Download or read book 1995 International Symposium on Microelectronics written by International Symposium on Microelectronics and published by . This book was released on 1995 with total page 584 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Design for AT Speed Test Diagnosis and Measurement written by Benoit Nadeau-Dostie and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 251 pages. Available in PDF, EPUB and Kindle. Book excerpt: Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.

Download or read book 1995 International Symposium on Microelectronics written by and published by . This book was released on 1995 with total page 588 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Boundary Scan Handbook written by Kenneth P. Parker and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 393 pages. Available in PDF, EPUB and Kindle. Book excerpt: In February of 1990, the balloting process for the IEEE proposed standard P1149.1 was completed creating IEEE Std 1149.1-1990. Later that summer, in record time, the standard won ratification as an ANSI standard as well. This completed over six years of intensive cooperative effort by a diverse group of people who share a vision on solving some of the severe testing problems that exist now and are steadily getting worse. Early in this process, someone asked me if 1 thought that the P1l49.l effort would ever bear fruit. 1 responded somewhat glibly that "it was anyone's guess". Well, it wasn't anyone's guess, but rather the faith of a few individuals in the proposition that many testing problems could be solved if a multifaceted industry could agree on a standard for all to follow. Four of these individuals stand out; they are Harry Bleeker, Colin Maunder, Rodham Tulloss, and Lee Whetsel. In that I am convinced that the 1149.1 standard is the most significant testing development in the last 20 years, I personally feel a debt of gratitude to them and all the people who labored on the various Working Groups in its creation.

Download or read book Fault Diagnosis of Analog Integrated Circuits written by Prithviraj Kabisatpathy and published by Springer Science & Business Media. This book was released on 2006-01-13 with total page 183 pages. Available in PDF, EPUB and Kindle. Book excerpt: Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.

Download or read book Information Technology written by Ricardo Reis and published by Springer Science & Business Media. This book was released on 2004-07-27 with total page 337 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains a selection of tutorials on hot topics in information technology, which were presented at the IFIP World Computer Congress. WCC2004 took place at the Centre de Congrès Pierre Baudis, in Toulouse, France, from 22 to 27 August 2004. The 11 chapters included in the book were chosen from tutorials proposals submitted to WCC2004. These papers report on several important and state-of-the-art topics on information technology such as: Quality of Service in Information Networks Risk-Driven Development of Security-Critical Systems Using UMLsec Developing Portable Software Formal Reasoning About Systems, Software and Hardware Using Functionals, Predicates and Relations The Problematic of Distributed Systems Supervision Software Rejuvenation - Modeling and Analysis Test and Design-for-Test of Mixed-Signal Integrated Circuits Web Services Applications of Multi-Agent Systems Discrete Event Simulation Human-Centered Automation We hereby would like to thank IFIP and more specifically WCC2004 Tutorials Committee and the authors for their contribution. We also would like to thank the congress organizers who have done a great job. Ricardo Reis Editor QUALITY OF SERVICE IN INFORMATION NETWORKS Augusto Casaca IST/INESC, R. Alves Redol, 1000-029, Lisboa, Portugal. Abstract: This article introduces the problems concerned with the provision of end-- end quality of service in IP networks, which are the basis of information networks, describes the existing solutions for that provision and presents some of the current research items on the subject. Key words: Information networks, IP networks, Integrated Services, Differentiated Services, Multiprotocol Label Switching, UMTS.

Download or read book Proceedings International Test Conference 1997 written by and published by . This book was released on 1997 with total page 1074 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Digital Video Image Quality and Perceptual Coding written by H.R. Wu and published by CRC Press. This book was released on 2017-12-19 with total page 670 pages. Available in PDF, EPUB and Kindle. Book excerpt: The hand is quicker than the eye. In many cases, so is digital video. Maintaining image quality in bandwidth- and memory-restricted environments is quickly becoming a reality as thriving research delves ever deeper into perceptual coding techniques, which discard superfluous data that humans cannot process or detect. Surveying the topic from a Human Visual System (HVS)-based approach, Digital Video Image Quality and Perceptual Coding outlines the principles, metrics, and standards associated with perceptual coding, as well as the latest techniques and applications. This book is divided broadly into three parts. First, it introduces the fundamental theory, concepts, principles, and techniques underlying the field, such as the basics of compression, HVS modeling, and coding artifacts associated with current well-known techniques. The next section focuses on picture quality assessment criteria; subjective and objective methods and metrics, including vision model based digital video impairment metrics; testing procedures; and international standards regarding image quality. Finally, practical applications come into focus, including digital image and video coder designs based on the HVS as well as post-filtering, restoration, error correction, and concealment techniques. The permeation of digital images and video throughout the world cannot be understated. Nor can the importance of preserving quality while using minimal storage space, and Digital Video Image Quality and Perceptual Coding provides the tools necessary to accomplish this goal. Instructors and lecturers wishing to make use of this work as a textbook can download a presentation of 786 slides in PDF format organized to augment the text. accompany our book (H.R. Wu and K.R. Rao, Digital Video Image Quality and Perceptual Coding, CRC Press (ISBN: 0-8247-2777-0), Nov. 2005) for lecturers or instructor to use for their classes if they use the book.

Download or read book Index to IEEE Publications written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1996 with total page 1212 pages. Available in PDF, EPUB and Kindle. Book excerpt: Issues for 1973- cover the entire IEEE technical literature.

Download or read book Analog and Mixed Signal Boundary Scan written by Adam Osseiran and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 171 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains more than the IEEE Standard 1149.4. It also contains the thoughts of those who developed the standard. Adam Osseiran has edited the original writings of Brian Wilkins, Colin Maunder, Rod Tulloss, Steve Sunter, Mani Soma, Keith Lofstrom and John McDermid, all of whom have personally contributed to this standard. To preserve the original spirit, only minor changes were made, and the reader will sense a chapter-to-chapter variation in the style of expression. This may appear awkward to some, although I found the Iack of monotonicity refreshing. A system consists of a specific organization of parts. The function of the system cannot be performed by an individual part or even a disorganized collection ofthe same parts. Testing has a system-like characteristic. Testing of a system does not follow directly from the testing of its parts, and a system built with testable parts can sometimes be impossible to test. Therefore, testability of the system must be organized. Some years ago, the IEEE published the boundary-scan Standard 1149.1. That Standard provided an architecture for digital VLSI chips. The chips designed with the 1149.1 architecture can be integrated into a testable system. However, many systems today contain both analog and digital chips. Even if all digital chips are compliant with the standard, the testability of a mixed-signal system cannot be guaranteed. The new Standard 1149.4, described in this book, extends the previous architecture to mixed-signal systems.

Download or read book Proceedings International Test Conference 1996 written by and published by Conference. This book was released on 1996 with total page 994 pages. Available in PDF, EPUB and Kindle. Book excerpt: ITC is the World's largest premier technical conference on the testing and total quality of integrated electronics and the assenblies and systems that are based on them.

Download or read book Proceedings International Test Conference 1995 written by and published by Conference. This book was released on 1995 with total page 1032 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Mobile Multimedia Broadcasting Standards written by Fa-Long Luo and published by Springer Science & Business Media. This book was released on 2008-11-24 with total page 671 pages. Available in PDF, EPUB and Kindle. Book excerpt: Mobile multimedia broadcasting compasses a broad range of topics including radio propagation, modulation and demodulation, error control, signal compression and coding, transport and time slicing, system on chip real-time implementation in ha- ware, software and system levels. The major goal of this technology is to bring multimedia enriched contents to handheld devices such as mobile phones, portable digital assistants, and media players through radio transmission or internet pro- col (IP) based broadband networks. Research and development of mobile multi- dia broadcasting technologies are now explosively growing and regarded as new killer applications. A number of mobile multimedia broadcasting standards related to transmission, compression and multiplexing now coexist and are being ext- sively further developed. The development and implementation of mobile multi- dia broadcasting systems are very challenging tasks and require the huge efforts of the related industry, research and regulatory authorities so as to bring the success. From an implementation design and engineering practice point of view, this book aims to be the ?rst single volume to provide a comprehensive and highly coherent treatment for multiple standards of mobile multimedia broadcasting by covering basic principles, algorithms, design trade-off, and well-compared implementation system examples. This book is organized into 4 parts with 22 chapters.

Download or read book Analog Circuit Design written by Johan Huijsing and published by Springer Science & Business Media. This book was released on 1998-12-31 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt: Contains the revised contributions of 18 tutorial speakers at the seventh AACD '98 in Copenhagen, April 1998. Subjects addressed include the challenges of smaller transistor dimensions, digital and analog sub-blocks, substrate bounce and other substrate coupling effects, and high efficiency power amplifiers for receiver design. Annotation copyrighted by Book News, Inc., Portland, OR

Download or read book Transient Induced Latchup in CMOS Integrated Circuits written by Ming-Dou Ker and published by John Wiley & Sons. This book was released on 2009-07-23 with total page 265 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book all semiconductor device engineers must read to gain a practical feel for latchup-induced failure to produce lower-cost and higher-density chips. Transient-Induced Latchup in CMOS Integrated Circuits equips the practicing engineer with all the tools needed to address this regularly occurring problem while becoming more proficient at IC layout. Ker and Hsu introduce the phenomenon and basic physical mechanism of latchup, explaining the critical issues that have resurfaced for CMOS technologies. Once readers can gain an understanding of the standard practices for TLU, Ker and Hsu discuss the physical mechanism of TLU under a system-level ESD test, while introducing an efficient component-level TLU measurement setup. The authors then present experimental methodologies to extract safe and area-efficient compact layout rules for latchup prevention, including layout rules for I/O cells, internal circuits, and between I/O and internal circuits. The book concludes with an appendix giving a practical example of extracting layout rules and guidelines for latchup prevention in a 0.18-micrometer 1.8V/3.3V silicided CMOS process. Presents real cases and solutions that occur in commercial CMOS IC chips Equips engineers with the skills to conserve chip layout area and decrease time-to-market Written by experts with real-world experience in circuit design and failure analysis Distilled from numerous courses taught by the authors in IC design houses worldwide The only book to introduce TLU under system-level ESD and EFT tests This book is essential for practicing engineers involved in IC design, IC design management, system and application design, reliability, and failure analysis. Undergraduate and postgraduate students, specializing in CMOS circuit design and layout, will find this book to be a valuable introduction to real-world industry problems and a key reference during the course of their careers.

Download or read book Boundary Scan Interconnect Diagnosis written by José T. de Sousa and published by Springer Science & Business Media. This book was released on 2005-12-28 with total page 178 pages. Available in PDF, EPUB and Kindle. Book excerpt: This pioneering text explains how to synthesize digital diagnostic sequences for wire interconnects using boundary-scan, and how to assess the quality of those sequences. It takes a new approach, carefully modelling circuit and interconnect faults, and applying graph techniques to solve problems.

Download or read book Design of Hardware Software Embedded Systems written by Eugenio Villar Bonet and published by Ed. Universidad de Cantabria. This book was released on 2001 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt: Este libro presenta los desafíos planteados por las nuevas y sumamente poderosas tecnologías de integración de sistemas electrónicos, que están en la base de los cambios sociales hacia lo que llaman la Sociedad de la Información; en la que los dispositivos electrónicos se harán una parte incorporada de la vida diaria, encajados en casi cada producto. Es necesario un conocimiento cuidadoso de los desafíos para aprovechar la amplia gama de ocasiones ofrecidas por tales capacidades de integración y las correspondientes posibilidades de diseño de sistemas electrónicos.