Download or read book ESD Basics written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2012-10-22 with total page 244 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electrostatic discharge (ESD) continues to impact semiconductor manufacturing, semiconductor components and systems, as technologies scale from micro- to nano electronics. This book introduces the fundamentals of ESD, electrical overstress (EOS), electromagnetic interference (EMI), electromagnetic compatibility (EMC), and latchup, as well as provides a coherent overview of the semiconductor manufacturing environment and the final system assembly. It provides an illuminating look into the integration of ESD protection networks followed by examples in specific technologies, circuits, and chips. The text is unique in covering semiconductor chip manufacturing issues, ESD semiconductor chip design, and system problems confronted today as well as the future of ESD phenomena and nano-technology. Look inside for extensive coverage on: The fundamentals of electrostatics, triboelectric charging, and how they relate to present day manufacturing environments of micro-electronics to nano-technology Semiconductor manufacturing handling and auditing processing to avoid ESD failures ESD, EOS, EMI, EMC, and latchup semiconductor component and system level testing to demonstrate product resilience from human body model (HBM), transmission line pulse (TLP), charged device model (CDM), human metal model (HMM), cable discharge events (CDE), to system level IEC 61000-4-2 tests ESD on-chip design and process manufacturing practices and solutions to improve ESD semiconductor chip solutions, also practical off-chip ESD protection and system level solutions to provide more robust systems System level concerns in servers, laptops, disk drives, cell phones, digital cameras, hand held devices, automobiles, and space applications Examples of ESD design for state-of-the-art technologies, including CMOS, BiCMOS, SOI, bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, smart power, magnetic recording technology, micro-machines (MEMs) to nano-structures ESD Basics: From Semiconductor Manufacturing to Product Use complements the author’s series of books on ESD protection. For those new to the field, it is an essential reference and a useful insight into the issues that confront modern technology as we enter the Nano-electronic Era.

Download or read book The ESD Handbook written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2021-04-12 with total page 1172 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical and comprehensive reference that explores Electrostatic Discharge (ESD) in semiconductor components and electronic systems The ESD Handbook offers a comprehensive reference that explores topics relevant to ESD design in semiconductor components and explores ESD in various systems. Electrostatic discharge is a common problem in the semiconductor environment and this reference fills a gap in the literature by discussing ESD protection. Written by a noted expert on the topic, the text offers a topic-by-topic reference that includes illustrative figures, discussions, and drawings. The handbook covers a wide-range of topics including ESD in manufacturing (garments, wrist straps, and shoes); ESD Testing; ESD device physics; ESD semiconductor process effects; ESD failure mechanisms; ESD circuits in different technologies (CMOS, Bipolar, etc.); ESD circuit types (Pin, Power, Pin-to-Pin, etc.); and much more. In addition, the text includes a glossary, index, tables, illustrations, and a variety of case studies. Contains a well-organized reference that provides a quick review on a range of ESD topics Fills the gap in the current literature by providing information from purely scientific and physical aspects to practical applications Offers information in clear and accessible terms Written by the accomplished author of the popular ESD book series Written for technicians, operators, engineers, circuit designers, and failure analysis engineers, The ESD Handbook contains an accessible reference to ESD design and ESD systems.

Download or read book ESD written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2011-04-04 with total page 260 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electrostatic discharge (ESD) continues to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a whole-chip ESD design synthesis approach. It provides a clear insight into the integration of ESD protection networks from a generalist perspective, followed by examples in specific technologies, circuits, and chips. Uniquely both the semiconductor chip integration issues and floorplanning of ESD networks are covered from a ‘top-down' design approach. Look inside for extensive coverage on: integration of cores, power bussing, and signal pins in DRAM, SRAM, CMOS image processing chips, microprocessors, analog products, RF components and how the integration influences ESD design and integration architecturing of mixed voltage, mixed signal, to RF design for ESD analysis floorplanning for peripheral and core I/O designs, and the implications on ESD and latchup guard ring integration for both a ‘bottom-up' and ‘top-down' methodology addressing I/O guard rings, ESD guard rings, I/O to I/O, and I/O to core classification of ESD power clamps and ESD signal pin circuitry, and how to make the correct choice for a given semiconductor chip examples of ESD design for the state-of-the-art technologies discussed, including CMOS, BiCMOS, silicon on insulator (SOI), bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, and smart power practical methods for the understanding of ESD circuit power distribution, ground rule development, internal bus distribution, current path analysis, quality metrics ESD: Design and Synthesis is a continuation of the author's series of books on ESD protection. It is an essential reference for: ESD, circuit, and semiconductor engineers; design synthesis team leaders; layout design, characterisation, floorplanning, test and reliability engineers; technicians; and groundrule and test site developers in the manufacturing and design of semiconductor chips. It is also useful for graduate and undergraduate students in electrical engineering, semiconductor sciences, and manufacturing sciences, and on courses involving the design of ESD devices, chips and systems. This book offers a useful insight into the issues that confront modern technology as we enter the nano-electronic era.

Download or read book ESD Testing written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2016-12-19 with total page 323 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance. ESD Testing: From Components to Systems updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup. Key features: Provides understanding and knowledge of ESD models and specifications including human body model (HBM), machine model (MM), charged device model (CDM), charged board model (CBM), cable discharge events (CDE), human metal model (HMM), IEC 61000-4-2 and IEC 61000-4-5. Discusses new testing methodologies such as transmission line pulse (TLP), to very fast transmission line pulse (VF-TLP), and future methods of long pulse TLP, to ultra-fast TLP (UF-TLP). Describes both conventional testing and new testing techniques for both chip and system level evaluation. Addresses EOS testing, electromagnetic compatibility (EMC) scanning, to current reconstruction methods. Discusses latchup characterization and testing methodologies for evaluation of semiconductor technology to product testing. ESD Testing: From Components to Systems is part of the authors’ series of books on electrostatic discharge (ESD) protection; this book will be an invaluable reference for the professional semiconductor chip and system-level ESD and EOS test engineer. Semiconductor device and process development, circuit designers, quality, reliability and failure analysis engineers will also find it an essential reference. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, semiconductor testing and experimental work.

Download or read book Practical ESD Protection Design written by Albert Wang and published by John Wiley & Sons. This book was released on 2022-01-06 with total page 436 pages. Available in PDF, EPUB and Kindle. Book excerpt: An authoritative single-volume reference on the design and analysis of ESD protection for ICs Electrostatic discharge (ESD) is a major reliability challenge to semiconductors, integrated circuits (ICs), and microelectronic systems. On-chip ESD protection is a vital to any electronic products, such as smartphones, laptops, tablets, and other electronic devices. Practical ESD Protection Design provides comprehensive and systematic guidance on all major aspects of designs of on-chip ESD protection for integrated circuits (ICs). Written for students and practicing engineers alike, this one-stop resource covers essential theories, hands-on design skills, computer-aided design (CAD) methods, characterization and analysis techniques, and more on ESD protection designs. Detailed chapters examine an array of topics ranging from fundamental to advanced, including ESD phenomena, ESD failure analysis, ESD testing models, ESD protection devices and circuits, ESD design layout and technology effects, ESD design flows and co-design methods, ESD modelling and CAD techniques, and future ESD protection concepts. Based on the author’s decades of design, research and teaching experiences, Practical ESD Protection Design: • Features numerous real-world ESD protection design examples • Emphasizes on ESD protection design techniques and procedures • Describes ESD-IC co-design methodology for high-performance mixed-signal ICs and broadband radio-frequency (RF) ICs • Discusses CAD-based ESD protection design optimization and prediction using both Technology and Electrical Computer-Aided Design (TCAD/ECAD) simulation • Addresses new ESD CAD algorithms and tools for full-chip ESD physical design verification • Explores the disruptive future outlook of ESD protection Practical ESD Protection Design is a valuable reference for industrial engineers and academic researchers in the field, and an excellent textbook for electronic engineering courses in semiconductor microelectronics and integrated circuit designs.

Download or read book The ESD Control Program Handbook written by Jeremy M. Smallwood and published by John Wiley & Sons. This book was released on 2020-09-01 with total page 538 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides the understanding and practical skills needed to develop and maintain an effective ESD control program for manufacturing, storage, and handling of ESD sensitive components This essential guide to ESD control programs explains the principles and practice of ESD control in an easily accessible way whilst also providing more depth and a wealth of references for those who want to gain a deeper knowledge of the subject. It describes static electricity and ESD principles such as triboelectrification, electrostatic fields, and induced voltages, with the minimum of theory or mathematics. It is designed for the reader to "dip into" as required, rather than need to read cover to cover. The ESD Control Program Handbook begins with definitions and commonly used terminology, followed by the principles of static electricity and ESD control. Chapter 3 discusses ESD susceptible electronic devices, and how ESD susceptibility of a component is measured. This is followed by the “Seven habits of a highly effective ESD program”, explaining the essential activities of an effective ESD control program. While most texts mainly address manual handling of ESD susceptible devices, Chapter 5 extends the discussion to ESD control in automated systems, processes and handling, which form a major part of modern electronic manufacture. Chapter 6 deals with requirements for compliance given by the IEC 61340-5-1 and ANSI/ESD S20.20 ESD control standards. Chapter 7 gives an overview of the selection, use, care and maintenance of equipment and furniture commonly used to control ESD risks. The chapter explains how these often work together as part of a system and must be specified with that in mind. ESD protective packaging is available in an extraordinary range of forms from bags, boxes and bubble wrap to tape and reel packaging for automated processes. The principles and practice of this widely misunderstood area of ESD control are introduced in Chapter 8. The thorny question of how to evaluate an ESD control program is addressed in Chapter 9 with a goal of compliance with a standard as well as effective control of ESD risks and possible customer perceptions. Whilst evaluating an existing ESD control program provides challenges, developing an ESD control program from scratch provides others. Chapter 10 gives an approach to this. Standard test methods used in compliance with ESD control standards are explained and simple test procedures given in Chapter 11. ESD Training has long been recognised as essential in maintaining effective ESD control. Chapter 12 discusses ways of covering essential topics and how to demonstrate static electricity in action. The book ends with a look at where ESD control may go in the near future. The ESD Control Program Handbook: Gives readers a sound understanding of the subject to analyze the ESD control requirements of manufacturing processes, and develop an effective ESD control program Provides practical knowledge, as well as sufficient theory and background to understand the principles of ESD control Teaches how to track and identify how ESD risks arise, and how to identify fitting means for minimizing or eliminating them Emphasizes working with modern ESD control program standards IEC 61340-5-1 and ESD S20:20 The ESD Control Program Handbook is an invaluable reference for anyone tasked with setting up, evaluating, or maintaining an effective ESD control program, training personnel, or making ESD control related measurements. It would form an excellent basis for a University course on the subject as well as a guide and resource for industry professionals.

Download or read book ESD Testing written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2016-10-07 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance. ESD Testing: From Components to Systems updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup. Key features: Provides understanding and knowledge of ESD models and specifications including human body model (HBM), machine model (MM), charged device model (CDM), charged board model (CBM), cable discharge events (CDE), human metal model (HMM), IEC 61000-4-2 and IEC 61000-4-5. Discusses new testing methodologies such as transmission line pulse (TLP), to very fast transmission line pulse (VF-TLP), and future methods of long pulse TLP, to ultra-fast TLP (UF-TLP). Describes both conventional testing and new testing techniques for both chip and system level evaluation. Addresses EOS testing, electromagnetic compatibility (EMC) scanning, to current reconstruction methods. Discusses latchup characterization and testing methodologies for evaluation of semiconductor technology to product testing. ESD Testing: From Components to Systems is part of the authors’ series of books on electrostatic discharge (ESD) protection; this book will be an invaluable reference for the professional semiconductor chip and system-level ESD and EOS test engineer. Semiconductor device and process development, circuit designers, quality, reliability and failure analysis engineers will also find it an essential reference. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, semiconductor testing and experimental work.

Download or read book ANSI ESD S20 20 2014 ESD Association Standard for the Development of an Electrostatic Discharge Control Program for Protection of Electrical and Electronic Parts Assemblies and Equipment Excluding Electrically Initiated Explosive Devices written by EOS/ESD Association, Incorporated and published by . This book was released on 2014-08-22 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Simulation Methods for ESD Protection Development written by Harald Gossner and published by Elsevier. This book was released on 2003-10-16 with total page 305 pages. Available in PDF, EPUB and Kindle. Book excerpt: Simulation Methods for ESD Protection Development looks at the integration of new techniques into a comprehensive development flow, which is now available due advances made in the field during the recent years. These findings allow for an early, stable ESD concept at a very early stage of the technology development, which is essential now development cycles have been reduced. The book also offers ways of increasing the optimization and control of the technology concerning performance, thus making the process more cost effective and increasingly efficient. This title provides a guide through the latest research and technology presenting the ESD protection development methodology. This is based on a combination of process, device and circuit stimulation, and addresses the optimization of the industry critical issue, reduced development cycles.Written to address the needs of the ESD engineer, this text is required reading by all industry practitioners and researchers and students within this field. - The FIRST Extensive overview on the subject of ESD simulation - Addresses the industry critical issue of reduced development cycles, and provides solutions - Presents the latest research in the field with high practical relevance and its results

Download or read book Electrical Overstress EOS written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2013-08-27 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design. It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip, and system level EOS protection networks, followed by examples in specific technologies, circuits, and chips. The book is unique in covering the EOS manufacturing issues from on-chip design and electronic design automation to factory-level EOS program management in today’s modern world. Look inside for extensive coverage on: Fundamentals of electrical overstress, from EOS physics, EOS time scales, safe operating area (SOA), to physical models for EOS phenomena EOS sources in today’s semiconductor manufacturing environment, and EOS program management, handling and EOS auditing processing to avoid EOS failures EOS failures in both semiconductor devices, circuits and system Discussion of how to distinguish between EOS events, and electrostatic discharge (ESD) events (e.g. such as human body model (HBM), charged device model (CDM), cable discharge events (CDM), charged board events (CBE), to system level IEC 61000-4-2 test events) EOS protection on-chip design practices and how they differ from ESD protection networks and solutions Discussion of EOS system level concerns in printed circuit boards (PCB), and manufacturing equipment Examples of EOS issues in state-of-the-art digital, analog and power technologies including CMOS, LDMOS, and BCD EOS design rule checking (DRC), LVS, and ERC electronic design automation (EDA) and how it is distinct from ESD EDA systems EOS testing and qualification techniques, and Practical off-chip ESD protection and system level solutions to provide more robust systems Electrical Overstress (EOS): Devices, Circuits and Systems is a continuation of the author’s series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the nano-electronic era.

Download or read book ESD in Silicon Integrated Circuits written by E. Ajith Amerasekera and published by John Wiley & Sons. This book was released on 2002-05-22 with total page 434 pages. Available in PDF, EPUB and Kindle. Book excerpt: * Examines the various methods available for circuit protection, including coverage of the newly developed ESD circuit protection schemes for VLSI circuits. * Provides guidance on the implementation of circuit protection measures. * Includes new sections on ESD design rules, layout approaches, package effects, and circuit concepts. * Reviews the new Charged Device Model (CDM) test method and evaluates design requirements necessary for circuit protection.

Download or read book Electrostatic Discharge Control Handbook for Protection of Electrical and Electronic Parts Assemblies and Equipment excluding Electrically Initiated Explosive Devices metric written by United States. Department of Defense and published by . This book was released on 1991 with total page 168 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Manuals Combined Nondestructive Testing NDT And Inspection NDI written by and published by Jeffrey Frank Jones. This book was released on with total page 8380 pages. Available in PDF, EPUB and Kindle. Book excerpt: Over 8,300 pages .... Just a SAMPLE of the CONTENTS: NONDESTRUCTIVE INSPECTION METHODS. Published by the Departments of the Army, Navy and Air Force on 1 March 2000 - 771 pages and June 2005 - 762 pages; Metallic Materials and Elements for Aerospace Vehicle Structures 1,733 pages Designing and Developing Maintainable Products and Systems - Revision A 719 pages Sampling Procedures and Tables for Inspection by Attributes 75 pages Nondestructive Testing Acceptance Criteria 88 pages Environmental Stress Screening Process for Electronic Equipment 49 pages Handbook for Reliability Test Methods, Plans, and Environments for Engineering, Development, Qualification, and Production - Revision A 411 pages Human Engineering - Revision F 219 pages Sampling Procedures and Tables for Life and Reliability Testing (Based on Exponential Distribution) 77 pages Test Method Standard: Electronic and Electrical Component Parts 191 pages Reliability Testing for Engineering Development, Qualification and Production - Revision D 47 pages Electroexplosive Subsystem Safety Requirements and Test Methods for Space Systems (150 pages, 8.64 MB) Reliability Prediction of Electronic Equipment- Notice F 205 pages Reliability Program for Systems and Equipment Development and Production - Revision B 88 pages Electronic Discharge Control Handbook for Protection of Electrical and Electronic Parts, Assemblies and Equipment (Excluding Electrically Initiated Explosive Devices) - Revision B 171 pages Electrical Grounding for Aircraft Safety 290 pages Fuze and Fuze Components, Environmental and Performance Tests for - Revision C 295 pages Requirements for the Control of Electromagnetic Interference Characteristics of Subsystems and Equipment - Revision E 253 pages Maintainability Verification/Demonstration/Evaluation - Revision A 64 pages Failure Rate Sampling Plans and Procedures - Revision C 41 pages Maintainability Prediction 176 pages Definition of Terms for Reliability and Maintainability - Revision C 18 pages Semiconductor Devices 730 pages Reliability Modeling and Prediction - Revision B 85 pages Established Reliability and High Reliability Qualified Products List (QPL) Systems For Electrical, Electronic, and Fiber Optic Parts Specifications - Revision F 17 pages Environmental Test Methods and Engineering Guidelines 416 pages) Test Methods for Electrical Connectors - Revision A 129 pages Environmental Engineering Considerations and Laboratory Tests - Revision F 539 pages System Safety Program Requirements 117 pages Test Method Standard Microcircuits - Revision E 705 pages Test Method Standard Microcircuits - Revision F 708 pages Procedures for Performing a Failure Mode Effects and Criticality Analysis - Revision A 54 pages

Download or read book ESD Protection Device and Circuit Design for Advanced CMOS Technologies written by Oleg Semenov and published by Springer Science & Business Media. This book was released on 2008-04-26 with total page 237 pages. Available in PDF, EPUB and Kindle. Book excerpt: ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicing engineers working in the areas of circuit design, VLSI reliability and testing domains. As the problems associated with ESD failures and yield losses become significant in the modern semiconductor industry, the demand for graduates with a basic knowledge of ESD is also increasing. Today, there is a significant demand to educate the circuits design and reliability teams on ESD issues. This book makes an attempt to address the ESD design and implementation in a systematic manner. A design procedure involving device simulators as well as circuit simulator is employed to optimize device and circuit parameters for optimal ESD as well as circuit performance. This methodology, described in ESD Protection Device and Circuit Design for Advanced CMOS Technologies has resulted in several successful ESD circuit design with excellent silicon results and demonstrates its strengths.

Download or read book ESD Program Management written by G. Theodore Dangelmayer and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 343 pages. Available in PDF, EPUB and Kindle. Book excerpt: In today's electronics business, managing an ESD progranris an integral part of a complete quality program. In fact, any electronics firm without an active ESD program puts itself and its customers at risk. This book illustrates one good example of the detail and dedication to quality that AT&T expects within its own operations and from its suppliers. Writing of the book began at a time when Ted Dangelmayer was burdened with many demands. These demands were from AT&T's own operations, internal suppliers, external suppliers, customers and others looking for a better understanding of the phenomenon of ESD, its impact and, most of all, ways to control and manage it. In a way, this book is a response to these demands by making available a reader friendly document that distills the hard-won experiences of Ted and AT&T. The information and methods in this book have been gained at no small cost and produce results that far exceed eXRenses. There is, however, a caveat: Success will not be obtained unless there is real management commitment. This means management must allocate the necessary resources and provide active support to ensure that training, auditing, reporting, tracking and an aggressive corrective action program all take place successfully. Ted is an internationally recognized authority, and you will benefit greatly by listening to his advice and following his recommendations.

Download or read book ESD Design Challenges and Strategies in Deeply scaled Integrated Circuits written by Shuqing Cao and published by Stanford University. This book was released on 2010 with total page 137 pages. Available in PDF, EPUB and Kindle. Book excerpt: It is the main objective of this work to address the scaling and design challenges of ESD protection in deeply scaled technologies. First, the thesis introduces the on-chip ESD events, the scaling and design challenges, and the nomenclatures necessary for later chapters. The ESD design window and the I/O schematics for both rail clamping and local clamping ESD schemes are illustrated. Then, the thesis delves into the investigation of the input and output driver devices and examines their robustness under ESD. The input driver's oxide breakdown levels are evaluated in deeply scaled technologies. The output driver's trigger and breakdown voltages are improved appreciably by applying circuit and device design techniques. The ESD device sections first discuss rail-based clamping, a widely used protection scheme. Two diode-based devices, namely the gated diode and substrate diode, are investigated in detail with SOI test structures. Characterization is based on DC current-voltage (I-V), Very Fast Transmission Line Pulse (VF-TLP), capacitance, and leakage measurements. Improvements in performance are realized. Technology computer aided design (TCAD) simulations help understand the physical effects and design tradeoffs. Then, the following section focuses on the local clamping scheme. Two devices, the field-effect diode (FED) and the double-well FED (DWFED), are developed and optimized in an SOI technology. Trigger circuits are designed to improve the turn-on speed. The advantages of local clamping is highlighted and compared with the rail-based clamping. The results show that the FED is a suitable option for power clamping applications and the DWFED is most suitable for pad-based local clamping. The thesis presents an ESD protection design methodology, which takes advantage of the results and techniques from pervious chapters and put each element into a useful format. Based on the correlation of package level and in-lab test results, a design process based on CDM target definition and device optimization, discharge path analysis, parasitic minimization, I/O data rate estimation and finally ESD and performance characterization is used sequentially to systematically realize the overall design goals.

Download or read book Transient Induced Latchup in CMOS Integrated Circuits written by Ming-Dou Ker and published by John Wiley & Sons. This book was released on 2009-07-23 with total page 265 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book all semiconductor device engineers must read to gain a practical feel for latchup-induced failure to produce lower-cost and higher-density chips. Transient-Induced Latchup in CMOS Integrated Circuits equips the practicing engineer with all the tools needed to address this regularly occurring problem while becoming more proficient at IC layout. Ker and Hsu introduce the phenomenon and basic physical mechanism of latchup, explaining the critical issues that have resurfaced for CMOS technologies. Once readers can gain an understanding of the standard practices for TLU, Ker and Hsu discuss the physical mechanism of TLU under a system-level ESD test, while introducing an efficient component-level TLU measurement setup. The authors then present experimental methodologies to extract safe and area-efficient compact layout rules for latchup prevention, including layout rules for I/O cells, internal circuits, and between I/O and internal circuits. The book concludes with an appendix giving a practical example of extracting layout rules and guidelines for latchup prevention in a 0.18-micrometer 1.8V/3.3V silicided CMOS process. Presents real cases and solutions that occur in commercial CMOS IC chips Equips engineers with the skills to conserve chip layout area and decrease time-to-market Written by experts with real-world experience in circuit design and failure analysis Distilled from numerous courses taught by the authors in IC design houses worldwide The only book to introduce TLU under system-level ESD and EFT tests This book is essential for practicing engineers involved in IC design, IC design management, system and application design, reliability, and failure analysis. Undergraduate and postgraduate students, specializing in CMOS circuit design and layout, will find this book to be a valuable introduction to real-world industry problems and a key reference during the course of their careers.