Download or read book In Situ Nanoindentation in a Transmission Electron Microscope written by Andrew Murphy Minor and published by . This book was released on 2002 with total page 246 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book In Situ Nanoindentation in a Transmission Electron Microscope written by and published by . This book was released on 2002 with total page 5 pages. Available in PDF, EPUB and Kindle. Book excerpt: This dissertation presents the development of the novel mechanical testing technique of in situ nanoindentation in a transmission electron microscope (TEM). This technique makes it possible to simultaneously observe and quantify the mechanical behavior of nano-scale volumes of solids.
Download or read book In situ Nanoindentation in a Transmission Electron Microscope written by and published by . This book was released on 2009 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book In situ Electron Microscopy at High Resolution written by Florian Banhart and published by World Scientific. This book was released on 2008 with total page 318 pages. Available in PDF, EPUB and Kindle. Book excerpt: In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.
Download or read book In situ Nanoindentation Specimen Holder for a High voltage Transmission Electron Microscope written by and published by . This book was released on 1998 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: This report describes the design, construction, and testing of a nanoindentation specimen holder used for dynamic observation of subsurface microstructure evolution under an indenter tip, while viewing in cross-section in a high-voltage transmission electron microscope (TEM). It also discusses the initial experimental results from in-situ indentation of Si samples in the TEM to demonstrate the capability of this new nanoindentation specimen holder, which uses three-axis position control of a diamond indenter in combination with micromachined specimens. Additionally, the sample design techniques developed for these procedures may eliminate the need for TEM specimen preparation in future ex-situ nanoindentation experiments and for sample preparation for characterizing these experiments in the electron microscope.
Download or read book In Situ Transmission Electron Microscopy written by Litao Sun and published by Springer Nature. This book was released on 2023-03-11 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on in-situ transmission electron microscopy (TEM), an investigatory technique used to observe a sample’s response to a given stimulus (including electron irradiation, thermal excitation, mechanical force, optical excitation, electric and magnetic fields) at the nanoscale in real time. The book introduces readers to the technical strategy behind the in-situ technique and its developments. It reviews the research frontiers of using in-situ TEM in energy conversion and storage, catalysis, nanomaterials synthesis, nanoelectronics, etc. Furthermore, it discusses the future prospects for in-situ TEM. The book offers a valuable guide for all undergraduate and graduate students who are interested in TEM characterization technology. It also serves as a reference source on cutting-edge in-situ techniques for researchers and engineers.
Download or read book In situ Electron Microscopy written by Gerhard Dehm and published by John Wiley & Sons. This book was released on 2012-05-30 with total page 403 pages. Available in PDF, EPUB and Kindle. Book excerpt: Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.
Download or read book In situ Electron Microscopy written by Gerhard Dehm and published by John Wiley & Sons. This book was released on 2012-05-29 with total page 403 pages. Available in PDF, EPUB and Kindle. Book excerpt: Von den Grundlagen über das Experiment bis zur Anwendung zeigt dieses Buch, wie sich Ionenstrahlanlagen, Rasterelektronenmikroskope und Transmissionselektronenmikroskope zur Beobachtung von Phänomenen bis hinunter zum Nanomaßstab in Echtzeit einsetzen lassen. Nach einem theoretischen Überblick werden experimentelle Verfahren zur Untersuchung von Aufwachsprozessen, Schmelzen, chemischen Reaktionen und Dotierung besprochen; außerdem geht es um die Messung mechanischer, magnetischer, optischer und elektronischer Kenndaten. Der letzte Abschnitt widmet sich Fragen der Soft-Matter-Charakterisierung.
Download or read book In Situ Transmission Electron Microscopy Experiments written by Renu Sharma and published by John Wiley & Sons. This book was released on 2023-05-10 with total page 389 pages. Available in PDF, EPUB and Kindle. Book excerpt: In-Situ Transmission Electron Microscopy Experiments Design and execute cutting-edge experiments with transmission electron microscopy using this essential guide In-situ microscopy is a recently-discovered and rapidly-developing approach to transmission electron microscopy (TEM) that allows for the study of atomic and/or molecular changes and processes while they are in progress. Experimental specimens are subjected to stimuli that replicate near real-world conditions and their effects are observed at a previously unprecedented scale. Though in-situ microscopy is becoming an increasingly important approach to TEM, there are no current texts combining an up-to-date overview of this cutting-edge set of techniques with the experience of in-situ TEM professionals. In-Situ Transmission Electron Microscopy Experiments meets this need with a work that synthesizes the collective experience of myriad collaborators. It constitutes a comprehensive guide for planning and performing in-situ TEM measurements, incorporating both fundamental principles and novel techniques. Its combination of technical detail and practical how-to advice makes it an indispensable introduction to this area of research. In-Situ Transmission Electron Microscopy Experiments readers will also find: Coverage of the entire experimental process, from method selection to experiment design to measurement and data analysis Detailed treatment of multimodal and correlative microscopy, data processing and machine learning, and more Discussion of future challenges and opportunities facing this field of research In-Situ Transmission Electron Microscopy Experiments is essential for graduate students, post-doctoral fellows, and early career researchers entering the field of in-situ TEM.
Download or read book In situ Electron Microscopy At High Resolution written by Florian Banhart and published by World Scientific. This book was released on 2008-07-29 with total page 318 pages. Available in PDF, EPUB and Kindle. Book excerpt: In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.
Download or read book Development of a Nanoindenter for In situ Transmission Electron Microscopy written by and published by . This book was released on 2001 with total page 5 pages. Available in PDF, EPUB and Kindle. Book excerpt: In-situ transmission electron microscopy is an established experimental technique that permits direct observation of the dynamics and mechanisms of dislocation motion and deformation behavior. In this paper, we detail the development of a novel specimen goniometer that allows real time observations of the mechanical response of materials to indentation loads. The technology of the scanning tunneling microscope is adopted to allow nanometer scale positioning of a sharp, conductive diamond tip onto the edge of an electron transparent sample. This allows application of loads to nanometer-scale material volumes couple with simultaneous imaging of the material response. The emphasis in this paper is experimental and descriptive, with particular attention given to sample geometry and other technical requirements. Examples of the deformation of aluminum and titanium carbide as well as the fracture of silicon will be presented.
Download or read book Radiation Effects on Mechanical Properties of Thin 3c sic Investigated by in Situ Nanoindentation Via Transmission Electron Microscopy written by Xuying Liu (Ph.D.) and published by . This book was released on 2020 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: In situ nanoindentation tests on thin 3C-SiC in a transmission electron microscope show small but non-negligible plastic deformation at room temperature. SiC is brittle in macroscopic studies but it can be become ductile when deformation occurs in small volumes. Here, we report such a brittle to ductile transition of 3C-SiC during nanoindentation of thin films (150-270 nm thick), and we reveal mechanisms of plastic deformation in situ. We find that plasticity in 3C-SiC is driven by dislocations, and that there is a pronounced plastic strain recovery at these length scales. We suggest that plastic deformation recovery arises from annihilation of transient dislocation extension driven by retracted external stress. In addition, we demonstrate that when the sample thickness is less than 90 nm, 3C-SiC becomes brittle again, and therefore the thickness of the films is important in determining whether the sample is brittle or ductile. In situ TEM nanoindentation tests on thin 3C-SiC irradiated at different radiation conditions indicate different mechanical behavior that is related to different microstructures. Samples irradiated at 600 [degrees]C 0.3 dpa and 600 2̐ʻC 3 dpa are easier to fracture under applied force than as-synthesized 3C-SiC. Long, straight, and simple crack paths are characteristic features for 600 [degrees]C 3 dpa samples, which is an evidence of easier fracture than 600 [degrees]C 0.3 dpa. However, 900 [degrees]C 3 dpa samples do not exhibit noticeable brittleness. Instead, they exhibit plastic deformation under applied force, which is the same as as-synthesized samples. Based on the microstructure of the irradiated samples, increasing the density of black spot defects that form at 600 [degrees]C degrades resistance to cracking, but the change of defect type to dislocation loops at 900 [degrees]C restores the plastic behavior. The results from this study are not consistent with macroscale analysis of fracture and cracking in irradiated SiC, which suggest different behavior and the microscale in irradiated as well as unirradiated SiC. These results therefore provide useful insights into the microscale properties of 3C-SiC which are important to multiscale simulation of 3C-SiC to predict mechanical performance of microelectromechanical systems, coatings, and next-generation fission reactor fuels.
Download or read book Radiation Effects on Mechanical Properties of Thin 3c sic Investigated by in Situ Nanoindentation Via Transmission Electron Microscopy written by Xuying Liu (Ph.D.) and published by . This book was released on 2020 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: In situ nanoindentation tests on thin 3C-SiC in a transmission electron microscope show small but non-negligible plastic deformation at room temperature. SiC is brittle in macroscopic studies but it can be become ductile when deformation occurs in small volumes. Here, we report such a brittle to ductile transition of 3C-SiC during nanoindentation of thin films (150-270 nm thick), and we reveal mechanisms of plastic deformation in situ. We find that plasticity in 3C-SiC is driven by dislocations, and that there is a pronounced plastic strain recovery at these length scales. We suggest that plastic deformation recovery arises from annihilation of transient dislocation extension driven by retracted external stress. In addition, we demonstrate that when the sample thickness is less than 90 nm, 3C-SiC becomes brittle again, and therefore the thickness of the films is important in determining whether the sample is brittle or ductile. In situ TEM nanoindentation tests on thin 3C-SiC irradiated at different radiation conditions indicate different mechanical behavior that is related to different microstructures. Samples irradiated at 600 [degrees]C 0.3 dpa and 600 2̐ʻC 3 dpa are easier to fracture under applied force than as-synthesized 3C-SiC. Long, straight, and simple crack paths are characteristic features for 600 [degrees]C 3 dpa samples, which is an evidence of easier fracture than 600 [degrees]C 0.3 dpa. However, 900 [degrees]C 3 dpa samples do not exhibit noticeable brittleness. Instead, they exhibit plastic deformation under applied force, which is the same as as-synthesized samples. Based on the microstructure of the irradiated samples, increasing the density of black spot defects that form at 600 [degrees]C degrades resistance to cracking, but the change of defect type to dislocation loops at 900 [degrees]C restores the plastic behavior. The results from this study are not consistent with macroscale analysis of fracture and cracking in irradiated SiC, which suggest different behavior and the microscale in irradiated as well as unirradiated SiC. These results therefore provide useful insights into the microscale properties of 3C-SiC which are important to multiscale simulation of 3C-SiC to predict mechanical performance of microelectromechanical systems, coatings, and next-generation fission reactor fuels.
Download or read book Development of Quantitative in Situ Transmission Electron Microscopy for Nanoindentation and Cold field Emission written by Ludvig de Knoop and published by . This book was released on 2016 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This thesis has focused on the development of quantitative in situ transmission electron microscopy (TEM) techniques. We have used a special nano-probe sample holder, which allows local electrical biasing and micro-mechanical testing. The finite element method (FEM) was used to compare models with the experimental results. In addition to conventional imaging techniques, electron holography has been used to measure electric fields and strains. The first part addresses cold-field emission from a carbon cone nanotip (CCnT). This novel type of carbon structure may present an alternative to W-based cold-field emission sources, which are used in the most advanced electron guns today. When a sufficiently strong electric field is applied to the CCnT, electrons can tunnel through the energy barrier with the vacuum, which corresponds to the phenomenon of cold-field emission. Using electron holography and FEM, a quantified value of the local electric field at the onset of field emission was found (2.5 V/nm). Combining this with one of the Fowler-Nordheim equations, the exit work function of the CCnT was determined to be 4.8±0.3 eV. The number of charges on the CCnT before and after the onset of field emission was also measured. The second part focuses on the plastic deformation of Al thin films to test dislocation-interface interactions. A dislocation close to an interface with a stiffer material should be repelled by it. Here, we find to the contrary that dislocations moving towards the oxidized interface are absorbed, even at room temperature. The stress was derived from a combination of load-cell measurements and FEM calculations. Finally, preliminary experiments to combine in situ indentation and dark-field electron holography are reported.
Download or read book Scanning Microscopy for Nanotechnology written by Weilie Zhou and published by Springer Science & Business Media. This book was released on 2007-03-09 with total page 533 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
Download or read book In Situ Nanoindentation Study of Plastic Co deformation in Al TiN Nanocomposites written by and published by . This book was released on 2014 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: We performed in situ indentation in a transmission electron microscope on Al-TiN multilayers with individual layer thicknesses of 50 nm, 5 nm and 2.7 nm to explore the effect of length scales on the plastic co-deformability of a metal and a ceramic. At 50 nm, plasticity was confined to the Al layers with easy initiation of cracks in the TiN layers. At 5 nm and below, cracking in TiN was suppressed and post mortem measurements indicated a reduction in layer thickness in both layers. The results demonstrate the profound size effect in enhancing plastic co-deformability in nanoscale metal-ceramic multilayers.
Download or read book Nanocharacterisation written by Royal Society of Chemistry (Great Britain) and published by Royal Society of Chemistry. This book was released on 2007 with total page 319 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanocharacterisation is a rapidly developing field. Contributions in this book from across the globe provide an overview of the different microscopic techniques for the characterisation of nanostructures.
