Download or read book Fault Diagnosis of Analog Integrated Circuits written by Prithviraj Kabisatpathy and published by Springer Science & Business Media. This book was released on 2006-01-13 with total page 183 pages. Available in PDF, EPUB and Kindle. Book excerpt: Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.

Download or read book Digital Circuit Testing and Testability written by Parag K. Lala and published by Academic Press. This book was released on 1997 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt: An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.

Download or read book Electronic Testing and Fault Diagnosis written by George Loveday and published by . This book was released on 1989 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Fault Diagnosis of Digital Circuits written by V. N. Yarmolik and published by John Wiley & Sons. This book was released on 1990 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: The continual explosion of computer development has led to inadequate coverage of proper & useful on-line testing techniques. This text fills the gap in the literature by presenting the latest techniques available for digital devices used in the most popular computers. Initial chapters explore the classic problems of on-line testing, pointing out the limited applications of conventional approaches to the problem of diagnosing digital devices using LSI & VLSI chips. Chapters 4-7 cover compact testing methods used to diagnose complex digital circuits. Chapters 8 & 9 analyze the techniques of compressing output responses of a digital circuit, while chapter 10 surveys promising recent signature generation techniques for binary sequences. The final chapter covers multi-output digital circuits.

Download or read book Testing and Diagnosis of Analog Circuits and Systems written by Ruey-wen Liu and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 290 pages. Available in PDF, EPUB and Kindle. Book excerpt: IS THE TOPIC ANALOG TESTING AND DIAGNOSIS TIMELY? Yes, indeed it is. Testing and Diagnosis is an important topic and fulfills a vital need for the electronic industry. The testing and diagnosis of digital electronic circuits has been successfuIly developed to the point that it can be automated. Unfortu nately, its development for analog electronic circuits is still in its Stone Age. The engineer's intuition is still the most powerful tool used in the industry! There are two reasons for this. One is that there has been no pressing need from the industry. Analog circuits are usuaIly small in size. Sometimes, the engineer's experience and intuition are sufficient to fulfill the need. The other reason is that there are no breakthrough results from academic re search to provide the industry with critical ideas to develop tools. This is not because of a lack of effort. Both academic and industrial research groups have made major efforts to look into this problem. Unfortunately, the prob lem for analog circuits is fundamentally different from and much more diffi cult than its counterpart for digital circuits. These efforts have led to some important findings, but are still not at the point of being practicaIly useful. However, these situations are now changing. The current trend for the design of VLSI chips is to use analog/digital hybrid circuits, instead of digital circuits from the past. Therefore, even Ix x Preface though the analog circuit may be small, the total circuit under testing is large.

Download or read book Fault Diagnosis of Digital Systems written by Herbert Y. Chang and published by New York : Wiley-Interscience. This book was released on 1970 with total page 184 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Fault Detection in Digital Circuits written by Arthur D. Friedman and published by Prentice Hall. This book was released on 1971 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala and published by Springer Nature. This book was released on 2022-06-01 with total page 99 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

Download or read book Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Download or read book Fault Diagnosis and Prognosis Techniques for Complex Engineering Systems written by Hamid Reza Karimi and published by Elsevier. This book was released on 2021-06-14 with total page 419 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fault Diagnosis and Prognosis Techniques for Complex Engineering Systems gives a systematic description of the many facets of envisaging, designing, implementing, and experimentally exploring emerging trends in fault diagnosis and failure prognosis in mechanical, electrical, hydraulic and biomedical systems. The book is devoted to the development of mathematical methodologies for fault diagnosis and isolation, fault tolerant control, and failure prognosis problems of engineering systems. Sections present new techniques in reliability modeling, reliability analysis, reliability design, fault and failure detection, signal processing, and fault tolerant control of engineering systems. Sections focus on the development of mathematical methodologies for diagnosis and prognosis of faults or failures, providing a unified platform for understanding and applicability of advanced diagnosis and prognosis methodologies for improving reliability purposes in both theory and practice, such as vehicles, manufacturing systems, circuits, flights, biomedical systems. This book will be a valuable resource for different groups of readers - mechanical engineers working on vehicle systems, electrical engineers working on rotary machinery systems, control engineers working on fault detection systems, mathematicians and physician working on complex dynamics, and many more. Presents recent advances of theory, technological aspects, and applications of advanced diagnosis and prognosis methodologies in engineering applications Provides a series of the latest results, including fault detection, isolation, fault tolerant control, failure prognosis of components, and more Gives numerical and simulation results in each chapter to reflect engineering practices

Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1016 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

Download or read book Issues of Fault Diagnosis for Dynamic Systems written by Ron J. Patton and published by Springer Science & Business Media. This book was released on 2000-03-29 with total page 632 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since the time our first book Fault Diagnosis in Dynamic Systems: The ory and Applications was published in 1989 by Prentice Hall, there has been a surge in interest in research and applications into reliable methods for diag nosing faults in complex systems. The first book sold more than 1,200 copies and has become the main text in fault diagnosis for dynamic systems. This book will follow on this excellent record by focusing on some of the advances in this subject, by introducing new concepts in research and new application topics. The work cannot provide an exhaustive discussion of all the recent research in fault diagnosis for dynamic systems, but nevertheless serves to sample some of the major issues. It has been valuable once again to have the co-operation of experts throughout the world working in industry, gov emment establishments and academic institutions in writing the individual chapters. Sometimes dynamical systems have associated numerical models available in state space or in frequency domain format. When model infor mation is available, the quantitative model-based approach to fault diagnosis can be taken, using the mathematical model to generate analytically redun dant alternatives to the measured signals. When this approach is used, it becomes important to try to understand the limitations of the mathematical models i. e. , the extent to which model parameter variations occur and the effect of changing the systems point of operation.

Download or read book Signal Processing for Fault Detection and Diagnosis in Electric Machines and Systems written by Mohamed Benbouzid and published by IET. This book was released on 2020-12-09 with total page 283 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains 5 chapters that discusses the following topics: Parametric signal processing approach; The signal demodulation techniques; Kullback-Leibler divergence for incipient fault diagnosis; Higher-order spectra and Fault detection and diagnosis based on principal component analysis.

Download or read book Model Based Fault Diagnosis Techniques written by Steven X. Ding and published by Springer Science & Business Media. This book was released on 2012-12-20 with total page 533 pages. Available in PDF, EPUB and Kindle. Book excerpt: Guaranteeing a high system performance over a wide operating range is an important issue surrounding the design of automatic control systems with successively increasing complexity. As a key technology in the search for a solution, advanced fault detection and identification (FDI) is receiving considerable attention. This book introduces basic model-based FDI schemes, advanced analysis and design algorithms, and mathematical and control-theoretic tools. This second edition of Model-Based Fault Diagnosis Techniques contains: • new material on fault isolation and identification and alarm management; • extended and revised treatment of systematic threshold determination for systems with both deterministic unknown inputs and stochastic noises; • addition of the continuously-stirred tank heater as a representative process-industrial benchmark; and • enhanced discussion of residual evaluation which now deals with stochastic processes. Model-based Fault Diagnosis Techniques will interest academic researchers working in fault identification and diagnosis and as a text it is suitable for graduate students in a formal university-based course or as a self-study aid for practising engineers working with automatic control or mechatronic systems from backgrounds as diverse as chemical process and power engineering.

Download or read book Digital Electronics written by John Morris and published by Routledge. This book was released on 2013-09-05 with total page 136 pages. Available in PDF, EPUB and Kindle. Book excerpt: An essential companion to John C Morris's 'Analogue Electronics', this clear and accessible text is designed for electronics students, teachers and enthusiasts who already have a basic understanding of electronics, and who wish to develop their knowledge of digital techniques and applications. Employing a discovery-based approach, the author covers fundamental theory before going on to develop an appreciation of logic networks, integrated circuit applications and analogue-digital conversion. A section on digital fault finding and useful ic data sheets completes the book.

Download or read book Digital Logic Design written by Brian Holdsworth and published by Elsevier. This book was released on 2002-11-01 with total page 535 pages. Available in PDF, EPUB and Kindle. Book excerpt: New, updated and expanded topics in the fourth edition include: EBCDIC, Grey code, practical applications of flip-flops, linear and shaft encoders, memory elements and FPGAs. The section on fault-finding has been expanded. A new chapter is dedicated to the interface between digital components and analog voltages. - A highly accessible, comprehensive and fully up to date digital systems text - A well known and respected text now revamped for current courses - Part of the Newnes suite of texts for HND/1st year modules

Download or read book Digital Circuit Testing written by Francis C. Wong and published by Elsevier. This book was released on 2012-12-02 with total page 248 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.