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Book Auger Microprobe Analysis

Download or read book Auger Microprobe Analysis written by I. F. Ferguson and published by CRC Press. This book was released on 1989 with total page 476 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes the principles and development of the Auger method and the background information necessary for an understanding of the subject.

Book Acquisition of a Nanometer Scale Auger Electron Spectroscopy Analytical Microprobe

Download or read book Acquisition of a Nanometer Scale Auger Electron Spectroscopy Analytical Microprobe written by and published by . This book was released on 2002 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: We have acquired an Auger Electron Spectroscopy Microprobe Analysis System for elemental and bonding analysis of electronic materials, equipped with specimen stage, ion beam depth analyzer, and ultrahigh vacuum (UHV) preparation chamber interfaced to an existing UHV scanning electron microscope. The specific equipment purchased is: JEOL USA, Inc. Auger Electron Spectroscopy Depth Profiling Hardware and Software for the JAMP-7800 deg F. Its acquisition enhances a number of DoD-funded programs and student training that involve development of high power and high frequency electronic materials with superior performance, especially improving the state-of-the-art and availability of radiation-tolerant semiconductor electronics for applications in the space environment investigators.

Book Modern Developments and Applications in Microbeam Analysis

Download or read book Modern Developments and Applications in Microbeam Analysis written by Glyn Love and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt: This supplement of Mikrochimica Acta contains selected papers from the Fifth Workshop of the European Microbeam Analysis Society (EMAS) on "Modern Developments and Applications in Microbeam Analysis" which th th took place from the 11 to 15 May 1997 in Torquay (UK). EMAS was founded in 1986 by scientists from many European countries in order to stimulate research in microbe am analysis and into its development and application. The society now has over 350 members from more than 20 countries. An important EMAS activity is the organisation of biennial workshops which focus upon the current status and developing trends in microanalytical techniques. For this meeting EMAS chose to invite speakers on the following subjects: Standardless analysis, EPMA techniques for quantitative near-surface analysis and depth profiling, Matrix corrections in Auger electron and X-ray photon spectroscopy, X-ray analysis and imaging using low voltage beams, Scanning probe and near field microscopies, EPMA of frozen biological bulk samples, Environmen tal SEM and X-ray microanalysis of biological materials, Quantitative elemental mapping of X-ray radiographs by factorial correspondence, X-ray spectrum processing and multivariate analysis, Thin film analysis and chemical mapping in the analytical electron microscope, Wavelength dispersive X-ray spectroscopy, High resolution non dispersive X-ray spectroscopy with state-of-the-art silicon detectors and Recent developments in instrumentation for X-ray analysis. These invited lectures were given by eminent scientists from Europe, the USA, and Australia In addition to the introductory lectures there were poster sessions at which some 110 posters were on display.

Book A scanning auger microprobe analysis of the oxidation of a zr2ni alloy

Download or read book A scanning auger microprobe analysis of the oxidation of a zr2ni alloy written by R. A. Ploc and published by . This book was released on 1989 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book An Introduction to Surface Analysis by XPS and AES

Download or read book An Introduction to Surface Analysis by XPS and AES written by John F. Watts and published by John Wiley & Sons. This book was released on 2019-08-27 with total page 307 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.

Book Problem Solving with Microbeam Analysis

Download or read book Problem Solving with Microbeam Analysis written by K. Kiss and published by Elsevier. This book was released on 2012-12-02 with total page 415 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides the reader with a working knowledge sufficient to select microbeam techniques for the efficient, cost-effective solution of complex problems arising in today's high-tech industries. Primarily written for the industrial analyst whose field of expertise is other than microbeam analysis, it will also be of help to engineers, plant chemists and industrial research scientists who often seek the aid of the microbeam analyst in their problem solving. Research and plant managers as well as administrators may also find this book helpful since they may be called upon to select and/or approve high-priced microbeam instruments.The book is organized into two parts. Part I gives a brief description of the various techniques and critically compares their capabilities and limitations. Part II consists of selected applications which show how the various techniques or their combinations are applied to characterize materials and to guide research in a wide variety of fields. The examples and case histories will undoubtedly aid the reader in problem solving, quality assurance and research-related tasks. Newcomers to the field will find enough information in the book to enable them to begin practical work and to apply the techniques.

Book Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Download or read book Electron Microprobe Analysis and Scanning Electron Microscopy in Geology written by S. J. B. Reed and published by Cambridge University Press. This book was released on 2005-08-25 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt: Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Book Auger Electron Spectroscopy

    Book Details:
  • Author : Donald T. Hawkins
  • Publisher : Springer Science & Business Media
  • Release : 2012-12-06
  • ISBN : 1468413872
  • Pages : 305 pages

Download or read book Auger Electron Spectroscopy written by Donald T. Hawkins and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 305 pages. Available in PDF, EPUB and Kindle. Book excerpt: Auger electron spectroscopy is rapidly developing into the single most powerful analytical technique in basic and applied science.for investigating the chemical and structural properties of solids. Its ex plosive growth beginning in 1967 was triggered by the development of Auger analyzers capable of de tecting one atom layer of material in a fraction of a second. Continued growth was guaranteed firstly by the commercial availability of apparatus which combined the capabilities of scanning electron mi croscopy and ion-mill depth profiling with Auger analysis, and secondly by the increasing need to know the atomistics of many processes in fundamental research and engineering applications. The expanding use of Auger analysis was accompanied by an increase in the number of publications dealing with it. Because of the developing nature of Auger spectroscopy, the articles have appeared in many different sources covering diverse disciplines, so that it is extremely difficult to discover just what has or has not been subjected to Auger analysis. In this situation, a comprehensive bibliography is obviou-sly useful to those both inside and outside the field. For those in the field, this bibliography should be a wonderful time saver for locating certain references, in researching a particular topic, or when considering various aspects of instrumentation or data analysis. This bibliography not only provides the most complete listing of references pertinent to surface Auger analysis available today, but it is also a basis for extrapolating from past trends to future expectations.

Book Practical Scanning Electron Microscopy

Download or read book Practical Scanning Electron Microscopy written by Joseph Goldstein and published by Springer. This book was released on 1975-04 with total page 608 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.

Book Auger Microprobe Analysis

Download or read book Auger Microprobe Analysis written by Arthur Edward Smith and published by CRC Press. This book was released on 1989-01-01 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt: Auger analysis can be used to identify all elements and is increasingly found in surface science laboratories as a means of producing compositional maps of surfaces at submicron resolutions. Auger Microprobe Analysis is both a working manual and a useful book of reference for experienced and inexperienced scientists in industrial, academic, or government laboratories. It describes the different types of Auger Microprobe and how they can be used to solve problems in many fields such as microcircuitry, materials failure, corrosion, tribology and environmental sampling. The book gives a thorough grounding in the subject, and for the scientist about to set up an Auger laboratory, there is detailed practical advice which is based upon the author's own experience. The book covers every facet of Auger analysis including ultra high vacua, Auger signal detection, secondary electron microscopy and chemical bonding effects. It contains an extensive Auger related glossary and gives tables essential for qualitative and quantitative Auger analysis.

Book Electron Beam Microanalysis

Download or read book Electron Beam Microanalysis written by Donald Robert Beaman and published by . This book was released on 1972 with total page 106 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Progress in Materials Analysis

Download or read book Progress in Materials Analysis written by M. Grasserbauer and published by Springer Science & Business Media. This book was released on 2013-03-14 with total page 348 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 11th Colloquium on Metallurgical Analysis - a joint venture of the Institute of Analytical Chemistry of the Technical University in Vienna, the Austrian Society for Analytical Chemistry and Microchemistry, the German Metals Society (DGM), and the Society of German Iron and Steel Engineers (VDEh) - was attended by 120 scientists from 12 nations. The major topics covered were surface, micro and trace analysis of materials with a heavy emphasis on metals. According to the strategy of the meeting attention was focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and tech nology. Therefore progress reports on analytical techniques (like SIMS, SNMS, Positron Annihilation Spectroscopy, AES, XPS) were given as well as pre sentations on the development of materials (like for the fusion reactor). The majority of the discussion papers centered on the treatment of important technical problems in materials science and technology by a (mostly sophis ticated) combination of physical and chemical analytical techniques. The intensive exchange of ideas and results between the scientists oriented towards basic research and the industrial materials technologists was very fruitful and resulted in the establishment of several scientific cooperations. Major trends in materials analysis were also dealt with in a plenary discussion of which a short summary is contained in this volume. In order to facilitate international communication in the field of materials analysis and in view of the important questions treated in the various contri butions this proceedings volume was edited in English.

Book Electron Microscopy in Mineralogy

Download or read book Electron Microscopy in Mineralogy written by P.E. Champness and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 574 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last five years transmission electron microscopy (TEM) has added numerous important new data to mineralogy and has considerably changed its outlook. This is partly due to the fact that metallurgists and crystal physicists having solved most of the structural and crystallographic problems in metals have begun to show a widening interest in the much more complicated structures of minerals, and partly to recent progress in experimental techniques, mainly the availability of ion-thinning devices. While electron microscopists have become increasingly interested in minerals (judging from special symposia at recent meetings such as Fifth European Congress on Electron microscopy, Man chester 1972; Eight International Congress on Electron Microscopy, Canberra 1974) mineralogists have realized advantages of the new technique and applied it with increasing frequency. In an effort to coordinate the growing quantity of research, electron microscopy sessions have been included in meetings of mineralogists (e. g. Geological Society of America, Minneapolis, 1972, American Crystallographic Association, Berkeley, 1974). The tremendous response for the TEM symposium which H. -R. Wenk and G. Thomas organized at the Berkeley Conference of the American Crystallographic Association formed the basis for this book. It appeared useful at this stage to summarize the achievements of electron microscopy, scattered in many different journals in several different fields and present them to mineralogists. A group of participants as the Berkeley symposium formed an Editorial Committee and outlined the content of this book.

Book Scanning auger microprobe  sam  analysis of a section from wecan high temperature bundle sag test htbs 001

Download or read book Scanning auger microprobe sam analysis of a section from wecan high temperature bundle sag test htbs 001 written by R. D. Davidson and published by . This book was released on 1985 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report describes detailed auger analysis of previously molten u-zr-o alloy in a section from a candu fuel bundle exposed to high temperature steam in wecan test htbs-001. the objectives of the examination were to determine the material composition and the magnitude of any concentration gradients between the material and the uo2 or the oxidized zr fuel sheath. the composition of the previously molten material was determined to be approximately 24 at percent zr, 8 at percent u and 68 at percent o. although significant concentration gradients of u and zr were measured near the uo2 and zro2 interfaces, the oxygen concentration was determined to be nearly constant throughout the material. the work reported in the documentation was funded by cog - candev program: work package no. 0466.