Download or read book Current Trends in Optical and X ray Metrology of Advanced Materials for Nanoscale Devices III written by and published by . This book was released on 2013 with total page 141 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Current Trends in Optical and X ray Metrology of Advanced Materials for Nanoscale Devices written by Bernard Servet and published by . This book was released on 2010 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Current trends in optical and X ray metrology of advanced materials for nanoscale devices written by and published by . This book was released on 2006 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Die Schriften 1 9 und 11 der chronologischen Reihenfolge written by and published by . This book was released on 1956 with total page 71 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of the EMRS 2007 Fall Meeting Symposium H Current Trends in Optical and X Ray Metrology of Advanced Materials and Devices II written by Bernard Servet and published by . This book was released on 2008 with total page 6 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of Symposium M on Optical and X ray Metrology for Advanced Device Materials Characterization written by D. Chateigner and published by . This book was released on 2004 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book X Ray Metrology in Semiconductor Manufacturing written by D. Keith Bowen and published by CRC Press. This book was released on 2018-10-03 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems. Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text. Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput.
Download or read book Development and Characterization of a Dispersion Encoded Method for Low Coherence Interferometry written by Christopher Taudt and published by Springer Nature. This book was released on 2021-11-16 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Open Access book discusses an extension to low-coherence interferometry by dispersion-encoding. The approach is theoretically designed and implemented for applications such as surface profilometry, polymeric cross-linking estimation and the determination of thin-film layer thicknesses. During a characterization, it was shown that an axial measurement range of 79.91 μm with an axial resolution of 0.1 nm is achievable. Simultaneously, profiles of up to 1.5 mm in length were obtained in a scan-free manner. This marked a significant improvement in relation to the state-of-the-art in terms of dynamic range. Also, the axial and lateral measurement range were decoupled partially while functional parameters such as surface roughness were estimated. The characterization of the degree of polymeric cross-linking was performed as a function of the refractive index. It was acquired in a spatially-resolved manner with a resolution of 3.36 x 10-5. This was achieved by the development of a novel mathematical analysis approach.
Download or read book Proceedings of Symposium M on Optical and X Ray Metrology for Advanced Device Materials Characterization of the E MRS 2003 Spring Conference written by Daniel Chateigner and published by . This book was released on 2004 with total page 231 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Industrial Ceramics written by and published by . This book was released on 2003 with total page 660 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of Symposium M on Optical and X Ray Metrology for Advanced Device Materials Characterization of the E MRS 2003 Spring Conference written by and published by . This book was released on 2004 with total page 231 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Electrical Electronics Abstracts written by and published by . This book was released on 1995 with total page 1576 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Materials Characterization Using Nondestructive Evaluation NDE Methods written by Gerhard Huebschen and published by Woodhead Publishing. This book was released on 2016-03-23 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt: Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. - Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques - Reviews the determination of microstructural and mechanical properties - Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries - Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Download or read book The Oxford Handbook of Archaeological Ceramic Analysis written by Alice M. W. Hunt and published by Oxford University Press. This book was released on 2017 with total page 777 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume draws together topics and methodologies essential for the socio-cultural, mineralogical, and geochemical analysis of archaeological ceramic, one of the most complex and ubiquitous archaeomaterials in the archaeological record. It provides an invaluable resource for archaeologists, anthropologists, and archaeological materials scientists.
Download or read book The Cumulative Book Index written by and published by . This book was released on 1997 with total page 2312 pages. Available in PDF, EPUB and Kindle. Book excerpt: A world list of books in the English language.
Download or read book Directory of Published Proceedings written by and published by . This book was released on 2002 with total page 246 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book International Books in Print written by and published by . This book was released on 1998 with total page 1332 pages. Available in PDF, EPUB and Kindle. Book excerpt:
