Download or read book Estimation of Parameters in a Transient Markov Chain Arising in a Reliability Growth Model written by Bernard Charles Sherman and published by . This book was released on 1969 with total page 60 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Technical Report research Paper written by and published by . This book was released on 1967 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Technical Abstract Bulletin written by and published by . This book was released on with total page 760 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reliability Abstracts and Technical Reviews written by and published by . This book was released on 1966 with total page 556 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Government wide Index to Federal Research Development Reports written by and published by . This book was released on 1966 with total page 1086 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Recent Advances in Life Testing and Reliability written by N. Balakrishnan and published by CRC Press. This book was released on 2023-07-21 with total page 662 pages. Available in PDF, EPUB and Kindle. Book excerpt: This unique volume presents chapters written on the areas of life-testing and reliability by many well-known researchers who have contributed significantly to these two areas over the years. Chapters cover a wide range of topics such as inference under censoring and truncation, reliability growth models, designs to improve quality, prediction techniques, Bayesian analysis of reliability, multivariate methods, accelerated testing, and more. The book is written in an easy-to-follow style, first presenting the necessary theoretical details and then illustrating the methods with a numerical examples wherever possible. Many tables and graphs that are essential for the use of some of the new methodologies are presented throughout the volume. Numerous examples provide the reader with a clear understanding of the methods presented as well as with insight into the applications of these results.

Download or read book Frontiers Of Reliability written by Asit P Basu and published by World Scientific. This book was released on 1998-07-31 with total page 448 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume presents recent results in reliability theory by leading experts in the world. It will prove valuable for researchers, and users of reliability theory. It consists of refereed invited papers on a broad spectrum of topics in reliability. The subjects covered include Bayesian reliability, Bayesian reliability modeling, confounding in a series system, DF tests, Edgeworth approximation to reliability, estimation under random censoring, fault tree reduction for reliability, inference about changes in hazard rates, information theory and reliability, mixture experiment, mixture of Weibull distributions, queuing network approach in reliability theory, reliability estimation, reliability modeling, repairable systems, residual life function, software spare allocation systems, stochastic comparisons, stress-strength models, system-based component test plans, and TTT-transform.

Download or read book OAR Quarterly Index of Current Research Results written by United States. Air Force. Office of Aerospace Research and published by . This book was released on 1965 with total page 576 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book U S Government Research Development Reports written by and published by . This book was released on 1966-11 with total page 1014 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Confidence Intervals for the Reliability Correction Factor written by and published by . This book was released on 1967 with total page 604 pages. Available in PDF, EPUB and Kindle. Book excerpt: Whenever extensive test data collected under non-environmental conditions must be used to infer results valid under environmental conditions, the problem of estimation of a correction factor to transform non-environmental results into environmental ones will arise. The ratio of mean times under environmental and non-environmental conditions was termed the K-factor. This report presents a solution to the problem of building exact confidence intervals for the K-factor for the case when time is measured in cycles. This was the remaining open question in the problem of point and interval estimation of the K-factor.

Download or read book OAR Cumulative Index of Research Results written by United States. Air Force. Office of Aerospace Research and published by . This book was released on 1965 with total page 586 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Annals of Mathematical Statistics written by and published by . This book was released on 1971 with total page 1106 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book U S Government Research and Development Reports written by and published by . This book was released on 1965 with total page 1776 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book OAR Cumulative Index of Research Results written by and published by . This book was released on with total page 576 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1989 with total page 968 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Designing Engineering Experiments written by University of Michigan. Engineering Summer Conferences and published by . This book was released on 1988 with total page 792 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reliability Yield and Stress Burn In written by Way Kuo and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 407 pages. Available in PDF, EPUB and Kindle. Book excerpt: The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: • the economic impact of employing the microelectronics fabricated by in dustry, • a study of the relationship between reliability and yield, • the progression toward miniaturization and higher reliability, and • the correctness and complexity of new system designs, which include a very significant portion of software.