Download or read book Concurrent error detection and testing for large PLA s written by Stanford University. Computer Systems Laboratory and published by . This book was released on 1981 with total page 35 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book New Methods of Concurrent Checking written by Michael Gössel and published by Springer Science & Business Media. This book was released on 2008-04-26 with total page 186 pages. Available in PDF, EPUB and Kindle. Book excerpt: Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers? Are computers always reliable? Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking? Besides permanent faults, many temporary or transient faults are also to be expected.

Download or read book Evaluation of a Design for Concurrent Error Detection and Testability in Large Storrage Logic Arrays written by Thomas Brian Maciukenas and published by . This book was released on 1993 with total page 66 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Design for Concurrent Error Detection and Testability in Large Storage logic Arrays written by Howard Victor Savin and published by . This book was released on 1988 with total page 68 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Concurrent Simultaneous Engineering Systems written by Hans-Jörg Bullinger and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 399 pages. Available in PDF, EPUB and Kindle. Book excerpt: Competitive edge in today's world markets can only be achieved by an integrated approach to manufacturing. Concurrent or Simultaneous Engineering offers the promise of a reduced product development cycle, using complex technologies to satisfy customer demand for high quality, competitively-priced products brought to market in minimum time. The CONSENS implementation of Concurrent/Simultaneous Engineering (CSE) is an integrated package developed over recent years by some of the leading manufacturers and research institutes in Europe. It is the product of the flagship EU research project into the use of IT in Manufacturing led by the Fraunhofer Institute in Stuttgart. In particular, this study describes the management of change, network organisation, CONSENS architecture and module integration, SiFrame Management Information System, design for CSE and industrial implementations of CONSENS.

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 602 pages. Available in PDF, EPUB and Kindle. Book excerpt: Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.

Download or read book Data Compression Techniques for Concurrent Error Detection and Built in Self Test written by Steffen Tarnick and published by . This book was released on 1995 with total page 318 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Concurrent Structural Error Detection for Software written by Jeffrey Gerard Hoefer and published by . This book was released on 1987 with total page 66 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Concurrent Error Detection Techniques Using Parity written by Gnanasekaran Swaminathan and published by . This book was released on 1989 with total page 182 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Efficient Concurrent Error Detection in PLAs and ROMs written by Chien-Yi Chen and published by . This book was released on 1985 with total page 86 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Concurrent Error Detection written by Steven Scott Gorshe and published by . This book was released on 2002 with total page 246 pages. Available in PDF, EPUB and Kindle. Book excerpt: Concurrent error detection (CED) is the detection of errors or faults in a circuit or data path concurrent with normal operation of that circuit. The general approach for CED is to calculate a check symbol for the inputs to the circuit under operation, predict the check symbol that will result for the output of the circuit for those inputs, and compare the predicted check symbol to the one that is actually calculated for the output. If the predicted and actual check symbols are different, an error or fault has been detected. The alternative to this check symbol prediction is to use a second copy of the circuit under operation and compare the results of the two circuits. For some classes of circuits the prediction of the output check symbol can require less circuitry than a second copy of the circuit being tested. Four examples of these types of circuits are examined in this dissertation: Arithmetic Logic Units (ALUs), array multipliers, self-synchronous scrambler-descrambler pairs with their intervening data path, and switch fabrics. Faults in integrated circuits tend to produce unidirectional errors. Unidirectional errors are those in which all of the errors are in the same direction (e.g., 0 to 1 errors) within the block of data covered by a given check symbol. For this reason, codes that are optimized for unidirectional errors are the focus of investigation for most of the applications. In particular, the Bose-Lin codes are examined for those applications where unidirectional errors are expected to be typical. In order to examine the performance of the Bose-Lin codes in one of these applications, it was necessary to determine the theoretical performance for Bose- Lin codes for error rates beyond what had been previously studied. This analysis of Bose-Lin codes with large numbers of "burst" errors also included a further generalization of the codes.

Download or read book An architecture for low cost concurrent error detection using continuous signature monitoring written by Kent Douglas Wilken and published by . This book was released on 1990 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Design of Systems with Concurrent Error Detection Using Software Redundancy written by Kien Anh Hua and published by . This book was released on 1987 with total page 236 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Concurrent Error Detection in Arithmetic and Logic Units written by Leona Yuk-Ye Fung and published by . This book was released on 1982 with total page 126 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Concurrent Error Detection in Finite Field Arithmetic Operations written by Siavash Bayat-Sarmadi and published by . This book was released on 2008 with total page 175 pages. Available in PDF, EPUB and Kindle. Book excerpt: With significant advances in wired and wireless technologies and also increased shrinking in the size of VLSI circuits, many devices have become very large because they need to contain several large units. This large number of gates and in turn large number of transistors causes the devices to be more prone to faults. These faults specially in sensitive and critical applications may cause serious failures and hence should be avoided. On the other hand, some critical applications such as cryptosystems may also be prone to deliberately injected faults by malicious attackers. Some of these faults can produce erroneous results that can reveal some important secret information of the cryptosystems. Furthermore, yield factor improvement is always an important issue in VLSI design and fabrication processes. Digital systems such as cryptosystems and digital signal processors usually contain finite field operations. Therefore, error detection and correction of such operations have become an important issue recently. In most of the work reported so far, error detection and correction are applied using redundancies in space (hardware), time, and/or information (coding theory). In this work, schemes based on these redundancies are presented to detect errors in important finite field arithmetic operations resulting from hardware faults. Finite fields are used in a number of practical cryptosystems and channel encoders/decoders. The schemes presented here can detect errors in arithmetic operations of finite fields represented in different bases, including polynomial, dual and/or normal basis, and implemented in various architectures, including bit-serial, bit-parallel and/or systolic arrays.

Download or read book Cost effective Approach for Concurrent Error Detection Based on the Parity of Outputs and Internal Nodes written by Sung-Eun Byun and published by . This book was released on 2007 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Diversity Techniques for Concurrent Error Detection written by Subhasish Mitra and published by . This book was released on 2000 with total page 418 pages. Available in PDF, EPUB and Kindle. Book excerpt: