Download or read book Surface Analysis by Auger and X ray Photoelectron Spectroscopy written by David Briggs and published by Im Publications. This book was released on 2003-01-01 with total page 899 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Auger and X Ray Photoelectron Spectroscopy in Materials Science written by Siegfried Hofmann and published by Springer Science & Business Media. This book was released on 2012-10-25 with total page 544 pages. Available in PDF, EPUB and Kindle. Book excerpt: To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Download or read book Analytical and Diagnostic Techniques for Semiconductor Materials Devices and Processes written by Bernd O. Kolbesen (Chemiker.) and published by The Electrochemical Society. This book was released on 1999 with total page 568 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Advanced Scanning Electron Microscopy and X Ray Microanalysis written by Patrick Echlin and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 463 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.
Download or read book The Theory of Auger Transitions written by D Chattarji and published by Elsevier. This book was released on 2012-12-02 with total page 278 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Theory of Auger Transitions reviews the Auger effect theory, relating it to the broad spectrum of atomic and physical theory. This book discusses the Auger effect involving discrete and continuous states of the atomic system, which can be used as a good testing ground for fundamental atomic theory, such as the various atomic models and their concomitant wave functions. The application of Auger spectroscopy to surface chemical analysis is also elaborated. Other topics include the symmetry and invariance, theory of the Auger process, coulomb field and coulomb wave functions, and symmetry-breaking and classification of states. The central-field calculations, many-electron atom, advances in Auger theory, and Auger electron spectroscopy and its application to surface science are likewise covered in this text. This publication is intended for scientists and atomic physicists, but is also useful to theoreticians and graduate student specializing in atomic physics.
Download or read book Auger Electron Spectroscopy Reference Manual written by G. McGuire and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 144 pages. Available in PDF, EPUB and Kindle. Book excerpt: Auger electron spectroscopy (AES) is based on the Auger total secondary electron energy distribution, and an ion gun to process, which involves the core-level ionization of an atom with provide depth profiling capability. subsequent deexcitation occurring by an outer-level electron de The high surface sensitivity of Auger spectroscopy which dictates caying to fill the core hole. The excess energy is transferred to the need for an ultrahigh-vacuum system is due to the limited and causes the ejection of another electron, which is by definition mean free path of electrons in the 0-3000 e V kinetic energy an Auger electron. The Auger electron transition, denoted by range. The Auger peaks decay exponentially with overlayer cov the electron levels involved, is independent of the excitation erage, which is consistent with an exponential dependence of source and leaves the atom with a constant kinetic energy. The escape probability on the depth of the parent atom. A compila kinetic energy is given by the differences in binding energies for tion of data from a variety of sources has been used to generate the three levels (for example, EK-E L, - EL ) minus a correction 2 an escape depth curve which falls in the range of 5-30 A in the term for the work function and electron wave function relaxation. energy range from 0 to 3000 eV. The observed escape depth does When the Auger transition occurs within a few angstroms of the not show a strong dependence on the matrix.
Download or read book A Guide to Materials Characterization and Chemical Analysis written by John P. Sibilia and published by John Wiley & Sons. This book was released on 1996-12-17 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written both for the novice and for the experienced scientist, this miniature encyclopedia concisely describes over one hundred materials methodologies, including evaluation, chemical analysis, and physical testing techniques. Each technique is presented in terms of its use, sample requirements, and the engineering principles behind its methodology. Real life industrial and academic applications are also described to give the reader an understanding of the significance and utilization of technique. There is also a discussion of the limitations of each technique.
Download or read book Time Frequency Analysis written by Franz Hlawatsch and published by John Wiley & Sons. This book was released on 2013-03-01 with total page 377 pages. Available in PDF, EPUB and Kindle. Book excerpt: Covering a period of about 25 years, during which time-frequency has undergone significant developments, this book is principally addressed to researchers and engineers interested in non-stationary signal analysis and processing. It is written by recognized experts in the field.
Download or read book An Introduction to Surface Analysis by XPS and AES written by John F. Watts and published by John Wiley & Sons. This book was released on 2019-08-27 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.
Download or read book Methods of Surface Analysis written by A.W. Czanderna and published by Elsevier. This book was released on 2012-12-02 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: Methods of Surface Analysis deals with the determination of the composition of surfaces and the identification of species attached to the surface. The text applies methods of surface analysis to obtain a composition depth profile after various stages of ion etching or sputtering. The composition at the solid—solid interface is revealed by systematically removing atomic planes until the interface of interest is reached, in which the investigator can then determine its composition. The book reviews the effect of ion etching on the results obtained by any method of surface analysis including the effect of the rate of etching, incident energy of the bombarding ion, the properties of the solid, the effect of the ion etching on generating an output signal of electrons, ions, or neutrals. The text also describes the effect of the residual gases in the vacuum environment. The book considers the influence of the sample geometry, of the type (metal, insulator, semiconductor, organic), and of the atomic number can have on surface analysis. The text describes in detail low energy ion scattering spectroscopy, X-ray photoelectron spectroscopy, Auger electron spectroscopy, secondary ion mass spectroscopy, and infrared reflection-absorption spectroscopy. The book can prove useful for researchers, technicians, and scientists whose works involve organic chemistry, analytical chemistry, and other related fields of chemistry, such as physical chemistry or inorganic chemistry.
Download or read book Photoelectron and Auger Spectroscopy written by Thomas Carlson and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 427 pages. Available in PDF, EPUB and Kindle. Book excerpt: In 1970 when I first seriously contemplated writing a book on electron spectroscopy, I recognized the impossibility of completely reaching my desired goals. First, the field was expanding (and still is) at such a rate that a definitive statement of the subject is not possible. The act of following the literature comprehensively and summarizing its essential content proved to be a diver gent series. On the other hand, the field has increased to such a size that violent changes in its basic makeup no longer occur with the frequency that was present in its early days. Furthermore, the excitement of electron spectro scopy lies in its many-faceted interrelationships. In the era of specialization, electron spectroscopy is an open-ended subject continually bringing together new aspects of science. I wished to discuss not just one type of electron spectro scopy, but as many as would be possible. The book as it stands concentrates its attention on x-ray photoelectron spectroscopy, but also presents the basis of Auger electron spectroscopy and uv photoelectron spectroscopy, as well as mentioning many of the other branches of the field. A large, many-author volume might be an answer to some of these problems. However, though anyone person possesses only a limited amount of expertise, I have always enjoyed books by a single author since what they lack in detailed knowledge they gain in a unified viewpoint. I hope the final product, though limited in its attainment of these goals, will still be of some merit.
Download or read book Accuracy in Trace Analysis written by and published by . This book was released on 1976 with total page 674 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book An Introduction to Surface Analysis by XPS and AES written by John F. Watts and published by John Wiley & Sons. This book was released on 2019-08-15 with total page 289 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.
Download or read book Characterization and Failure Analysis of Plastics written by ASM International and published by ASM International. This book was released on 2003-01-01 with total page 486 pages. Available in PDF, EPUB and Kindle. Book excerpt: The selection and application of engineered materials is an integrated process that requires an understanding of the interaction between materials properties, manufacturing characteristics, design considerations, and the total life cycle of the product. This reference book on engineering plastics provides practical and comprehensive coverage on how the performance of plastics is characterized during design, property testing, and failure analysis. The fundamental structure and properties of plastics are reviewed for general reference, and detailed articles describe the important design factors, properties, and failure mechanisms of plastics. The effects of composition, processing, and structure are detailed in articles on the physical, chemical, thermal, and mechanical properties. Other articles cover failure mechanisms such as: crazing and fracture; impact loading; fatigue failure; wear failures, moisture related failure; organic chemical related failure; photolytic degradation; and microbial degradation. Characterization of plastics in failure analysis is described with additional articles on analysis of structure, surface analysis, and fractography.
Download or read book Scanning Auger Electron Microscopy written by Martin Prutton and published by John Wiley & Sons. This book was released on 2006-05-01 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: This eagerly-awaited volume has been edited by two academic researchers with extensive and reputable experience in this field. Emphasis is given to the underlying science of the method of Auger microscopy, and its instrumental realization, the visualization and interpretation of the data in the sets of the images that form the output of the measurements and the methods used to quantify the images. Imaging artefacts in Auger microscopy and methods to correct them are also detailed. The authors describe the technique of Multi-Spectral Auger Microscopy (MULSAM) and demonstrate its advantages in mapping complex multi-component surfaces. The book concludes with an outlook for the future of Auger microscopy.
Download or read book Introduction to Microfabrication written by Sami Franssila and published by John Wiley & Sons. This book was released on 2005-01-28 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt: Microfabrication is the key technology behind integrated circuits,microsensors, photonic crystals, ink jet printers, solar cells andflat panel displays. Microsystems can be complex, but the basicmicrostructures and processes of microfabrication are fairlysimple. Introduction to Microfabrication shows how the commonmicrofabrication concepts can be applied over and over again tocreate devices with a wide variety of structures andfunctions. Featuring: * A comprehensive presentation of basic fabrication processes * An emphasis on materials and microstructures, rather than devicephysics * In-depth discussion on process integration showing how processes,materials and devices interact * A wealth of examples of both conceptual and real devices Introduction to Microfabrication includes 250 homework problems forstudents to familiarise themselves with micro-scale materials,dimensions, measurements, costs and scaling trends. Both researchand manufacturing topics are covered, with an emphasis on silicon,which is the workhorse of microfabrication. This book will serve as an excellent first text for electricalengineers, chemists, physicists and materials scientists who wishto learn about microstructures and microfabrication techniques,whether in MEMS, microelectronics or emerging applications.
Download or read book NBS Special Publication written by and published by . This book was released on 1918 with total page 992 pages. Available in PDF, EPUB and Kindle. Book excerpt:
