Download or read book Growth and Characterization of Ti1 xZrx Si2 Thin Films on Silicon written by Yuan Dao and published by . This book was released on 1995 with total page 366 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Growth and Characterization of Ti Si N Thin Films written by and published by . This book was released on 2008 with total page 144 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Science And Technology Of Thin Films written by Francesco Cino Matacotta and published by World Scientific. This book was released on 1995-10-31 with total page 369 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book brings together detailed discussions by leading experts on the various innovative aspects of thin films growth, deposition and characterization techniques, and new thin film materials and devices. It addresses through the different viewpoints of the contributors, the major problem of thin films science - the relation between the energy of the condensing species and the resulting properties of the films. Some of the issues considered include energetic condensation, bombardment stabilization, pulsed electron beam ablation, orientation and self-organization of organic, ferroelectric and nanoparticle thin films. Several chapters focus on applications such as the recent developments in organic optoelectronics, large area electronic technology and superconducting thin film devices.

Download or read book In Situ Real Time Characterization of Thin Films written by Orlando Auciello and published by John Wiley & Sons. This book was released on 2001 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt: An in-depth look at the state of the art of in situ real-time monitoring and analysis of thin films With thin film deposition becoming increasingly critical in the production of advanced electronic and optical devices, scientists and engineers working in this area are looking for in situ, real-time, structure-specific analytical tools for characterizing phenomena occurring at surfaces and interfaces during thin film growth. This volume brings together contributed chapters from experts in the field, covering proven methods for in situ real-time analysis of technologically important materials such as multicomponent oxides in different environments. Background information and extensive references to the current literature are also provided. Readers will gain a thorough understanding of the growth processes and become acquainted with both emerging and more established methods that can be adapted for in situ characterization. Methods and their most useful applications include: * Low-energy time-of-flight ion scattering and direct recoil spectroscopy (TOF-ISRAS) for studying multicomponent oxide film growth processes * Reflection high-energy electron diffraction (RHEED) for determining the nature of chemical reactions at film surfaces * Spectrometric ellipsometry (SE) for use in the analysis of semiconductors and other multicomponent materials * Reflectance spectroscopy and transmission electron microscopy for monitoring epitaxial growth processes * X-ray fluorescence spectroscopy for studying surface and interface structures * And other cost-effective techniques for industrial application

Download or read book Growth and Characterization of Undoped and Doped Silicon Thin Films Using Supersonic Molecular Jets written by Rajeev Malik and published by . This book was released on 1996 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Growth and Characterization of Very Thin Silicon Dioxide Films written by Peng Bo Na and published by . This book was released on 1987 with total page 6 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Characterization in Silicon Processing written by Yale Strausser and published by Butterworth-Heinemann. This book was released on 1993 with total page 264 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume is devoted to the consideration of the use use of surface, thin film and interface characterization tools in support of silicon-based semiconductor processing. The approach taken is to consider each of the types of films used in silicon devices individually in its own chapter and to discuss typical problems seen throughout that films' history, including characterization tools which are most effectively used to clarifying and solving those problems.

Download or read book Thin Film Growth and Characterization of Ti Si Ge C Compounds written by Per Eklund and published by . This book was released on 2005 with total page 62 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Nucleation Epitaxial Growth and Characterization of beta SiC Thin Films on Si by Rapid Thermal Chemical Vapor Deposition written by JiPing Li and published by . This book was released on 1994 with total page 278 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Characterization of Thin Films of Silicon Rich Oxides written by Esther Maughan and published by . This book was released on 1998 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Growth and Characterization of Polycrystalline and Single crystal Ti1 xAlxN Alloy Thin Films written by Ulf Wahlström and published by . This book was released on 1992 with total page 106 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Thin Film Growth and Characterization of Ti Si C MAX phases written by Jens Emmerlich and published by . This book was released on 2004 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Growth and Characterization of II IV Semiconductor Thin Films written by Anthony Michael Patterson and published by . This book was released on 1984 with total page 1681 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Growth and Characterization of II VI Semiconductor Thin Films written by A. M. Patterson and published by . This book was released on 1984 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Investigation on the Growth and Characterization of Tin Sulfide 2D Thin Films written by Shifeng Wang and published by . This book was released on 2017 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: Two-dimensional (2D) materials have recently attracted increasing amount of research attention, because of their exotic characteristics of asymmetric connections in the bulk. They involve strong intra-layer covalent bonding and weak interlayer interactions consisting mainly of van der Waals forces. Consequently, there is almost no dangling bond at the interfaces and on the surfaces. In addition, strain is also nearly absent between the layers and at the interfaces between such materials. These features make 2D materials promising for modern electronic and optoelectronic devices with outstanding performances. In this thesis, the van der Waals epitaxial growth of 2D SnS thin films on 2D mica substrates and 2D templates such as a SnSe buffer layer, a Bi2Se3 conducting thin layer, had been investigated. In addition, preliminary devices based on these materials were fabricated to demonstrate their applications. Additionally, efforts on building all-2D van der Waals (vdW) heterostructures have also been made. The van der Waals epitaxial growth of 2D materials was carried out using mica as substrates, which also possesses 2D layered structure exhibiting flexible, transparent, and insulating properties at low price. Molecular Beam Epitaxial (MBE) grown SnS thin films on mica substrates with excellent film quality were achieved, reflected by the narrow full width at half maximum (FWHM) of 0.1° in X-ray diffraction rocking curve. Analysis of this all-2D-layer stacking with the help of interface model was developed, to better understand the van der Waals epitaxial growth mechanism and facilitate further improvement of the film quality. Utilization of SnSe buffer layer significantly modified the growth mechanism by effectively aligning the lateral growth orientations, thereby enhancing the electrical property with lowered defect density within the films. To fundamentally reduce the native point defects caused by the tin deficiency in the films, a simultaneous tin compensation source was adopted. Apart from the great enhancement in the electrical property, the crystal structure also bore a resemblance to that with SnSe buffer layer. The FWHM of Sn-compensated SnS film exhibited a record low value between 0.07° and 0.04°, implying an extremely high film quality. Additionally, an about 67% increase in Hall mobility was accomplished in the film. The Sn-compensated SnS/GaN:Si heterojunction devices were fabricated to demonstrate the positive effect of Sn compensation, as well as the feasibility of SnS as optoelectronic applications. The SnS 2D thin films with high quality and tunable properties hold great potential for optoelectronic devices with better performances.

Download or read book Growth and Characterization of Thin PTCDA Films on Si 001 written by Jörgen Gustafsson and published by . This book was released on 2004 with total page 35 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Low Pressure Synthetic Diamond written by Bernhard Dischler and published by Springer Science & Business Media. This book was released on 2013-03-08 with total page 383 pages. Available in PDF, EPUB and Kindle. Book excerpt: A comprehensive presentation of the complete spectrum of methods for CVD-diamond deposition and an overview of the most important applications.