Download or read book Data Compression Techniques for Concurrent Error Detection and Built in Self Test written by Steffen Tarnick and published by . This book was released on 1995 with total page 318 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book New Methods of Concurrent Checking written by Michael Gössel and published by Springer Science & Business Media. This book was released on 2008-04-26 with total page 186 pages. Available in PDF, EPUB and Kindle. Book excerpt: Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers? Are computers always reliable? Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking? Besides permanent faults, many temporary or transient faults are also to be expected.
Download or read book Spectral Techniques and Fault Detection written by Marg Karpovsky and published by Elsevier. This book was released on 2012-12-02 with total page 619 pages. Available in PDF, EPUB and Kindle. Book excerpt: Spectral Techniques and Fault Detection focuses on the spectral techniques for the analysis, testing, and design of digital devices. This book discusses the error detection and correction in digital devices. Organized into 10 chapters, this book starts with an overview of the concepts and tools to evaluate the applicability of various spectral approaches and fault-detection techniques to the design. This text then describes the class of generalized Programmable Logic Array configurations called Encoded PLAs. Other chapters consider the two-sided Chrestenson Transform to the analysis of some pattern properties. This book describes as well a certain type of cellular arrays for highly parallel processing, namely, three-dimensional arrays. The final chapter deals with the system design methods that allow and encourage designers to incorporate the necessary distributed error correction throughout any digital system. This book is a valuable resource for graduate students and engineers working in the fields of logic design, spectral techniques, testing, and self-testing of digital devices.
Download or read book Evaluation of Concurrent Error Detection in Microprogrammed Control Units written by Argirios Bailas and published by . This book was released on 1989 with total page 416 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Hybrid Code Based Test Data Compression and Decompression for VLSI Circuits written by Kalamani Chinnappa Gounder and published by GRIN Verlag. This book was released on 2018-06-27 with total page 217 pages. Available in PDF, EPUB and Kindle. Book excerpt: Doctoral Thesis / Dissertation from the year 2018 in the subject Computer Science - Applied, grade: 6, Anna University, course: PhD, language: English, abstract: Test data compression is an effective method for reducing test data volume and memory requirement with relatively small cost. An effective test structure for embedded hard cores is easy to implement and it is also capable of producing high-quality tests as part of the design flow. The purpose of Test data compression intends to reduce Test data volume by using Test Stimulus Compression such as Code-based schemes, Linear-decompression-based schemes and Broadcast-scan-based schemes. The research work addresses the problem of the test data volume and memory requirements. The primary objective of this study is to introduce novel techniques that improve the compression ratio by reducing test data volume during at-speed test in scan designs. This in turn diminishes the tester memory requirement and hence chip area is reduced for Built-in-Self Test environment. The aim of this research is to introduce various compression algorithms by combining the existing data compression techniques. The algorithms are designed to reduce the volume of test patterns of input that is essential to guarantee an acceptable level of fault coverage which is a key parameter to evaluate the quality of testing.
Download or read book Asian Test Symposium written by and published by . This book was released on 2002 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Digital Circuit Testing written by Francis C. Wong and published by Elsevier. This book was released on 2012-12-02 with total page 248 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Download or read book Design and Test Technology for Dependable Systems on chip written by Raimund Ubar and published by IGI Global. This book was released on 2011-01-01 with total page 550 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Download or read book Proceedings written by and published by . This book was released on 2003 with total page 632 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of the Seventh International Symposium on High level Synthesis written by International Symposium on High-Level Synthesis and published by . This book was released on 1994 with total page 192 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Electrical Electronics Abstracts written by and published by . This book was released on 1997 with total page 1904 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Science Abstracts written by and published by . This book was released on 1995 with total page 1360 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Advances in Computers and Software Engineering Reviews Vol 2 written by Sergey Yurish and published by Lulu.com. This book was released on 2020-02-04 with total page 256 pages. Available in PDF, EPUB and Kindle. Book excerpt: The second volume of 'Advances in Computers and Software Engineering: Reviews' Book Series contains five chapters written by 10 authors from 4 countries: Canada, China, Italy and UK.This book ensures that our readers will stay at the cutting edge of the field and get the right and effective start point and road map for the further researches and developments. By this way, they will be able to save more time for productive research activity and eliminate routine work. With this unique combination of information in each volume, the 'Advances in Computers and Software Engineering: Reviews' will be of value for scientists and engineers in appropriate industry and at universities.
Download or read book Proceedings of the Midwest Symposium on Circuits and Systems written by and published by . This book was released on 1994 with total page 870 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Journal of VLSI and Computer Systems written by and published by . This book was released on 1983 with total page 576 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Index to IEEE Publications written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1998 with total page 1234 pages. Available in PDF, EPUB and Kindle. Book excerpt: Issues for 1973- cover the entire IEEE technical literature.
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 1999 with total page 542 pages. Available in PDF, EPUB and Kindle. Book excerpt:
