Download or read book European Test Workshop 1999 written by Hans-Joachim Wunderlich and published by IEEE Computer Society Press. This book was released on 1999 with total page 194 pages. Available in PDF, EPUB and Kindle. Book excerpt: Annotation This proceedings contains extended version of a selected subset of the contributions presented at the May 1999 IEEE workshop. The 27 papers share research and development (RandD) results in electronic testing. Topics include calculating efficient LFSR seeds for built-in self test, functional and structural testing of switched-current circuits, compaction of IDDQ test sequence using reassignment method, debug facilities in the TriMedia CPU64 architecture, deterministic BIST with partial scan, and using the BS register for capturing and storing n-bit sequences in real-time. Other papers address MEMs, switched capacitors, ATPG and fault modeling, fault simulation and fault coverage of analog circuits, FPGAs and regular arrays, and low power BIST. No subject index. Annotation copyrighted by Book News, Inc., Portland, OR.
Download or read book Special Issue on the European Test Workshop 1999 written by European Test Workshop and published by . This book was released on 2000 with total page 142 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book European Test Workshop 1999 written by and published by IEEE Computer Society Press. This book was released on 1999-01-01 with total page 171 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings European Test Workshop 1999 May 25 28 1999 Constance Germany written by and published by . This book was released on 2000 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book European Test Workshop 1999 written by Hans-Joachim Wunderlich and published by IEEE Computer Society Press. This book was released on 1999-01-01 with total page 171 pages. Available in PDF, EPUB and Kindle. Book excerpt: This proceedings contains extended version of a selected subset of the contributions presented at the May 1999 IEEE workshop. The 27 papers share research and development (RandD) results in electronic testing. Topics include calculating efficient LFSR seeds for built-in self test, functional and structural testing of switched-current circuits, compaction of IDDQ test sequence using reassignment method, debug facilities in the TriMedia CPU64 architecture, deterministic BIST with partial scan, and using the BS register for capturing and storing n-bit sequences in real-time. Other papers address MEMs, switched capacitors, ATPG and fault modeling, fault simulation and fault coverage of analog circuits, FPGAs and regular arrays, and low power BIST. No subject index. Annotation copyrighted by Book News, Inc., Portland, OR.
Download or read book Fault Diagnosis of Analog Integrated Circuits written by Prithviraj Kabisatpathy and published by Springer Science & Business Media. This book was released on 2006-01-13 with total page 183 pages. Available in PDF, EPUB and Kindle. Book excerpt: Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.
Download or read book Broadcast News Workshop 99 Proceedings written by Darpa and published by Morgan Kaufmann. This book was released on 1999-06-29 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Power Constrained Testing of VLSI Circuits written by Nicola Nicolici and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 182 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.
Download or read book SOC Design Methodologies written by Michel Robert and published by Springer. This book was released on 2013-03-15 with total page 489 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 11 th IFIP International Conference on Very Large Scale Integration, in Montpellier, France, December 3-5,2001, was a great success. The main focus was about IP Cores, Circuits and System Designs & Applications as well as SOC Design Methods and CAD. This book contains the best papers (39 among 70) that have been presented during the conference. Those papers deal with all aspects of importance for the design of the current and future integrated systems. System on Chip (SOC) design is today a big challenge for designers, as a SOC may contain very different blocks, such as microcontrollers, DSPs, memories including embedded DRAM, analog, FPGA, RF front-ends for wireless communications and integrated sensors. The complete design of such chips, in very deep submicron technologies down to 0.13 mm, with several hundreds of millions of transistors, supplied at less than 1 Volt, is a very challenging task if design, verification, debug and industrial test are considered. The microelectronic revolution is fascinating; 55 years ago, in late 1947, the transistor was invented, and everybody knows that it was by William Shockley, John Bardeen and Walter H. Brattein, Bell Telephone Laboratories, which received the Nobel Prize in Physics in 1956. Probably, everybody thinks that it was recognized immediately as a major invention.
Download or read book System level Test and Validation of Hardware Software Systems written by Matteo Sonza Reorda and published by Springer Science & Business Media. This book was released on 2006-03-30 with total page 187 pages. Available in PDF, EPUB and Kindle. Book excerpt: New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.
Download or read book Index of Conference Proceedings written by British Library. Document Supply Centre and published by . This book was released on 2002 with total page 696 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Test Resource Partitioning for System on a Chip written by Vikram Iyengar and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 234 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test Resource Partitioning for System-on-a-Chip is about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. Plug-and-play refers to the paradigm in which core-to-core interfaces as well as core-to-SOC logic interfaces are standardized, such that cores can be easily plugged into "virtual sockets" on the SOC design, and core tests can be plugged into the SOC during test without substantial effort on the part of the system integrator. The goal of the book is to position test resource partitioning in the context of SOC test automation, as well as to generate interest and motivate research on this important topic. SOC integrated circuits composed of embedded cores are now commonplace. Nevertheless, There remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design, and test challenges are a major contributor to the widening gap between design capability and manufacturing capacity. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. Test Resource Partitioning for System-on-a-Chip responds to a pressing need for a structured methodology for SOC test automation. It presents new techniques for the partitioning and optimization of the three major SOC test resources: test hardware, testing time and test data volume. Test Resource Partitioning for System-on-a-Chip paves the way for a powerful integrated framework to automate the test flow for a large number of cores in an SOC in a plug-and-play fashion. The framework presented allows the system integrator to reduce test cost and meet short time-to-market requirements.
Download or read book DCIS2002 written by Salvador Bracho del Pino and published by Ed. Universidad de Cantabria. This book was released on 2002 with total page 756 pages. Available in PDF, EPUB and Kindle. Book excerpt: Este libro contiene las presentaciones de la XVII Conferencia de Diseño de Circuitos y Sistemas Integrados celebrado en el Palacio de la Magdalena, Santander, en noviembre de 2002. Esta Conferencia ha alcanzado un alto nivel de calidad, como consecuencia de su tradición y madurez, que lo convierte en uno de los acontecimientos más importantes para los circuitos de microelectrónica y la comunidad de diseño de sistemas en el sur de Europa. Desde su origen tiene una gran contribución de Universidades españolas, aunque hoy los autores participan desde catorce países
Download or read book 18th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2000 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and systems. Themes are microprocessor test/validation, low power BIST and scan, technology trends, scan- related approaches, defect-driven techniques, and system-on-chip test techniques. Other subjects are analog test techniques, temperature and process drift issues, test compaction and design validation, analog BIST, and functional test and verification issues. Also covered are STIL extension, IDDQ test, and on-line testing and fault tolerance. Lacks a subject index. Annotation copyrighted by Book News, Inc., Portland, OR.
Download or read book Mathematical and Engineering Methods in Computer Science written by Antonin Kucera and published by Springer. This book was released on 2013-01-17 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains the post-proceedings of the 8th Doctoral Workshop on Mathematical and Engineering Methods in Computer Science, MEMICS 2012, held in Znojmo, Czech Republic, in October, 2012. The 13 thoroughly revised papers were carefully selected out of 31 submissions and are presented together with 6 invited papers. The topics covered by the papers include: computer-aided analysis and verification, applications of game theory in computer science, networks and security, modern trends of graph theory in computer science, electronic systems design and testing, and quantum information processing.
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2005 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book IEEE International High Level Design Validation and Test Workshop written by and published by . This book was released on 2003 with total page 192 pages. Available in PDF, EPUB and Kindle. Book excerpt:
