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Download or read book Feedback Systems written by Karl Johan Åström and published by Princeton University Press. This book was released on 2021-02-02 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The essential introduction to the principles and applications of feedback systems—now fully revised and expanded This textbook covers the mathematics needed to model, analyze, and design feedback systems. Now more user-friendly than ever, this revised and expanded edition of Feedback Systems is a one-volume resource for students and researchers in mathematics and engineering. It has applications across a range of disciplines that utilize feedback in physical, biological, information, and economic systems. Karl Åström and Richard Murray use techniques from physics, computer science, and operations research to introduce control-oriented modeling. They begin with state space tools for analysis and design, including stability of solutions, Lyapunov functions, reachability, state feedback observability, and estimators. The matrix exponential plays a central role in the analysis of linear control systems, allowing a concise development of many of the key concepts for this class of models. Åström and Murray then develop and explain tools in the frequency domain, including transfer functions, Nyquist analysis, PID control, frequency domain design, and robustness. Features a new chapter on design principles and tools, illustrating the types of problems that can be solved using feedback Includes a new chapter on fundamental limits and new material on the Routh-Hurwitz criterion and root locus plots Provides exercises at the end of every chapter Comes with an electronic solutions manual An ideal textbook for undergraduate and graduate students Indispensable for researchers seeking a self-contained resource on control theory
Download or read book Research Fields in Physics at United Kingdom Universities and Polytechnics written by Institute of Physics and published by . This book was released on 1978 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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Download or read book Soft Matter Characterization written by Redouane Borsali and published by Springer Science & Business Media. This book was released on 2008-07-28 with total page 1490 pages. Available in PDF, EPUB and Kindle. Book excerpt: This 2-volume set includes extensive discussions of scattering techniques (light, neutron and X-ray) and related fluctuation and grating techniques that are at the forefront of this field. Most of the scattering techniques are Fourier space techniques. Recent advances have seen the development of powerful direct imaging methods such as atomic force microscopy and scanning probe microscopy. In addition, techniques that can be used to manipulate soft matter on the nanometer scale are also in rapid development. These include the scanning probe microscopy technique mentioned above as well as optical and magnetic tweezers.
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Download or read book Acoustic Absorbers and Diffusers written by Trevor J. Cox and published by CRC Press. This book was released on 2009-01-26 with total page 495 pages. Available in PDF, EPUB and Kindle. Book excerpt: Absorbers and diffusers are two of the main design tools for altering the acoustic conditions of rooms, semi-enclosed spaces and the outdoor environment. Their correct use is important for delivering high quality acoustics. Unique and authoritative, this book decribes how to effectively measure, model, design and apply diffusers and absorbers. It is a resource for new and experienced acousticians, seeking an understanding of the evolution, characteristics and application of modern diffusers. Absorption is a more established technology and so the book blends traditional designs with modern developments. The book covers practical and theoretical aspects of absorbers and diffusers and is well illustrated with examples of installations and case studies. This new edition brings Acoustic Absorbers and Diffusers up-to-date with current research, practice and standards. New developments in measurement, materials, theory and practice since the first edition (published in 2004) are included. The sections on absorbers are extended to include more about noise control.
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Download or read book Energy Research Abstracts written by and published by . This book was released on 1990 with total page 764 pages. Available in PDF, EPUB and Kindle. Book excerpt: Semiannual, with semiannual and annual indexes. References to all scientific and technical literature coming from DOE, its laboratories, energy centers, and contractors. Includes all works deriving from DOE, other related government-sponsored information, and foreign nonnuclear information. Arranged under 39 categories, e.g., Biomedical sciences, basic studies; Biomedical sciences, applied studies; Health and safety; and Fusion energy. Entry gives bibliographical information and abstract. Corporate, author, subject, report number indexes.
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Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.