Download or read book Carrier Lifetime Measurement by the Photoconductive Decay Method written by Richard L. Mattis and published by . This book was released on 1972 with total page 56 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Measurement of Carrier Lifetime in Semiconductors written by W. Murray Bullis and published by . This book was released on 1968 with total page 68 pages. Available in PDF, EPUB and Kindle. Book excerpt: About 300 papers concerned with the measurement and interpretation of carrier lifetime in semiconductors are listed together with key words and a brief comment for each. Eight types of entries are included: Description of Methods, Analysis of Results, Standard Methods, Experimental Results, Theroetical Models, Auxiliary Procedures and Data, Reviews, and Books. Emphasis is placed on methods of carrying out measurements of carrier lifetime. Hence complete coverage was attempted and nearly two thirds of the entries appear in the first three categories. A large fraction of the papers listed describe the photoconductivity or photoconductive decay methods. The other most popular methods are based on diode characteristics or the photomagnetoelectric effect. In all, 35 methods for measuring carrier lifetime are represented by entries. In addition, representative papers which describe various models for recombination are included together with a number of papers which discuss the influence of surface recombination and trapping phenomena. Auxiliary procedures such as surface preparation, formation of ohmic contacts, control of temperature, and the like are described in some of the entries. Two indexes, a Key Word Index and an Author Index, are provided together with a classification of the various methods for measuring carrier lifetime. (Author).

Download or read book Publications of the National Institute of Standards and Technology Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1970 with total page 554 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book NBS Technical Note written by and published by . This book was released on 1972 with total page 56 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Methods of Measurement for Semiconductor Materials Process Control and Devices Quarterly Report written by United States. National Bureau of Standards and published by . This book was released on 1970 with total page 78 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Journal of Research of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1968 with total page 578 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Methods of Measurement for Semiconductor Materials Process Control and Devices written by W. Murray Bullis and published by . This book was released on 1971 with total page 60 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Measurement Methods for the Semiconductor Device Industry written by W. Murray Bullis and published by . This book was released on 1969 with total page 28 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Methods of Measurement for Semiconductor Materials Process Control and Devices written by United States. National Bureau of Standards and published by . This book was released on 1971 with total page 60 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Methods of Measurement for Semiconductor Materials Process Control and Devices Quarterly Report October 1 to December 31 1970 written by W. Murray Bullis and published by . This book was released on 1971 with total page 80 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Narrow Gap Semiconductors 1995 written by J.L Reno and published by CRC Press. This book was released on 2020-11-25 with total page 401 pages. Available in PDF, EPUB and Kindle. Book excerpt: Narrow Gap Semiconductors 1995 contains the invited and contributed papers presented at the Seventh International Conference on Narrow Gap Semiconductors, held in January 1995. The invited review papers provide an overview and the contributed papers provide in-depth coverage of research results across the whole field.

Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1969 with total page 788 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Catalog of National Bureau of Standards Publications 1966 1976 pt 1 Citations and abstracts v 2 pt 1 Key word index A through L v 2 pt 2 Key word index M through Z written by United States. National Bureau of Standards. Technical Information and Publications Division and published by . This book was released on 1978 with total page 804 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Lifetime Factors in Silicon written by and published by ASTM International. This book was released on 1980 with total page 257 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Recombination Lifetime Measurements in Silicon written by Dinesh C. Gupta and published by ASTM International. This book was released on 1998 with total page 389 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Publications of the National Bureau of Standards Catalog written by United States. National Bureau of Standards and published by . This book was released on 1978 with total page 804 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Catalog of National Bureau of Standards Publications 1966 1976 written by United States. National Bureau of Standards and published by . This book was released on 1978 with total page 804 pages. Available in PDF, EPUB and Kindle. Book excerpt: