Download or read book Electron Microscopy and Microanalysis of Metals written by J. A. Belk and published by . This book was released on 1968 with total page 272 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electron microscopy and microanalysis of metals ed written by J. A. Belk and published by . This book was released on with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Scanning Electron Microscopy and X Ray Microanalysis written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 679 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

Download or read book Transmission Electron Microscopy of Metals written by Gareth Thomas and published by . This book was released on 1962 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt: Brings together modern data on the principles, practice, and applications of this subject.

Download or read book Microscopic Methods in Metals written by Ulrich Gonser and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 470 pages. Available in PDF, EPUB and Kindle. Book excerpt: Methods of scientific investigation can be divided into two categories: they are either macroscopic or microscopic in nature. The former are generally older, classical methods where the sample as a whole is studied and various local prop erties are deduced by differentiation. The microscopic methods, on the other hand, have been discovered and developed more recently, and they operate for the most part on an atomistic scale. Glancing through the shelves of books on the various scientific fields, and, in particular, on the field of physical metallurgy, we are surprised at how lit tle consideration has been given to the microscopic methods. How these tools provide new insight and information is a question which so far has not at tracted much attention. Similar observations can be made at scientific confer ences, where the presentation of papers involving microscopic methods is often pushed into a far corner. This has led users of such methods to organize their own special conferences. The aim of this book is to bridge the present gap and encourage more interaction between the various fields of study and selected microscopic meth ods, with special emphasis on their suitability for investigating metals. In each case the principles of the method are reviewed, the advantages and successes pointed out, but also the shortcomings and limitations indicated.

Download or read book Handbook of Sample Preparation for Scanning Electron Microscopy and X Ray Microanalysis written by Patrick Echlin and published by Springer Science & Business Media. This book was released on 2011-04-14 with total page 329 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Download or read book Electron Microscopy of Interfaces in Metals and Alloys written by L.M Clarebrough and published by Routledge. This book was released on 2021-09-02 with total page 350 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron Microscopy of Interfaces in Metals and Alloys examines the structure of interfaces in metals and alloys using transmission electron microscopy. The book presents quantitative methods of analysis and reviews the most significant work on interface structure over the last 20 years. It provides the first book description of the methods used for quantitative identification of Burgers vectors of interfacial dislocations, including the geometric analysis of periodicities in interface structure and the comparison of experimental and theoretical electron micrographs. The book explores low- and high-angle grain boundaries and interphase interfaces between neighboring grains, emphasizing interfacial dislocations and rigid-body displacements to the structure and properties of interfaces. It also analyzes the use of two-beam images and diffraction patterns for analysis and studies n-beam lattice imaging. The book includes numerous worked examples of the analysis of the structure of grain boundaries and interphase interfaces, which are particularly useful to those who need to consider the nature of intercrystalline interfaces.

Download or read book Microstructural Characterisation of Metals and Alloys written by P. E. J. Flewitt and published by Ashgate Publishing. This book was released on 1986 with total page 238 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microstructure of Metals and Alloys written by Ganka Zlateva and published by CRC Press. This book was released on 2008-05-05 with total page 184 pages. Available in PDF, EPUB and Kindle. Book excerpt: A teaching tool intended to complement existing books on the theory of materials science, metallurgy, and electron microscopy, this text focuses on metals and alloys. It visualizes key structural elements common to crystalline materials, including crystal lattice imperfections, along with the principles and steps involved in the microstructure deve

Download or read book Scanning Electron Microscopy and X Ray Microanalysis written by Joseph I. Goldstein and published by Springer. This book was released on 2017-11-17 with total page 554 pages. Available in PDF, EPUB and Kindle. Book excerpt: This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners — engineers, technicians, physical and biological scientists, clinicians, and technical managers — will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope’s software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD). With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation. Includes case studies to illustrate practical problem solving Covers Helium ion scanning microscopy Organized into relatively self-contained modules – no need to "read it all" to understand a topic Includes an online supplement—an extensive "Database of Electron–Solid Interactions"—which can be accessed on SpringerLink, in Chapter 3

Download or read book Scanning Electron Microscopy X Ray Microanalysis and Analytical Electron Microscopy written by Charles E. Lyman and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 415 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. The present workbook provides a series of fundamental experiments to aid in "hands-on" learning of the use of the instrumentation and the techniques. It is written by a group of eminently qualified scientists and educators. The importance of hands-on learning cannot be overemphasized.

Download or read book Quantitative Microanalysis with High Spatial Resolution written by G. W. Lorimer and published by Ashgate Publishing. This book was released on 1981 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electron Microscopy and Microanalysis of Metals written by J. A. Belk and published by . This book was released on 1968 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electron Microscopy and Microanalysis of Crystalline Materials written by J. A. Belk and published by . This book was released on 1979 with total page 264 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Advanced Scanning Electron Microscopy and X Ray Microanalysis written by Patrick Echlin and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 463 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.

Download or read book Electron and Ion Microscopy and Microanalysis written by Lawrence E Murr and published by CRC Press. This book was released on 2018-10-08 with total page 856 pages. Available in PDF, EPUB and Kindle. Book excerpt: The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Download or read book Field Emission Scanning Electron Microscopy written by Nicolas Brodusch and published by Springer. This book was released on 2017-09-25 with total page 143 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage