available in PDF, EPUB and Kindle. Book excerpt: Optical methods of measurements are the most sensitive techniques of noncontact investigations, and at the same time, they are fast as well as accurate which increases reproducibility of observed results. In recent years, the importance of optical interferometry methods for research has dramatically increased, and applications range from precise surface testing to finding extrasolar planets. This book covers various aspects of optical interferometry including descriptions of novel apparatuses and methods, application interferometry for studying biological objects, surface qualities, materials characterization, and optical testing. The book includes a series of chapters in which experts share recent progress in interferometry through original research and literature reviews.
Download or read book Fringe Pattern Analysis for Optical Metrology written by Manuel Servin and published by John Wiley & Sons. This book was released on 2014-08-18 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt: The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.
Download or read book Interferometry for Precision Measurement written by Peter Langenbeck and published by SPIE-International Society for Optical Engineering. This book was released on 2014 with total page 243 pages. Available in PDF, EPUB and Kindle. Book excerpt: Interferometry can be seen as the stethoscope of the precision optical engineer. This book presents various interferometric developments used in physical, optical, and mechanical engineering during the past half century. It is an expanded translation of one chapter of the German Wirtschaftliche Mikrobearbeitung, also by Langenbeck, published by Carl Hanser Verlag, Munich-Vienna, in 2009. The book is illustrated with many practical examples and photographs that are a direct consequence of the author’s vast experience in the subject. The author provides some little-known testing techniques that could lead to future innovation in interferometric testing, along with occasional ""Notes for the practitioner,"" which give the reader tips for successful implementation of the author’s repertoire of techniques. The text will be of value to anyone interested in learning about interferometric evaluation of small mechanical and optical components.
Download or read book Handbook of Optical Dimensional Metrology written by Kevin Harding and published by Taylor & Francis. This book was released on 2016-04-19 with total page 497 pages. Available in PDF, EPUB and Kindle. Book excerpt: Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods
Download or read book Optical Methods in Engineering Metrology written by D.C. Williams and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 490 pages. Available in PDF, EPUB and Kindle. Book excerpt: Optical methods, stimulated by the advent of inexpensive and reliable lasers, are assuming an increasingly important role in the field of engineering metrology. Requiring only a basic knowledge of optics, this text provides a compendium of practical information prepared by leaders in the field.
Download or read book Selected Papers on Interference Interferometry and Interferometric Metrology written by P. Hariharan and published by SPIE-International Society for Optical Engineering. This book was released on 1995 with total page 730 pages. Available in PDF, EPUB and Kindle. Book excerpt: SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.
Download or read book A Practical Guide to Surface Metrology written by Michael Quinten and published by Springer Nature. This book was released on 2020-01-01 with total page 247 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation of results. It enables the user to select the best approach in a given context. Most methods in surface metrology are based upon the interaction of light or electromagnetic radiation (UV, NIR, IR), and different optical effects are utilized to get a certain optical response from the surface; some of them record only the intensity reflected or scattered by the surface, others use interference of EM waves to obtain a characteristic response from the surface. The book covers techniques ranging from microscopy (including confocal, SNOM and digital holographic microscopy) through interferometry (including white light, multi-wavelength, grazing incidence and shearing) to spectral reflectometry and ellipsometry. The non-optical methods comprise tactile methods (stylus tip, AFM) as well as capacitive and inductive methods (capacitive sensors, eddy current sensors). The book provides: Overview of the working principles Description of advantages and disadvantages Currently achievable numbers for resolutions, repeatability, and reproducibility Examples of real-world applications A final chapter discusses examples where the combination of different surface metrology techniques in a multi-sensor system can reasonably contribute to a better understanding of surface properties as well as a faster characterization of surfaces in industrial applications. The book is aimed at scientists and engineers who use such methods for the measurement and characterization of surfaces across a wide range of fields and industries, including electronics, energy, automotive and medical engineering.
Download or read book Optical Measurement of Surface Topography written by Richard Leach and published by Springer Science & Business Media. This book was released on 2011-03-31 with total page 333 pages. Available in PDF, EPUB and Kindle. Book excerpt: The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
Download or read book Industrial Metrology written by Graham T. Smith and published by Springer Science & Business Media. This book was released on 2002-06-13 with total page 360 pages. Available in PDF, EPUB and Kindle. Book excerpt: The subject of this book is surface metrology, in particular two major aspects: surface texture and roundness. It has taken a long time for manufacturing engineers and designers to realise the usefulness of these features in quality of conformance and quality of design. Unfortunately this awareness has come at a time when engineers versed in the use and specification of surfaces are at a premium. Traditionally surface metrology usage has been dictated by engineers who have served long and demanding apprenticeships, usually in parallel with studies leading to technician-level qualifications. Such people understood the processes and the achievable accuracies of machine tools, thereby enabling them to match production capability with design requirements. This synergy, has been made possible by the understanding of adherence to careful metrological procedures and a detailed knowledge of surface measuring instruments and their operation, in addition to wider inspection room techniques. With the demise in the UK of polytechnics and technical colleges, this source of skilled technicians has all but dried up. The shortfall has been made up of semi skilled craftsmen, or inexperienced graduates who cannot be expected to satisfy tradition al or new technology needs. Miniaturisation, for example, has had a pro found effect. Engineering parts are now routinely being made with nanometre surface texture and fiatness. At these molecular and atomic scales, the engineer has to be a physicist.
Download or read book Optical Imaging and Metrology written by Wolfgang Osten and published by John Wiley & Sons. This book was released on 2012-09-10 with total page 471 pages. Available in PDF, EPUB and Kindle. Book excerpt: A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.
Download or read book Handbook of Holographic Interferometry written by Thomas Kreis and published by John Wiley & Sons. This book was released on 2006-04-20 with total page 554 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book presents the principles and methods of holographic interferometry - a coherent-optical measurement technique for deformation and stress analysis, for the determination of refractive-index distributions, or applied to non-destructive testing. Emphasis of the book is on the quantitative computer-aided evaluation of the holographic interferograms. Based upon wave-optics the evaluation methods, their implementation in computer-algorithms, and their applications in engineering are described.
Download or read book Quantum Metrology with Photoelectrons written by Paul Hockett and published by Morgan & Claypool Publishers. This book was released on 2018-04-20 with total page 204 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications. The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.
Download or read book EUV Lithography written by Vivek Bakshi and published by SPIE Press. This book was released on 2009 with total page 704 pages. Available in PDF, EPUB and Kindle. Book excerpt: Editorial Review Dr. Bakshi has compiled a thorough, clear reference text covering the important fields of EUV lithography for high-volume manufacturing. This book has resulted from his many years of experience in EUVL development and from teaching this subject to future specialists. The book proceeds from an historical perspective of EUV lithography, through source technology, optics, projection system design, mask, resist, and patterning performance, to cost of ownership. Each section contains worked examples, a comprehensive review of challenges, and relevant citations for those who wish to further investigate the subject matter. Dr. Bakshi succeeds in presenting sometimes unfamiliar material in a very clear manner. This book is also valuable as a teaching tool. It has become an instant classic and far surpasses others in the EUVL field. --Dr. Akira Endo, Chief Development Manager, Gigaphoton Inc. Description Extreme ultraviolet lithography (EUVL) is the principal lithography technology aiming to manufacture computer chips beyond the current 193-nm-based optical lithography, and recent progress has been made on several fronts: EUV light sources, optics, optics metrology, contamination control, masks and mask handling, and resists. This comprehensive volume is comprised of contributions from the world's leading EUVL researchers and provides all of the critical information needed by practitioners and those wanting an introduction to the field. Interest in EUVL technology continues to increase, and this volume provides the foundation required for understanding and applying this exciting technology. About the editor of EUV Lithography Dr. Vivek Bakshi previously served as a senior member of the technical staff at SEMATECH; he is now president of EUV Litho, Inc., in Austin, Texas.
Download or read book NBS Special Publication written by and published by . This book was released on 1918 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt:
