Download or read book Digital Circuit Testing and Testability written by Parag K. Lala and published by Academic Press. This book was released on 1997 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt: An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Download or read book The Evolution of Fault Tolerant Computing written by A. Avizienis and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 467 pages. Available in PDF, EPUB and Kindle. Book excerpt: For the editors of this book, as well as for many other researchers in the area of fault-tolerant computing, Dr. William Caswell Carter is one of the key figures in the formation and development of this important field. We felt that the IFIP Working Group 10.4 at Baden, Austria, in June 1986, which coincided with an important step in Bill's career, was an appropriate occasion to honor Bill's contributions and achievements by organizing a one day "Symposium on the Evolution of Fault-Tolerant Computing" in the honor of William C. Carter. The Symposium, held on June 30, 1986, brought together a group of eminent scientists from all over the world to discuss the evolu tion, the state of the art, and the future perspectives of the field of fault-tolerant computing. Historic developments in academia and industry were presented by individuals who themselves have actively been involved in bringing them about. The Symposium proved to be a unique historic event and these Proceedings, which contain the final versions of the papers presented at Baden, are an authentic reference document.
Download or read book Spectral Techniques and Fault Detection written by Marg Karpovsky and published by Elsevier. This book was released on 2012-12-02 with total page 619 pages. Available in PDF, EPUB and Kindle. Book excerpt: Spectral Techniques and Fault Detection focuses on the spectral techniques for the analysis, testing, and design of digital devices. This book discusses the error detection and correction in digital devices. Organized into 10 chapters, this book starts with an overview of the concepts and tools to evaluate the applicability of various spectral approaches and fault-detection techniques to the design. This text then describes the class of generalized Programmable Logic Array configurations called Encoded PLAs. Other chapters consider the two-sided Chrestenson Transform to the analysis of some pattern properties. This book describes as well a certain type of cellular arrays for highly parallel processing, namely, three-dimensional arrays. The final chapter deals with the system design methods that allow and encourage designers to incorporate the necessary distributed error correction throughout any digital system. This book is a valuable resource for graduate students and engineers working in the fields of logic design, spectral techniques, testing, and self-testing of digital devices.
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1981 with total page 1370 pages. Available in PDF, EPUB and Kindle. Book excerpt: Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 531 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.
Download or read book Digital System Test and Testable Design written by Zainalabedin Navabi and published by Springer Science & Business Media. This book was released on 2010-12-10 with total page 452 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.
Download or read book VLSI Design written by Norman G. Einspruch and published by Academic Press. This book was released on 2014-12-01 with total page 213 pages. Available in PDF, EPUB and Kindle. Book excerpt: VLSI Electronics Microstructure Science, Volume 14: VLSI Design presents a comprehensive exposition and assessment of the developments and trends in VLSI (Very Large Scale Integration) electronics. This volume covers topics that range from microscopic aspects of materials behavior and device performance to the comprehension of VLSI in systems applications. Each article is prepared by a recognized authority. The subjects discussed in this book include VLSI processor design methodology; the RISC (Reduced Instruction Set Computer); the VLSI testing program; silicon compilers for VLSI; and specialized silicon compiler and programmable chip for language recognition. Scientists, engineers, researchers, device designers, and systems architects will find the book very useful.
Download or read book Journal of the Institution of Electronics and Telecommunication Engineers written by and published by . This book was released on 1989 with total page 402 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Abstracts and Technical Reviews written by United States. National Aeronautics and Space Administration. Office of Reliability and Quality Assurance and published by . This book was released on 1968 with total page 602 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book VLSI Testing written by Stanley Leonard Hurst and published by IET. This book was released on 1998 with total page 560 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR
Download or read book Architecture Design and Validation Methods written by Egon Börger and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 363 pages. Available in PDF, EPUB and Kindle. Book excerpt: This state-of-the-art survey gives a systematic presentation of recent advances in the design and validation of computer architectures. The book covers a comprehensive range of architecture design and validation methods, from computer aided high-level design of VLSI circuits and systems to layout and testable design, including the modeling and synthesis of behavior and dataflow, cell-based logic optimization, machine assisted verification, and virtual machine design.
Download or read book Abstracts the Transactions of the Institute of Electronics and Communication Engineers of Japan written by Denshi Tsūshin Gakkai and published by . This book was released on 1969 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1022 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Download or read book Large Scale Integration Digital Testing written by T. F. Leedy and published by . This book was released on 1979 with total page 52 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Computers and Data Processing Systems written by and published by . This book was released on 1962 with total page 488 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book NBS Technical Note written by and published by . This book was released on 1979-08 with total page 52 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Computer Mathematics Series II written by Geoffrey Knight and published by . This book was released on 1969 with total page 558 pages. Available in PDF, EPUB and Kindle. Book excerpt: General numerical and symbolic analysis; Elementary algebra; Calculus; Difference, differential and integral equations; Abstracts mathematics; Probability and statistics; Optimization mathematical programming: operations research; Mathematical communication theory: information theory; Mathematical systems and control theory; Mathematical logic and switching theory: automata.
