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Book Cost Effective Error Detection for SoC Validation and Online Testing

Download or read book Cost Effective Error Detection for SoC Validation and Online Testing written by Ming Gao and published by . This book was released on 2012 with total page 171 pages. Available in PDF, EPUB and Kindle. Book excerpt: Error detection is the vital component of the quality assurance tasks during the life time of an integrated circuit to avoid costly in-field failures and massive product recall. Nevertheless, sufficiently thorough error checking requires the development of high quality tests and on-chip checkers that can themselves be very expensive. How to detect all the errors while minimizing the cost remains one of the most challenging and critical questions for the semiconductor research community. This dissertation attempts to address this issue by proposing several cost effective error detection techniques targeting the stages of post-silicon validation and online testing. First, a time-multiplexed checking scheme is proposed to accommodate on-chip hardware checkers with low overhead. The same hardware resource for checker implementation can be used as a design-for-debug (DfD) structure for post-silicon debugging and later reused as a design-for-testability (DfT) resource during online testing. Case studies and mathematical analyses demonstrates the schemes provide high error coverage and a significant reduction in chip area and power overhead for on-chip checkers at the cost of increased fault detection latency. Second, a series of test evaluation metrics are proposed based on error models of electrical bugs and data mining based fault-model-free approach. Experimental results demonstrate that the intelligent navigation of validation test plan based on relevant bug model or knowledge mined from post-silicon test data can prioritize those tests capable of uncovering more silicon timing errors, resulting in significant reduction of validation time and effort.

Book Design methodology for cost effective internal error detection

Download or read book Design methodology for cost effective internal error detection written by Sanjay Ramnath and published by . This book was released on 2000 with total page 54 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book System Level Validation

    Book Details:
  • Author : Springer
  • Publisher :
  • Release : 2012-09-26
  • ISBN : 9781461413608
  • Pages : 272 pages

Download or read book System Level Validation written by Springer and published by . This book was released on 2012-09-26 with total page 272 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Index to Scientific   Technical Proceedings

Download or read book Index to Scientific Technical Proceedings written by and published by . This book was released on 1979-07 with total page 594 pages. Available in PDF, EPUB and Kindle. Book excerpt: Monthly, with annual cumulation. Published conference literature useful both as current awareness and retrospective tools that allow searching by authors of individual papers as well as by editors. Includes proceedings in all formats, i.e., books, reports, journal issues, etc. Complete bibliographical information for each conference proceedings appears in section titled Contents of proceedings, with accompanying category, permuterm subject, sponsor, author/editor, meeting location, and corporate indexes. Contains abbreviations used in organizational and geographical names.

Book Electrical   Electronics Abstracts

Download or read book Electrical Electronics Abstracts written by and published by . This book was released on 1997 with total page 2240 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book 19th IEEE VLSI Test Symposium

Download or read book 19th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2001 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.

Book IEEE VLSI Test Symposium

Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2001 with total page 464 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Post silicon Validation and Debug

Download or read book Post silicon Validation and Debug written by Prabhat Mishra and published by . This book was released on 2019 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive coverage of System-on-Chip (SoC) post-silicon validation and debug challenges and state-of-the-art solutions with contributions from SoC designers, academic researchers as well as SoC verification experts. The readers will get a clear understanding of the existing debug infrastructure and how they can be effectively utilized to verify and debug SoCs. Provides a comprehensive overview of the SoC post-silicon validation and debug challenges; Covers state-of-the-art techniques for developing on-chip debug infrastructure; Describes automated techniques for generating post-silicon tests and assertions to enable effective post-silicon debug and coverage analysis; Covers scalable post-silicon validation and bug localization using a combination of simulation-based techniques and formal methods; Presents case studies for post-silicon debug of industrial SoC designs.

Book Computerworld

    Book Details:
  • Author :
  • Publisher :
  • Release : 1987-10-26
  • ISBN :
  • Pages : 164 pages

Download or read book Computerworld written by and published by . This book was released on 1987-10-26 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: For more than 40 years, Computerworld has been the leading source of technology news and information for IT influencers worldwide. Computerworld's award-winning Web site (Computerworld.com), twice-monthly publication, focused conference series and custom research form the hub of the world's largest global IT media network.

Book Computers at Risk

    Book Details:
  • Author : National Research Council
  • Publisher : National Academies Press
  • Release : 1990-02-01
  • ISBN : 0309043883
  • Pages : 320 pages

Download or read book Computers at Risk written by National Research Council and published by National Academies Press. This book was released on 1990-02-01 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: Computers at Risk presents a comprehensive agenda for developing nationwide policies and practices for computer security. Specific recommendations are provided for industry and for government agencies engaged in computer security activities. The volume also outlines problems and opportunities in computer security research, recommends ways to improve the research infrastructure, and suggests topics for investigators. The book explores the diversity of the field, the need to engineer countermeasures based on speculation of what experts think computer attackers may do next, why the technology community has failed to respond to the need for enhanced security systems, how innovators could be encouraged to bring more options to the marketplace, and balancing the importance of security against the right of privacy.

Book Trends in Data Engineering Methods for Intelligent Systems

Download or read book Trends in Data Engineering Methods for Intelligent Systems written by Jude Hemanth and published by Springer Nature. This book was released on 2021-07-05 with total page 797 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book briefly covers internationally contributed chapters with artificial intelligence and applied mathematics-oriented background-details. Nowadays, the world is under attack of intelligent systems covering all fields to make them practical and meaningful for humans. In this sense, this edited book provides the most recent research on use of engineering capabilities for developing intelligent systems. The chapters are a collection from the works presented at the 2nd International Conference on Artificial Intelligence and Applied Mathematics in Engineering held within 09-10-11 October 2020 at the Antalya, Manavgat (Turkey). The target audience of the book covers scientists, experts, M.Sc. and Ph.D. students, post-docs, and anyone interested in intelligent systems and their usage in different problem domains. The book is suitable to be used as a reference work in the courses associated with artificial intelligence and applied mathematics.

Book Digital Phenotyping Digital Biomarkers to Monitor Psychiatric Disorders

Download or read book Digital Phenotyping Digital Biomarkers to Monitor Psychiatric Disorders written by Jennifer H. Barnett and published by Frontiers Media SA. This book was released on 2022-08-29 with total page 200 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Index Medicus

Download or read book Index Medicus written by and published by . This book was released on 2004 with total page 2164 pages. Available in PDF, EPUB and Kindle. Book excerpt: Vols. for 1963- include as pt. 2 of the Jan. issue: Medical subject headings.

Book VLSI SoC  Forward Looking Trends in IC and Systems Design

Download or read book VLSI SoC Forward Looking Trends in IC and Systems Design written by Jose L. Ayala and published by Springer. This book was released on 2012-02-24 with total page 364 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains extended and revised versions of the best papers presented at the 18th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2010, held in Madrid, Spain, in September 2010. The 14 papers included in the book were carefully reviewed and selected from the 52 full papers presented at the conference. The papers cover a wide variety of excellence in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.

Book Cumulated Index Medicus

Download or read book Cumulated Index Medicus written by and published by . This book was released on 1999 with total page 1860 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Aging Research and Practices in Malaysia

Download or read book Aging Research and Practices in Malaysia written by Tengku Aizan Hamid and published by Frontiers Media SA. This book was released on 2022-07-28 with total page 219 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Computer   Control Abstracts

Download or read book Computer Control Abstracts written by and published by . This book was released on 1996 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: