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Book A Study of Deep Levels in Semi insulating  Liquid encapsulated  Czochralski grown Gallium Arsenide by Photo induced  Transient Spectroscopy

Download or read book A Study of Deep Levels in Semi insulating Liquid encapsulated Czochralski grown Gallium Arsenide by Photo induced Transient Spectroscopy written by Michael Robert Burd and published by . This book was released on 1984 with total page 242 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Analytical Techniques for the Characterization of Compound Semiconductors

Download or read book Analytical Techniques for the Characterization of Compound Semiconductors written by G. Bastard and published by Elsevier. This book was released on 1991-07-26 with total page 554 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume is a collection of 96 papers presented at the above Conference. The scope of the work includes optical and electrical methods as well as techniques for structural and compositional characterization. The contributed papers report on topics such as X-ray diffraction, TEM, depth profiling, photoluminescence, Raman scattering and various electrical methods. Of particular interest are combinations of different techniques providing complementary information. The compound semiconductors reviewed belong mainly to the III-V and III-VI families. The papers in this volume will provide a useful reference on the implications of new technologies in the characterization of compound semiconductors.

Book Infrared Characterization for Microelectronics

Download or read book Infrared Characterization for Microelectronics written by W. S. Lau and published by World Scientific. This book was released on 1999 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt: Most of the books on infrared characterization are for applications in chemistry and no book has been dedicated to infrared characterization for microelectronics. The focus of the book will be on practical applications useful to the production line and to the research and development of microelectronics. The background knowledge and significance of doing a particular type of infrared measurement will be discussed in detail. The principal purpose of the book is to serve as a useful handbook for practising engineers and scientists in the field of microelectronics.

Book Microscopy of Semiconducting Materials 1983  Third Oxford Conference on Microscopy of Semiconducting Materials  St Catherines College  March 1983

Download or read book Microscopy of Semiconducting Materials 1983 Third Oxford Conference on Microscopy of Semiconducting Materials St Catherines College March 1983 written by A.G. Cullis and published by CRC Press. This book was released on 2020-11-25 with total page 533 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21–23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.

Book Gallium Arsenide and Related Compounds 1993  Proceedings of the 20th INT Symposium  29 August   2 September 1993  Freiburg im Braunschweig  Germany

Download or read book Gallium Arsenide and Related Compounds 1993 Proceedings of the 20th INT Symposium 29 August 2 September 1993 Freiburg im Braunschweig Germany written by Günter Weimann and published by CRC Press. This book was released on 1994-01-01 with total page 880 pages. Available in PDF, EPUB and Kindle. Book excerpt: Gallium Arsenide and Related Compounds 1993 covers III-V compounds from crystal growth of materials to their device applications. Focusing on the fields of optical communications and satellite broadcasting, the book describes the practical applications for GaAs and III-V compounds in devices and circuits, both conventional and those based on quantum effects. It also discusses ultrafast GaAs transistors and integrated circuits, novel laser diodes, and tunneling devices, and considers the direction for future technologies. In addition, this volume addresses the increasing demands of ultra high speed systems that require careful selection of III-V materials to optimize the performance of electronic and optoelectronic components. It is ideal reading for physicists, materials scientists, electrical, and electronics engineers investigating III-V compound materials, properties, and devices.

Book Proceedings of the Twenty sixth State of the Art Program on Compound Semiconductors  SOTAPOCS XXVI

Download or read book Proceedings of the Twenty sixth State of the Art Program on Compound Semiconductors SOTAPOCS XXVI written by D. N. Buckley and published by The Electrochemical Society. This book was released on 1997 with total page 340 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book III V Semiconductor Materials and Devices

Download or read book III V Semiconductor Materials and Devices written by R.J. Malik and published by Elsevier. This book was released on 2012-12-02 with total page 740 pages. Available in PDF, EPUB and Kindle. Book excerpt: The main emphasis of this volume is on III-V semiconductor epitaxial and bulk crystal growth techniques. Chapters are also included on material characterization and ion implantation. In order to put these growth techniques into perspective a thorough review of the physics and technology of III-V devices is presented. This is the first book of its kind to discuss the theory of the various crystal growth techniques in relation to their advantages and limitations for use in III-V semiconductor devices.

Book Characterization of Infrared Properties of Layer Semiconductors

Download or read book Characterization of Infrared Properties of Layer Semiconductors written by Rubin Braunstein and published by . This book was released on 1986 with total page 128 pages. Available in PDF, EPUB and Kindle. Book excerpt: Infrared wavelength modulation absorption spectroscopy was employed in the spectral range of 0.3-1.45 eV to study deep level impurities in undoped semi-insulating GaAs grown by the liquid encapsulated Czochralski technique. The sensitivity of the measurements allow us to give credence to changes in absorption at levels of .001/cm. The measurements reveal two resonant type peaks with fine structures near 0.39 and 0.40 eV as well as plateaus and thresholds at higher energy. The absorption band at 0.37 eV is interpreted as due to the intra center transition between levels of accidental iron impurity. The absorption band near 0.40 eV can be annealed out by heat treatment and is characterize as belonging to a structural multi level defect complex. Photo induced transient spectroscopy technique also reveal out annealable level at 0.42 eV. Raman backscattering was employed to measure the shift in the frequency of unscreened and screened phonon plasma mode in GaAs in a study of the change in the surface depletion layer widths due to various surface treatments. A technique of photo-mixing was employed to measure the drift velocities in the hot carrier small distance regimes in Coallium Arsenide.

Book JJAP

    Book Details:
  • Author :
  • Publisher :
  • Release : 1998
  • ISBN :
  • Pages : 410 pages

Download or read book JJAP written by and published by . This book was released on 1998 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Liquid Encapsulated Czochralski Growth Studies of Gallium Arsenide and Characterization of Silicon Dioxide Inclusions

Download or read book Liquid Encapsulated Czochralski Growth Studies of Gallium Arsenide and Characterization of Silicon Dioxide Inclusions written by Lei Ping Lai and published by . This book was released on 1995 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Semi insulating III V Materials

Download or read book Semi insulating III V Materials written by and published by . This book was released on 1988 with total page 628 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Defects and Diffusion in Semiconductors

Download or read book Defects and Diffusion in Semiconductors written by David J. Fisher and published by Trans Tech Publications Ltd. This book was released on 1999-06-17 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: This second volume in the new-format coverage of the latest results in the field covers abstracts from the approximate period of mid-1998 to mid-1999. As always, due to the vagaries of some journal publication dates, abstracts of earlier work may be included in order that the present contents merge seamlessly with those of volumes 162-163; the previous issue in this sub-series.

Book Energy Research Abstracts

Download or read book Energy Research Abstracts written by and published by . This book was released on 1983 with total page 1468 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Japanese Journal of Applied Physics

Download or read book Japanese Journal of Applied Physics written by and published by . This book was released on 1998 with total page 844 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Basic Properties of III V Devices     Understanding Mysterious Trapping Phenomena

Download or read book Basic Properties of III V Devices Understanding Mysterious Trapping Phenomena written by Kompa, Günter and published by kassel university press GmbH. This book was released on 2014 with total page 762 pages. Available in PDF, EPUB and Kindle. Book excerpt: Trapping effects in III-V devices pose a great challenge to any microwave device modeler. Understanding their physical origins is of prime importance to create physics-related reliable device models. The treatment of trapping phenomena is commonly beyond the classical higher-education level of communication engineers. This book provides any basic material needed to understand trapping effects occurring primarily in GaAs and GaN power HEMT devices. As the text material covers interdisciplinary topics such as crystal defects and localized charges, trap centers and trap dynamics, deep-level transient spectroscopy, and trap centers in passivation layers, the book will be of interest to graduate students of electrical engineering, communication engineering, and physics as well as materials, device, and circuit engineers in research and industry.