Download or read book Debug Automation from Pre Silicon to Post Silicon written by Mehdi Dehbashi and published by Springer. This book was released on 2014-09-25 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers. Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages; Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level; Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.

Download or read book Post Silicon Validation and Debug written by Prabhat Mishra and published by Springer. This book was released on 2018-09-01 with total page 394 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive coverage of System-on-Chip (SoC) post-silicon validation and debug challenges and state-of-the-art solutions with contributions from SoC designers, academic researchers as well as SoC verification experts. The readers will get a clear understanding of the existing debug infrastructure and how they can be effectively utilized to verify and debug SoCs.

Download or read book Debugging Systems on Chip written by Bart Vermeulen and published by Springer. This book was released on 2014-07-14 with total page 314 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes an approach and supporting infrastructure to facilitate debugging the silicon implementation of a System-on-Chip (SOC), allowing its associated product to be introduced into the market more quickly. Readers learn step-by-step the key requirements for debugging a modern, silicon SOC implementation, nine factors that complicate this debugging task, and a new debug approach that addresses these requirements and complicating factors. The authors’ novel communication-centric, scan-based, abstraction-based, run/stop-based (CSAR) debug approach is discussed in detail, showing how it helps to meet debug requirements and address the nine, previously identified factors that complicate debugging silicon implementations of SOCs. The authors also derive the debug infrastructure requirements to support debugging of a silicon implementation of an SOC with their CSAR debug approach. This debug infrastructure consists of a generic on-chip debug architecture, a configurable automated design-for-debug flow to be used during the design of an SOC, and customizable off-chip debugger software. Coverage includes an evaluation of the efficiency and effectiveness of the CSAR approach and its supporting infrastructure, using six industrial SOCs and an illustrative, example SOC model. The authors also quantify the hardware cost and design effort to support their approach.

Download or read book System on Chip Security written by Farimah Farahmandi and published by Springer Nature. This book was released on 2019-11-22 with total page 295 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes a wide variety of System-on-Chip (SoC) security threats and vulnerabilities, as well as their sources, in each stage of a design life cycle. The authors discuss a wide variety of state-of-the-art security verification and validation approaches such as formal methods and side-channel analysis, as well as simulation-based security and trust validation approaches. This book provides a comprehensive reference for system on chip designers and verification and validation engineers interested in verifying security and trust of heterogeneous SoCs.

Download or read book Electronic Design Automation for IC System Design Verification and Testing written by Luciano Lavagno and published by CRC Press. This book was released on 2017-12-19 with total page 644 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.

Download or read book Hardware and Software Verification and Testing written by Sharon Barner and published by Springer. This book was released on 2011-03-09 with total page 207 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the thoroughly refereed post-conference proceedings of the 6th International Haifa Verification Conference, HVC 2010, held in Haifa, Israel in October 2010. The 10 revised full papers presented together with 7 invited papers were carefully reviewed and selected from 30 submissions. The papers address all current issues, challenges and future directions of verification for hardware, software, and hybrid systems and have a research focus on hybrid methods and the migration of methods and ideas between hardware and software, static and dynamic analysis, pre- and post-silicon.

Download or read book Proceeding of Fifth International Conference on Microelectronics Computing and Communication Systems written by Vijay Nath and published by Springer Nature. This book was released on 2021-09-09 with total page 855 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents high-quality papers from the Fifth International Conference on Microelectronics, Computing & Communication Systems (MCCS 2020). It discusses the latest technological trends and advances in MEMS and nanoelectronics, wireless communication, optical communication, instrumentation, signal processing, image processing, bioengineering, green energy, hybrid vehicles, environmental science, weather forecasting, cloud computing, renewable energy, RFID, CMOS sensors, actuators, transducers, telemetry systems, embedded systems and sensor network applications. It includes papers based on original theoretical, practical and experimental simulations, development, applications, measurements and testing. The applications and solutions discussed here provide excellent reference material for future product development.

Download or read book Formal Verification written by Erik Seligman and published by Elsevier. This book was released on 2023-05-26 with total page 428 pages. Available in PDF, EPUB and Kindle. Book excerpt: Formal Verification: An Essential Toolkit for Modern VLSI Design, Second Edition presents practical approaches for design and validation, with hands-on advice to help working engineers integrate these techniques into their work. Formal Verification (FV) enables a designer to directly analyze and mathematically explore the quality or other aspects of a Register Transfer Level (RTL) design without using simulations. This can reduce time spent validating designs and more quickly reach a final design for manufacturing. Building on a basic knowledge of SystemVerilog, this book demystifies FV and presents the practical applications that are bringing it into mainstream design and validation processes. Every chapter in the second edition has been updated to reflect evolving FV practices and advanced techniques. In addition, a new chapter, Formal Signoff on Real Projects, provides guidelines for implementing signoff quality FV, completely replacing some simulation tasks with significantly more productive FV methods. After reading this book, readers will be prepared to introduce FV in their organization to effectively deploy FV techniques that increase design and validation productivity. Covers formal verification algorithms that help users gain full coverage without exhaustive simulation Helps readers understand formal verification tools and how they differ from simulation tools Shows how to create instant testbenches to gain insights into how models work and to find initial bugs Presents insights from Intel insiders who share their hard-won knowledge and solutions to complex design problems

Download or read book Combination of Trace and Scan Signals for Debuggability Enhancement in Post silicon Validation written by Kihyuk Han and published by . This book was released on 2013 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt: Pre-silicon verification is an essential part of integrated circuit design to capture functional design errors. Complex simulation, emulation and formal verification tools are used in a virtual environment before the device is manufactured in silicon. However, as the design complexity increases and the design cycle becomes shorter for fast time-to-market, design errors are more likely to escape from the pre-silicon verification and functional bugs are found during the actual operation. Since manufacturing test primarily focuses on the physical defects, post-silicon validation is the final gatekeeper to capture these escaped design bugs. Consequently, post-silicon validation has become a critical path in shortening the development cycle of System-On-Chip(SoC) design. A major challenge in post-silicon validation is the limited observability of internal states caused by the limited storage capacity available for silicon debugging. Since a post-silicon validation operates on a fabricated chip, recording the values of each and every internal signals is not possible. Due to this limitation of post-silicon validation, acquiring the circuit's internal behavior with the limited available resources is a very challenging task in post-silicon validation. There are two main categories to expand the observability: trace and scan signal based approaches. Real time system response during silicon debug can be acquired using a trace signal based technique; however due to the limited space for the trace buffer, the selection of the trace signals is very critical in maximizing the observability of the internal states. The scan based approach provides high observability and requires no additional design overhead; however the designers cannot acquire the real time system response since the circuit operation has to be stopped to transfer the internal states. Recent research has shown that observability can be enhanced if trace and scan signals can be efficiently combined together, compared to the other debugging scenarios where only trace signals are monitored. This dissertation proposes an enhanced and systematic algorithm for the efficient combination of trace and scan signals using restorability values to maximize the observability of internal circuit states. In order to achieve this goal, we first introduce a technique to calculate restorability values accurately by considering both local and global connectivity of the circuit. Based on these restorability values, the dynamic trace signal selection algorithm is proposed to provide a higher number of restored states regardless of the incoming test vectors. Instead of using total restorability values, we separate 0 and 1 restorability values to differentiate the different circuit responses to the different incoming test vectors. Also, the two groups of trace signals can be selected dynamically based on the characteristics of the incoming test vectors to minimize the performance degradation with respect to the different incoming test vectors. Second, we propose a new algorithm to find the optimal number of trace signals, when trace and scan signals are combined together for better observability. Our technique utilizes restorability values and finds the optimal number of trace signals so that the remaining space of trace buffer can be utilized for the scan signals. Observability can be enhanced further with data compression technique. Since the entries of the dictionary are determined from the golden simulation, a high compression ratio can be achieved with little extra hardware overhead. Experimental results on benchmark circuits and a real industry design show that the proposed technique provides a higher number of restored states compared to the existing techniques.

Download or read book VLSI Design and Test written by Brajesh Kumar Kaushik and published by Springer. This book was released on 2017-12-21 with total page 815 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

Download or read book Enhancing Silicon Debug Techniques Via DFD Hardware Insertion written by Joon Sung Yang and published by . This book was released on 2009 with total page 206 pages. Available in PDF, EPUB and Kindle. Book excerpt: As technology is advancing, larger and denser devices are being manufactured with shorter time to market requirements. Identifying and resolving problems in integrated circuits (ICs) are the main focus of the pre-silicon and post-silicon debug process. As indicated in the International Technology Roadmap for Semiconductors (ITRS), post-silicon debug is a major time consuming challenge that has significant impact on the development cycle of a new chip. Since it is difficult to acquire the internal signal values, conventional debug techniques typically involve performing a binary search for failing vectors and performing mechanical measurement with a probing needle. Silicon debug is a labor intensive task and requires much experience in validating the first silicon. Finding information about when (temporal) and where (spatial) failures occur is the key issue in post-silicon debug. Test vectors and test applications are run on first silicon to verify the functionality when it arrives. Scan chains and on-chip memories have been used to provide the valuable internal signal observation information for the silicon debug process. In this dissertation, a scan-based technique is presented to detect the circuit misbehavior without halting the system. A debugging technique that uses a trace buffer is introduced to efficiently store a series of data obtained by a two dimensional compaction technique. Debugging capability can be maximized by observing the right set of signals to observe. A method for an automated selection of signals to observe is proposed for efficient selection. Investigation in signal observability is further extended to signal controllability in test point insertion. Noble test point insertion techniques are presented to reduce the area overhead for test point insertion.

Download or read book Introduction to VLSI Design Flow written by Sneh Saurabh and published by Cambridge University Press. This book was released on 2023-06-09 with total page 983 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Comprehensive Functional Verification written by Bruce Wile and published by Elsevier. This book was released on 2005-05-26 with total page 702 pages. Available in PDF, EPUB and Kindle. Book excerpt: One of the biggest challenges in chip and system design is determining whether the hardware works correctly. That is the job of functional verification engineers and they are the audience for this comprehensive text from three top industry professionals.As designs increase in complexity, so has the value of verification engineers within the hardware design team. In fact, the need for skilled verification engineers has grown dramatically--functional verification now consumes between 40 and 70% of a project's labor, and about half its cost. Currently there are very few books on verification for engineers, and none that cover the subject as comprehensively as this text. A key strength of this book is that it describes the entire verification cycle and details each stage. The organization of the book follows the cycle, demonstrating how functional verification engages all aspects of the overall design effort and how individual cycle stages relate to the larger design process. Throughout the text, the authors leverage their 35 plus years experience in functional verification, providing examples and case studies, and focusing on the skills, methods, and tools needed to complete each verification task. Comprehensive overview of the complete verification cycle Combines industry experience with a strong emphasis on functional verification fundamentals Includes real-world case studies

Download or read book Multi Core Embedded Systems written by Georgios Kornaros and published by CRC Press. This book was released on 2018-10-08 with total page 421 pages. Available in PDF, EPUB and Kindle. Book excerpt: Details a real-world product that applies a cutting-edge multi-core architecture Increasingly demanding modern applications—such as those used in telecommunications networking and real-time processing of audio, video, and multimedia streams—require multiple processors to achieve computational performance at the rate of a few giga-operations per second. This necessity for speed and manageable power consumption makes it likely that the next generation of embedded processing systems will include hundreds of cores, while being increasingly programmable, blending processors and configurable hardware in a power-efficient manner. Multi-Core Embedded Systems presents a variety of perspectives that elucidate the technical challenges associated with such increased integration of homogeneous (processors) and heterogeneous multiple cores. It offers an analysis that industry engineers and professionals will need to understand the physical details of both software and hardware in embedded architectures, as well as their limitations and potential for future growth. Discusses the available programming models spread across different abstraction levels The book begins with an overview of the evolution of multiprocessor architectures for embedded applications and discusses techniques for autonomous power management of system-level parameters. It addresses the use of existing open-source (and free) tools originating from several application domains—such as traffic modeling, graph theory, parallel computing and network simulation. In addition, the authors cover other important topics associated with multi-core embedded systems, such as: Architectures and interconnects Embedded design methodologies Mapping of applications

Download or read book A Reconfigurable Post silicon Debug Infrastructure for Systems on chip written by and published by . This book was released on 2008 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: As the level of integrated circuit (IC) complexity continues to increase, the post-silicon validation stage is becoming a large component of the overall development cost. To address this, we propose a reconfigurable post-silicon debug infrastructure that enhances the post-silicon validation process by enabling the observation and control of signals that are internal to the manufactured device. The infrastructure is composed of dedicated programmable logic and programmable access networks. Our reconfigurable infrastructure enables not only the diagnoses of bugs; it also allows the detection and potential correction of errors in normal operation. In this thesis we describe the architecture, implementation and operation of our new infrastructure. Furthermore, we identify and address three key challenges arising from the implementation of this infrastructure. Our results demonstrate that it is possible to implement an effective reconfigurable post-silicon infrastructure that is able to observe and control circuits operating at full speed, with an area overhead of between 5% and 10% for many of our target ICs.

Download or read book On Chip Instrumentation written by Neal Stollon and published by Springer Science & Business Media. This book was released on 2010-12-06 with total page 246 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an in-depth overview of on chip instrumentation technologies and various approaches taken in adding instrumentation to System on Chip (ASIC, ASSP, FPGA, etc.) design that are collectively becoming known as Design for Debug (DfD). On chip instruments are hardware based blocks that are added to a design for the specific purpose and improving the visibility of internal or embedded portions of the design (specific instruction flow in a processor, bus transaction in an on chip bus as examples) to improve the analysis or optimization capabilities for a SoC. DfD is the methodology and infrastructure that surrounds the instrumentation. Coverage includes specific design examples and discussion of implementations and DfD tradeoffs in a decision to design or select instrumentation or SoC that include instrumentation. Although the focus will be on hardware implementations, software and tools will be discussed in some detail.

Download or read book Proceedings of the 11th International Conference on Robotics Vision Signal Processing and Power Applications written by Nor Muzlifah Mahyuddin and published by Springer Nature. This book was released on 2022-02-11 with total page 1124 pages. Available in PDF, EPUB and Kindle. Book excerpt: The proceeding is a collection of research papers presented at the 11th International Conference on Robotics, Vision, Signal Processing & Power Applications (RoViSP 2021). The theme of RoViSP 2021 “Enhancing Research and Innovation through the Fourth Industrial Revolution (IR 4.0)” served as a platform for researchers, scientists, engineers, academicians as well as industrial professionals from all around the globe to present and exchange their research findings and development activities through oral presentations. The book covers various topics of interest, including: Robotics, Control, Mechatronics and Automation Telecommunication Systems and Applications Electronic Design and Applications Vision, Image and Signal Processing Electrical Power, Energy and Industrial Applications Computer and Information Technology Biomedical Engineering and Applications Intelligent Systems Internet-of-things Mechatronics Mobile Technology