Download or read book Digital Optical Measurement Techniques and Applications written by Pramod Rastogi and published by Artech House. This book was released on 2015-05-01 with total page 473 pages. Available in PDF, EPUB and Kindle. Book excerpt: This new resource explains the principles and applications of today’s digital optical measurement techniques. From start to finish, each chapter provides a concise introduction to the concepts and principles of digital optical metrology, followed by a detailed presentation of their applications. The development of all these topics, including their numerous methods, principles, and applications, has been illustrated using a large number of easy-to-understand figures. This book aims to not only help the reader identify the appropriate techniques in function of the measurement requirements, but also assess modern digital measurement systems.
Download or read book Optical Measurement Techniques written by Kai-Erik Peiponen and published by Springer Science & Business Media. This book was released on 2009-02-12 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: Devoted to new optical measurement techniques in industry as well as the life sciences, this book has a fresh perspective on the development of modern optical sensors, which are essential for the control of parameters in industrial and biomedical applications.
Download or read book Applications of Optical Metrology techniques and Measurements written by John J. Lee and published by . This book was released on with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Optical Measurements written by Franz Mayinger and published by Springer Science & Business Media. This book was released on 2013-03-14 with total page 462 pages. Available in PDF, EPUB and Kindle. Book excerpt: Increasing possibilities of computer-aided data processing have caused a new revival of optical techniques in many areas of mechanical and chemical en gineering. Optical methods have a long tradition in heat and mass transfer and in fluid dynamics. Global experimental information is not sufficient for developing constitution equations to describe complicated phenomena in fluid dynamics or in transfer processes by a computer program . Furthermore, a detailed insight with high local and temporal resolution into the thermo-and fluiddynamic situations is necessary. Sets of equations for computer program in thermo dynamics and fluid dynamics usually consist of two types of formulations: a first one derived from the conservation laws for mass, energy and momentum, and a second one mathematically modelling transport processes like laminar or turbulent diffusion. For reliably predicting the heat transfer, for example, the velocity and temperature field in the boundary layer must be known, or a physically realistic and widely valid correlation describing the turbulence must be avail able. For a better understanding of combustion processes it is necessary to know the local concentration and temperature just ahead of the flame and in the ignition zone.
Download or read book Handbook of Optical Metrology written by Toru Yoshizawa and published by CRC Press. This book was released on 2017-07-28 with total page 866 pages. Available in PDF, EPUB and Kindle. Book excerpt: Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
Download or read book Applications of Optical Metrology written by John J. Lee and published by . This book was released on 1983 with total page 214 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Applications of Optical Metrology techniques and Measurements II written by John J. Lee and published by . This book was released on 1983 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Applications of Optical Metrology techniques and Measurements II written by and published by . This book was released on 1983 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Optical Measurement Techniques and Applications written by Pramod K. Rastogi and published by Artech House Publishers. This book was released on 1997 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Significant advances in optical metrology have fueled the development of new, innovative techniques for the technology in a wide range of applications. Now you can better understand these highly accurate and versatile new methods, and gain insight into applying the technology to solve specific measurement problems.
Download or read book Practical Optical Dimensional Metrology written by Kevin G. Harding and published by . This book was released on 2019 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt: Practical Optical Dimensional Metrology provides basic explanations of the operation and application of the most common methods in the field and in commercial use. The first half of the book presents a working knowledge of the mechanism and limitations of optical dimensional measurement methods that use: light level changes, two-dimensional imaging, triangulation, structured-light patterns, interference patterns, optical focus, light characteristics such as polarization, and hybrid methods with mechanical or other measurement tools. The book concludes with a series of manufacturing application examples that look at measurements from the centimeter range down to the nanometer range.
Download or read book Optical Measurement of Surface Topography written by Richard Leach and published by Springer Science & Business Media. This book was released on 2011-03-31 with total page 333 pages. Available in PDF, EPUB and Kindle. Book excerpt: The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
Download or read book Handbook of Optical Metrology written by Toru Yoshizawa and published by CRC Press. This book was released on 2017-07-28 with total page 919 pages. Available in PDF, EPUB and Kindle. Book excerpt: Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
Download or read book Handbook of Optical Dimensional Metrology written by Kevin Harding and published by Taylor & Francis. This book was released on 2016-04-19 with total page 497 pages. Available in PDF, EPUB and Kindle. Book excerpt: Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods
Download or read book Optical Metrology written by Kjell J. Gåsvik and published by John Wiley & Sons. This book was released on 2003-04-11 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt: New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera.
Download or read book Introduction to Metrology Applications in IC Manufacturing written by Bo Su and published by . This book was released on 2015 with total page 187 pages. Available in PDF, EPUB and Kindle. Book excerpt: Metrology has grown significantly, especially in semiconductor manufacturing, and such growth necessitates increased expertise. Until now, this field has never had book written from the perspective of an engineer in a modern IC manufacturing and development environment. The topics in this Tutorial Text range from metrology at its most basic level to future predictions and challenges, including measurement methods, industrial applications, fundamentals of traditional measurement system characterization and calibration, measurement system characterization and calibration, semiconductor-specific applications, optical metrology measurement techniques, charged particle measurement techniques, x-ray and in situ metrology, hybrid metrology, and mask making. Includes example spreadsheets of measurement uncertainty analysis--specifically, precision, matching, and relative accuracy.
Download or read book Optical Methods of Measurement written by Rajpal Sirohi and published by CRC Press. This book was released on 2018-09-03 with total page 270 pages. Available in PDF, EPUB and Kindle. Book excerpt: Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections. The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity. This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems.
Download or read book A Practical Guide to Optical Metrology for Thin Films written by Michael Quinten and published by John Wiley & Sons. This book was released on 2012-09-24 with total page 212 pages. Available in PDF, EPUB and Kindle. Book excerpt: A one-stop, concise guide on determining and measuring thin film thickness by optical methods. This practical book covers the laws of electromagnetic radiation and interaction of light with matter, as well as the theory and practice of thickness measurement, and modern applications. In so doing, it shows the capabilities and opportunities of optical thickness determination and discusses the strengths and weaknesses of measurement devices along with their evaluation methods. Following an introduction to the topic, Chapter 2 presents the basics of the propagation of light and other electromagnetic radiation in space and matter. The main topic of this book, the determination of the thickness of a layer in a layer stack by measuring the spectral reflectance or transmittance, is treated in the following three chapters. The color of thin layers is discussed in chapter 6. Finally, in chapter 7, the author discusses several industrial applications of the layer thickness measurement, including high-reflection and anti-reflection coatings, photolithographic structuring of semiconductors, silicon on insulator, transparent conductive films, oxides and polymers, thin film photovoltaics, and heavily doped silicon. Aimed at industrial and academic researchers, engineers, developers and manufacturers involved in all areas of optical layer and thin optical film measurement and metrology, process control, real-time monitoring, and applications.
