Download or read book The ESD Handbook written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2021-03-25 with total page 1172 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical and comprehensive reference that explores Electrostatic Discharge (ESD) in semiconductor components and electronic systems The ESD Handbook offers a comprehensive reference that explores topics relevant to ESD design in semiconductor components and explores ESD in various systems. Electrostatic discharge is a common problem in the semiconductor environment and this reference fills a gap in the literature by discussing ESD protection. Written by a noted expert on the topic, the text offers a topic-by-topic reference that includes illustrative figures, discussions, and drawings. The handbook covers a wide-range of topics including ESD in manufacturing (garments, wrist straps, and shoes); ESD Testing; ESD device physics; ESD semiconductor process effects; ESD failure mechanisms; ESD circuits in different technologies (CMOS, Bipolar, etc.); ESD circuit types (Pin, Power, Pin-to-Pin, etc.); and much more. In addition, the text includes a glossary, index, tables, illustrations, and a variety of case studies. Contains a well-organized reference that provides a quick review on a range of ESD topics Fills the gap in the current literature by providing information from purely scientific and physical aspects to practical applications Offers information in clear and accessible terms Written by the accomplished author of the popular ESD book series Written for technicians, operators, engineers, circuit designers, and failure analysis engineers, The ESD Handbook contains an accessible reference to ESD design and ESD systems.

Download or read book ESD Testing written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2016-10-07 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance. ESD Testing: From Components to Systems updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup. Key features: Provides understanding and knowledge of ESD models and specifications including human body model (HBM), machine model (MM), charged device model (CDM), charged board model (CBM), cable discharge events (CDE), human metal model (HMM), IEC 61000-4-2 and IEC 61000-4-5. Discusses new testing methodologies such as transmission line pulse (TLP), to very fast transmission line pulse (VF-TLP), and future methods of long pulse TLP, to ultra-fast TLP (UF-TLP). Describes both conventional testing and new testing techniques for both chip and system level evaluation. Addresses EOS testing, electromagnetic compatibility (EMC) scanning, to current reconstruction methods. Discusses latchup characterization and testing methodologies for evaluation of semiconductor technology to product testing. ESD Testing: From Components to Systems is part of the authors’ series of books on electrostatic discharge (ESD) protection; this book will be an invaluable reference for the professional semiconductor chip and system-level ESD and EOS test engineer. Semiconductor device and process development, circuit designers, quality, reliability and failure analysis engineers will also find it an essential reference. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, semiconductor testing and experimental work.

Download or read book ESD written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2015-04-24 with total page 552 pages. Available in PDF, EPUB and Kindle. Book excerpt: ESD: Circuits and Devices 2nd Edition provides a clear picture of layout and design of digital, analog, radio frequency (RF) and power applications for protection from electrostatic discharge (ESD), electrical overstress (EOS), and latchup phenomena from a generalist perspective and design synthesis practices providing optimum solutions in advanced technologies. New features in the 2nd edition: Expanded treatment of ESD and analog design of passive devices of resistors, capacitors, inductors, and active devices of diodes, bipolar junction transistors, MOSFETs, and FINFETs. Increased focus on ESD power clamps for power rails for CMOS, Bipolar, and BiCMOS. Co-synthesizing of semiconductor chip architecture and floor planning with ESD design practices for analog, and mixed signal applications Illustrates the influence of analog design practices on ESD design circuitry, from integration, synthesis and layout, to symmetry, matching, inter-digitation, and common centroid techniques. Increased emphasis on system-level testing conforming to IEC 61000-4-2 and IEC 61000-4-5. Improved coverage of low-capacitance ESD, scaling of devices and oxide scaling challenges. ESD: Circuits and Devices 2nd Edition is an essential reference to ESD, circuit & semiconductor engineers and quality, reliability &analysis engineers. It is also useful for graduate and undergraduate students in electrical engineering, semiconductor sciences, microelectronics and IC design.

Download or read book Electrical Overstress EOS written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2013-10-28 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design. It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip, and system level EOS protection networks, followed by examples in specific technologies, circuits, and chips. The book is unique in covering the EOS manufacturing issues from on-chip design and electronic design automation to factory-level EOS program management in today’s modern world. Look inside for extensive coverage on: Fundamentals of electrical overstress, from EOS physics, EOS time scales, safe operating area (SOA), to physical models for EOS phenomena EOS sources in today’s semiconductor manufacturing environment, and EOS program management, handling and EOS auditing processing to avoid EOS failures EOS failures in both semiconductor devices, circuits and system Discussion of how to distinguish between EOS events, and electrostatic discharge (ESD) events (e.g. such as human body model (HBM), charged device model (CDM), cable discharge events (CDM), charged board events (CBE), to system level IEC 61000-4-2 test events) EOS protection on-chip design practices and how they differ from ESD protection networks and solutions Discussion of EOS system level concerns in printed circuit boards (PCB), and manufacturing equipment Examples of EOS issues in state-of-the-art digital, analog and power technologies including CMOS, LDMOS, and BCD EOS design rule checking (DRC), LVS, and ERC electronic design automation (EDA) and how it is distinct from ESD EDA systems EOS testing and qualification techniques, and Practical off-chip ESD protection and system level solutions to provide more robust systems Electrical Overstress (EOS): Devices, Circuits and Systems is a continuation of the author’s series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the nano-electronic era.

Download or read book Electrical Overstress EOS written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2013-08-27 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design. It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip, and system level EOS protection networks, followed by examples in specific technologies, circuits, and chips. The book is unique in covering the EOS manufacturing issues from on-chip design and electronic design automation to factory-level EOS program management in today’s modern world. Look inside for extensive coverage on: Fundamentals of electrical overstress, from EOS physics, EOS time scales, safe operating area (SOA), to physical models for EOS phenomena EOS sources in today’s semiconductor manufacturing environment, and EOS program management, handling and EOS auditing processing to avoid EOS failures EOS failures in both semiconductor devices, circuits and system Discussion of how to distinguish between EOS events, and electrostatic discharge (ESD) events (e.g. such as human body model (HBM), charged device model (CDM), cable discharge events (CDM), charged board events (CBE), to system level IEC 61000-4-2 test events) EOS protection on-chip design practices and how they differ from ESD protection networks and solutions Discussion of EOS system level concerns in printed circuit boards (PCB), and manufacturing equipment Examples of EOS issues in state-of-the-art digital, analog and power technologies including CMOS, LDMOS, and BCD EOS design rule checking (DRC), LVS, and ERC electronic design automation (EDA) and how it is distinct from ESD EDA systems EOS testing and qualification techniques, and Practical off-chip ESD protection and system level solutions to provide more robust systems Electrical Overstress (EOS): Devices, Circuits and Systems is a continuation of the author’s series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the nano-electronic era.

Download or read book Fiber Optics Engineering written by Mohammad Azadeh and published by Springer Science & Business Media. This book was released on 2009-08-05 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt: Within the past few decades, information technologies have been evolving at a tremendous rate, causing profound changes to our world and our ways of life. In particular, fiber optics has been playing an increasingly crucial role within the telecommunication revolution. Not only most long-distance links are fiber based, but optical fibers are increasingly approaching the individual end users, providing wide bandwidth links to support all kinds of data-intensive applications such as video, voice, and data services. As an engineering discipline, fiber optics is both fascinating and challenging. Fiber optics is an area that incorporates elements from a wide range of techno- gies including optics, microelectronics, quantum electronics, semiconductors, and networking. As a result of rapid changes in almost all of these areas, fiber optics is a fast evolving field. Therefore, the need for up-to-date texts that address this growing field from an interdisciplinary perspective persists. This book presents an overview of fiber optics from a practical, engineering perspective. Therefore, in addition to topics such as lasers, detectors, and optical fibers, several topics related to electronic circuits that generate, detect, and process the optical signals are covered. In other words, this book attempts to present fiber optics not so much in terms of a field of “optics” but more from the perspective of an engineering field within “optoelectronics.

Download or read book Physical Limitations of Semiconductor Devices written by Vladislav A. Vashchenko and published by Springer Science & Business Media. This book was released on 2008-03-22 with total page 337 pages. Available in PDF, EPUB and Kindle. Book excerpt: Providing an important link between the theoretical knowledge in the field of non-linier physics and practical application problems in microelectronics, the purpose of the book is popularization of the physical approach for reliability assurance. Another unique aspect of the book is the coverage given to the role of local structural defects, their mathematical description, and their impact on the reliability of the semiconductor devices.

Download or read book Image and Signal Processing written by Abderrahim El Moataz and published by Springer Nature. This book was released on 2020-07-08 with total page 388 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume constitutes the refereed proceedings of the 9th International Conference on Image and Signal Processing, ICISP 2020, which was due to be held in Marrakesh, Morocco, in June 2020. The conference was cancelled due to the COVID-19 pandemic. The 40 revised full papers were carefully reviewed and selected from 84 submissions. The contributions presented in this volume were organized in the following topical sections: digital cultural heritage & color and spectral imaging; data and image processing for precision agriculture; machine learning application and innovation; biomedical imaging; deep learning and applications; pattern recognition; segmentation and retrieval; mathematical imaging & signal processing.

Download or read book Digital Systems Design with FPGAs and CPLDs written by Ian Grout and published by Elsevier. This book was released on 2011-04-08 with total page 763 pages. Available in PDF, EPUB and Kindle. Book excerpt: Digital Systems Design with FPGAs and CPLDs explains how to design and develop digital electronic systems using programmable logic devices (PLDs). Totally practical in nature, the book features numerous (quantify when known) case study designs using a variety of Field Programmable Gate Array (FPGA) and Complex Programmable Logic Devices (CPLD), for a range of applications from control and instrumentation to semiconductor automatic test equipment.Key features include:* Case studies that provide a walk through of the design process, highlighting the trade-offs involved.* Discussion of real world issues such as choice of device, pin-out, power supply, power supply decoupling, signal integrity- for embedding FPGAs within a PCB based design.With this book engineers will be able to:* Use PLD technology to develop digital and mixed signal electronic systems* Develop PLD based designs using both schematic capture and VHDL synthesis techniques* Interface a PLD to digital and mixed-signal systems* Undertake complete design exercises from design concept through to the build and test of PLD based electronic hardwareThis book will be ideal for electronic and computer engineering students taking a practical or Lab based course on digital systems development using PLDs and for engineers in industry looking for concrete advice on developing a digital system using a FPGA or CPLD as its core. - Case studies that provide a walk through of the design process, highlighting the trade-offs involved. - Discussion of real world issues such as choice of device, pin-out, power supply, power supply decoupling, signal integrity- for embedding FPGAs within a PCB based design.

Download or read book Electromagnetic Compatibility of Integrated Circuits written by Sonia Ben Dhia and published by Springer Science & Business Media. This book was released on 2006-06-04 with total page 478 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented.

Download or read book Network Infrastructure and Architecture written by Krzysztof Iniewski and published by John Wiley & Sons. This book was released on 2008-04-11 with total page 563 pages. Available in PDF, EPUB and Kindle. Book excerpt: A Comprehensive, Thorough Introduction to High-Speed Networking Technologies and Protocols Network Infrastructure and Architecture: Designing High-Availability Networks takes a unique approach to the subject by covering the ideas underlying networks, the architecture of the network elements, and the implementation of these elements in optical and VLSI technologies. Additionally, it focuses on areas not widely covered in existing books: physical transport and switching, the process and technique of building networking hardware, and new technologies being deployed in the marketplace, such as Metro Wave Division Multiplexing (MWDM), Resilient Packet Rings (RPR), Optical Ethernet, and more. Divided into five succinct parts, the book covers: Optical transmission Networking protocols VLSI chips Data switching Networking elements and design Complete with case studies, examples, and exercises throughout, the book is complemented with chapter goals, summaries, and lists of key points to aid readers in grasping the material presented. Network Infrastructure and Architecture offers professionals, advanced undergraduates, and graduate students a fresh view on high-speed networking from the physical layer perspective.

Download or read book Pressure Vessel Handbook written by Eugene F. Megyesy and published by . This book was released on 1977 with total page 430 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Wireless Sensor Networks written by Jr., Edgar H. Callaway and published by CRC Press. This book was released on 2003-08-26 with total page 360 pages. Available in PDF, EPUB and Kindle. Book excerpt: Because they provide practical machine-to-machine communication at a very low cost, the popularity of wireless sensor networks is expected to skyrocket in the next few years, duplicating the recent explosion of wireless LANs. Wireless Sensor Networks: Architectures and Protocols describes how to build these networks, from the layers of the

Download or read book VLSI Design written by Debaprasad Das and published by . This book was released on 2016-01-15 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Beginning with an introduction to VLSI systems and basic concepts of MOS transistors, this second edition of the book then proceeds to describe the various concepts of VLSI, such as the structure and operation of MOS transistors and inverters, standard cell library design and itscharacterization, analog and digital CMOS logic design, semiconductor memories, and BiCMOS technology and circuits. It then provides an exhaustive step-wise discussion of the various stages involved in designing a VLSI chip (which includes logic synthesis, timing analysis, floor planning, placementand routing, verification, and testing). In addition, the book includes chapters on FPGA architecture, VLSI process technology, subsystem design, and low power logic circuits.

Download or read book Man systems Integration Standards written by United States. National Aeronautics and Space Administration and published by . This book was released on 1995 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Ellis British Railway Engineering Encyclopaedia 4th Edition written by Iain Ellis and published by Lulu.com. This book was released on 2019-11 with total page 718 pages. Available in PDF, EPUB and Kindle. Book excerpt: The fourth edition of the industry-renowned Encyclopaedia. Fully revised, expanded and enhanced by over a hundred pages. This is the only cross-discipline reference and is fast becoming an industry standard.

Download or read book Application Specific Integrated Circuits written by Michael Smith and published by Addison-Wesley Professional. This book was released on 1997-06-10 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This comprehensive book on application-specific integrated circuits (ASICs) describes the latest methods in VLSI-systems design. ASIC design, using commercial tools and pre-designed cell libraries, is the fastest, most cost-effective, and least error-prone method of IC design. As a consequence, ASICs and ASIC-design methods have become increasingly popular in industry for a wide range of applications. The book covers both semicustom and programmable ASIC types. After describing the fundamentals of digital logic design and the physical features of each ASIC type, the book turns to ASIC logic design - design entry, logic synthesis, simulation, and test - and then to physical design - partitioning, floorplanning, placement, and routing. You will find here, in practical well-explained detail, everything you need to know to understand the design of an ASIC, and everything you must do to begin and to complete your own design. Features Broad coverage includes, in one information-packed volume, cell-based ICs, gate arrays, field-programmable gate arrays (FPGAs), and complex programmable logic devices (PLDs). Examples throughout the book have been checked with a wide range of commercial tools to ensure their accuracy and utility. Separate chapters and appendixes on both Verilog and VHDL, including material from IEEE standards, serve as a complete reference for high-level, ASIC-design entry. As in other landmark VLSI books published by Addison-Wesley - from Mead and Conway to Weste and Eshraghian - the author's teaching expertise and industry experience illuminate the presentation of useful design methods. Any engineer, manager, or student who is working with ASICs in a design project, or who is simply interested in knowing more about the different ASIC types and design styles, will find this book to be an invaluable resource, reference, and guide.