Download or read book Instabilities in Silicon Devices written by Gérard Barbottin and published by North Holland. This book was released on 1986 with total page 864 pages. Available in PDF, EPUB and Kindle. Book excerpt: An instructive and up-to-date manual for: bull; Engineers and technicians working in the semiconductor industry in such fields as: circuit design, manufacturing engineering, material and process characterization, quality and reliability assurance, failure analysis. bull; Graduate students and research scientists in material science and electrical engineering, interested in insulator physics, semiconductor physics, device physics and electronics. Today, silicon technology forms the basis of a worldwide, multi-million dollar component industry. The reasons for this expansioncan be found not only in the physical properties of silicon but also in the unique properties of the silicon-silicon dioxide interface. In spite of steady improvements in fabrication processes, silicon devices are still subject to undesired electrical phenomena referred to as 'instabilities'. These are due mostly to the imperfect nature either of the insulators used and/or of the semiconductor-insulator interface. The problem of instabilities is addressed in this volume which is the result of a fruitful cooperation between engineers working in the silicon industry, research scientists in the filed of micro-electronics, and university professors. The volume will aid circuit manufacturers and circuit users alike to relate unstable electrical parameters and characteristics to the physical defects and impurities which caused them. It may also be used as a textbook, provided the reader is familiar with the basics of materials physics and electronics.

Download or read book Instabilities in silicon devices written by André Vapaille and published by . This book was released on 1999 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Instabilities in Silicon Devices written by Gérard Barbottin and published by . This book was released on 1989 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Instabilities in Silicon Devices written by and published by . This book was released on with total page 517 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Corps l gislatif Commission des inspecteurs du palais des cinq cents Extrait du proc s verbal du 7 fructidor l an 6 de la R publique written by and published by . This book was released on 1797 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Instabilities in Silicon Devices written by Gérard Barbottin and published by . This book was released on 1999 with total page 933 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Instabilities in Silicon Devices written by Gérard Barbottin and published by North Holland. This book was released on 1986 with total page 556 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book New Insulators Devices and Radiation Effects written by and published by Elsevier. This book was released on 1999-02-11 with total page 967 pages. Available in PDF, EPUB and Kindle. Book excerpt: Silicon technology today forms the basis of a world-wide, multi-billion dollar component industry. The reason for this expansion can be found not only in the physical properties of silicon but also in the unique properties of the silicon-silicon dioxide interface. However, silicon devices are still subject to undesired electrical phenomena called "instabilities". These are due mostly to the imperfect nature of the insulators used, to the not-so-perfect silicon-insulator interface and to the generation of defects and ionization phenomena caused by radiation. The problem of instabilities is addressed in this volume, the third of this book series. Vol.3 updates and supplements the material presented in the previous two volumes, and devotes five chapters to the problems of radiation-matter and radiation-device interactions. The volume will aid circuit manufacturers and circuit users alike to relate unstable electrical parameters and characteristics to the presence of physical defects and impurities or to the radiation environment which caused them.

Download or read book Proceedings of the Fifth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing written by Jerzy Rużyłło and published by The Electrochemical Society. This book was released on 1998 with total page 668 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Physics of Instabilities in Solid State Electron Devices written by Harold L. Grubin and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 474 pages. Available in PDF, EPUB and Kindle. Book excerpt: The past three decades have been a period where useful current and voltage instabilities in solids have progressed from exciting research problems to a wide variety of commercially available devices. Materials and electronics research has led to devices such as the tunnel (Esaki) diode, transferred electron (Gunn) diode, avalanche diodes, real-space transfer devices, and the like. These structures have proven to be very important in the generation, amplification, switching, and processing of microwave signals up to frequencies exceeding 100 GHz. In this treatise we focus on a detailed theoretical understanding of devices of the kind that can be made unstable against circuit oscillations, large amplitude switching events, and in some cases, internal rearrangement of the electric field or current density distribution. The book is aimed at the semiconductor device physicist, engineer, and graduate student. A knowledge of solid state physics on an elementary or introductory level is assumed. Furthermore, we have geared the book to device engineers and physicists desirous of obtaining an understanding substantially deeper than that associated with a small signal equivalent circuit approach. We focus on both analytical and numerical treatment of specific device problems, concerning ourselves with the mechanism that determines the constitutive relation governing the device, the boundary conditions (contact effects), and the effect of the local circuit environment.

Download or read book Bias Temperature Instability for Devices and Circuits written by Tibor Grasser and published by Springer Science & Business Media. This book was released on 2013-10-22 with total page 805 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

Download or read book Instabilities in MOS Devices written by John Richard Davis and published by CRC Press. This book was released on 1981 with total page 198 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Defects in Microelectronic Materials and Devices written by Daniel M. Fleetwood and published by CRC Press. This book was released on 2008-11-19 with total page 772 pages. Available in PDF, EPUB and Kindle. Book excerpt: Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes required to produce them.A comprehensive survey of defe

Download or read book Silicon Device Processing written by Charles P. Marsden and published by . This book was released on 1970 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: The objective of the Symposium was to provide an opportunity for engineers and applied scientists actively engaged in the silicon device technology field to discuss the most advanced measurement methods for process control and materials characterization.The basic theme of the meeting was to stress the interdependence of measurements techniques, facilities, and materials as they relate to the overall problems of improving and advancing silicon device sciences and technologies.(Author).

Download or read book Physical Limitations of Semiconductor Devices written by Vladislav A. Vashchenko and published by Springer Science & Business Media. This book was released on 2008-03-22 with total page 337 pages. Available in PDF, EPUB and Kindle. Book excerpt: Providing an important link between the theoretical knowledge in the field of non-linier physics and practical application problems in microelectronics, the purpose of the book is popularization of the physical approach for reliability assurance. Another unique aspect of the book is the coverage given to the role of local structural defects, their mathematical description, and their impact on the reliability of the semiconductor devices.

Download or read book Silicon Materials Science and Technology written by Howard R. Huff and published by The Electrochemical Society. This book was released on 1998 with total page 894 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Silicon Materials Science and Technology written by and published by The Electrochemical Society. This book was released on 1998 with total page 894 pages. Available in PDF, EPUB and Kindle. Book excerpt: