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Book Correction Factor Tables for Four point Probe Resistivity Measurements on Thin  Circular Semiconductor Samples

Download or read book Correction Factor Tables for Four point Probe Resistivity Measurements on Thin Circular Semiconductor Samples written by Lydon J. Swartzendruber and published by . This book was released on 1964 with total page 48 pages. Available in PDF, EPUB and Kindle. Book excerpt: Extensive tables of the geometrical correction factors for four-point probe resistivity measurements on thin, circular semiconductor samples with all surfaces insulating are given, (1) for an in-line probe array displaced radially with points along a diameter, (2) for an in-line probe array displaced radially with the line of points perpendicular to a diameter, and (3) for a displaced square probe array.(Author).

Book Correction Factor Tables for Four point Probe Resistivity Measurements on Thin  Circular Semiconductor Samples

Download or read book Correction Factor Tables for Four point Probe Resistivity Measurements on Thin Circular Semiconductor Samples written by Lydon J. Swartzendruber and published by . This book was released on 1964 with total page 46 pages. Available in PDF, EPUB and Kindle. Book excerpt: Extensive tables of the geometrical correction factors for four-point probe resistivity measurements on thin, circular semiconductor samples with all surfaces insulating are given, (1) for an in-line probe array displaced radially with points along a diameter, (2) for an in-line probe array displaced radially with the line of points perpendicular to a diameter, and (3) for a displaced square probe array.(Author).

Book Correction Factor Tables for Four point Probe Resistivity Measurements on Thin  Circular Semiconductor Samples

Download or read book Correction Factor Tables for Four point Probe Resistivity Measurements on Thin Circular Semiconductor Samples written by United States. National Bureau of Standards and published by . This book was released on 1964 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Publications of the National Bureau of Standards

Download or read book Publications of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1967 with total page 772 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Publications   United States  National Bureau of Standards

Download or read book Publications United States National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1960 with total page 776 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Publications  July 1960 Through June 1966

Download or read book Publications July 1960 Through June 1966 written by United States. National Bureau of Standards and published by . This book was released on 1967 with total page 770 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Journal of Research of the National Bureau of Standards

Download or read book Journal of Research of the National Bureau of Standards written by and published by . This book was released on 1964 with total page 354 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Journal of Research of the National Bureau of Standards

Download or read book Journal of Research of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1977 with total page 1046 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Journal of Research

    Book Details:
  • Author : United States. National Bureau of Standards
  • Publisher :
  • Release : 1963
  • ISBN :
  • Pages : 744 pages

Download or read book Journal of Research written by United States. National Bureau of Standards and published by . This book was released on 1963 with total page 744 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Semiconductor Measurement Technology

Download or read book Semiconductor Measurement Technology written by Institute for Applied Technology (U.S.). Electronic Technology Division and published by . This book was released on 1973 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Semiconductor Measurement Technology

Download or read book Semiconductor Measurement Technology written by États-Unis. National bureau of standards (1901-1988). and published by . This book was released on 1974 with total page 76 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Measurement techniques for high power semiconductor materials and devices

Download or read book Measurement techniques for high power semiconductor materials and devices written by and published by . This book was released on 1978 with total page 96 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Measurement Techniques for High Power Semiconductor Materials and Devices

Download or read book Measurement Techniques for High Power Semiconductor Materials and Devices written by Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division and published by . This book was released on 1978 with total page 92 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book NBS Technical Note

Download or read book NBS Technical Note written by and published by . This book was released on 1971-10 with total page 60 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book An Automated Photovoltaic System for the Measurement of Resistivity Variations  in High resistivity Circular Silicon Slices

Download or read book An Automated Photovoltaic System for the Measurement of Resistivity Variations in High resistivity Circular Silicon Slices written by David L. Blackburn and published by . This book was released on 1979 with total page 48 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Handbook of Silicon Semiconductor Metrology

Download or read book Handbook of Silicon Semiconductor Metrology written by Alain C. Diebold and published by CRC Press. This book was released on 2001-06-29 with total page 703 pages. Available in PDF, EPUB and Kindle. Book excerpt: Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay