Download or read book Checking Experiments in Sequential Machines written by Asok Bhattacharyya and published by . This book was released on 1989 with total page 155 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Optimal Checking Experiments for Sequential Machines written by Edward Po Chiu Hsieh and published by . This book was released on 1969 with total page 197 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Checking Experiments for Incompletely Specified Sequential Machines written by Paul L. Hoke and published by . This book was released on 1974 with total page 107 pages. Available in PDF, EPUB and Kindle. Book excerpt: Methods are given for designing checking experiments for incompletely specified sequential machines (ISSM's). The methods closely parallel the methods of designing checking experiments for completely specified sequential machines (CSSM's). Therefore, the basic concepts of all the important published methods of designing checking experiments for CSSM's are summarized and referenced. These concepts are modified where necessary and are then applied to ISSM's to find checking (sequences) experiments. To verify the proposed checking experiment the I/O sequence is reduced to the original machine by one of several machine identification algorithms which are also shown and referenced. (Author).
Download or read book The Design of Fault Detection Experiments for Sequential Machines Using Homogeneous Distinguishing Sequences written by John Douglas Holt and published by . This book was released on 1975 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt: The design of checking experiments for sequential machines which do not initially have a distinguishing sequence is investigated. Improvem, Jnts are suggested to an existing method for augmenting the output logic so that the machine acquires homogeneous distinguishing sequences. To indicate how the procedure may be implemented on a computer, elements of graph theory are applied to the design steps. A systematic process for the construction of the checking experiment using homogeneous distinguishing sequences is described. Upper and lower bounds for each segment of the experiment are derived.
Download or read book Checking Experiments for Incompletely Specified Sequential Machines written by Paul L. Hoke (CAPT, USAF.) and published by . This book was released on 1974 with total page 190 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Regular Expressions and Checking Experiments for Sequential Machines written by Wilfred L. Crossman and published by . This book was released on 1971 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Analysis and Checking Experiment of 2 way Sequential Machines written by Shih-Jeh Chang and published by . This book was released on 1972 with total page 102 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Checking Experiments for Output Faults written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1972 with total page 64 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Digital Circuit Testing and Testability written by Parag K. Lala and published by Academic Press. This book was released on 1997 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt: An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Download or read book An Algorithmic Method for Organizing Checking Experiments written by Güney Gönenc and published by . This book was released on 1968 with total page 63 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this work an algorithm for organization of checking experiments for synchronous sequential machines possessing distinguishing sequences is given. The algorithm is based on the transition checking approach, and yields an upper bound on the length of the checking sequence smaller than those given in previous works. The actual length of the experiments is, in general, well under the bound. A method to further decrease the experiment length is described. (Author).
Download or read book Efficiency of compact testing for sequential circuits written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1976 with total page 50 pages. Available in PDF, EPUB and Kindle. Book excerpt: Compact testing uses random inputs to test digital circuits. Detection is achieved by comparison between some statistic property of the circuit under test, like the frequency of ones on the output line, and the same property for the fault-free circuit. This paper shows that compact testing can be used efficiently for sequential machines, although it has some inherent limitations. Synchronization is achieved by a long sequence of random inputs whose length is circuit dependent. However, for most sequential circuits, synchronization can be achieved in a few seconds. The great majority of failures inside the memory elements are easily detected even with short tests. Compact testing also detects most of the failures in the combinational parts. There, its efficiency is largely dependent upon the test length and also the characteristics of the random number generators. However, even the most subtle failures may be detected if the test has sufficient length. Some of the requirements and trade-offs to achieve efficient detection are presented.
Download or read book Fault Detection in Sequential Machines written by Theodore Thomas Tylaska and published by . This book was released on 1972 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: Sequences and techniques useful in the design of checking experiments are examined. Necessary and sufficient conditions are formulated for a machine to possess distinguishing and synchronizing sequences. Characterizing sequences are examined in detail and a previous bound is reduced by 50 percent to obtain the least upper bound on their total length. Better use is made of the strong connectedness of tested machines to achieve a 50 percent reduction over previous bounds on the length of transfer sequences. Both the reduced bounds on characterizing and on transfer sequences are used to derive a bound smaller than those published on the length of checking for a machine possessing a simple I/O sequence and a valid homing sequence. Both resettable and non-resettable machines are examined to determine the effect of the reset feature upon the length of checking experiments. (Author).
Download or read book Electronic Design Automation for IC System Design Verification and Testing written by Luciano Lavagno and published by CRC Press. This book was released on 2017-12-19 with total page 644 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Download or read book Input Testing Sequences for Asynchronous Sequential Machines written by Daniel W. Wisdom and published by . This book was released on 1976 with total page 104 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala and published by Springer Nature. This book was released on 2022-06-01 with total page 99 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Download or read book The Path Checking Method Applied to Multiple Fault Analysis of Switching Circuits written by Tze Tzong Chen and published by . This book was released on 1976 with total page 446 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1994 with total page 772 pages. Available in PDF, EPUB and Kindle. Book excerpt:
