Download or read book Ageing of Integrated Circuits written by Basel Halak and published by Springer Nature. This book was released on 2019-09-30 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits.
Download or read book Experimental Analysis on Aging of Integrated Circuits written by Niranjan Reddy Kayam and published by . This book was released on 2011 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Aging Analysis of Digital Integrated Circuits written by Dominik Lorenz and published by . This book was released on 2012 with total page 150 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Experimental Analysis on Aging of Integrated Circuits written by Niranjan Reddy Kayam and published by . This book was released on 2011 with total page 188 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Lifetime Reliability aware Design of Integrated Circuits written by Mohsen Raji and published by Springer Nature. This book was released on 2022-11-16 with total page 113 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.
Download or read book Aging Aware Design Methods for Reliable Analog Integrated Circuits Using Operating Point Dependent Degradation written by and published by . This book was released on 2015 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book On Ageing Effects in Analogue Integrated Circuits written by Felix Salfelder and published by . This book was released on 2016 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The behaviour of electronic circuits is influenced by ageing effects. Modelling the behaviour of circuits is a standard approach for the design of faster, smaller, more reliable and more robust systems. In this thesis, we propose a formalization of robustness that is derived from a failure model, which is based purely on the behavioural specification of a system. For a given specification, simulation can reveal if a system does not comply with a specification, and thus provide a failure model. Ageing usually works against the specified properties, and ageing models can be incorporated to quantify the impact on specification violations, failures and robustness. We study ageing effects in the context of analogue circuits. Here, models must factor in infinitely many circuit states. Ageing effects have a cause and an impact that require models. On both these ends, the circuit state is highly relevant, an must be factored in. For example, static empirical models for ageing effects are not valid in many cases, because the assumed operating states do not agree with the circuit simulation results. ...
Download or read book Aging Aware Design Methods for Reliable Analog Integrated Circuits Using Operating Point Dependent Degradation written by Nico Hellwege and published by . This book was released on 2015 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Aging Aware Timing Analysis of Digital Integrated Circuits for Varying Use Profiles written by Veit B. Kleeberger and published by . This book was released on 2012 with total page 40 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book An Examination of CMOS Aging in Integrated Circuits and Novel Aging Detection Techniques for SRAM Cells written by Gates Richmond Winkler and published by . This book was released on 2012 with total page 37 pages. Available in PDF, EPUB and Kindle. Book excerpt: This thesis work examines the problem of CMOS aging in VLSI integrated circuits. In nanoscale technologies, Negative and Positive Bias Temperature Instability causes an increase over time in the absolute value of the threshold voltage of PMOS and NMOS transistors which results in degraded circuit performance. Current methods to detect and compensate for aging in both digital and combinational logic and memory arrays are presented in this work. My own research contribution in the field of SRAM aging detection is then described. Modifications to standard 6T SRAM cells create a built in sensor which can detect effects of Bias Temperature Instability on the NMOS and PMOS transistors of an SRAM cell. The proposed design allows for a check process, which can observe an increase in transistor threshold voltage as a result of aging effects directly in a cell which is actually used as a memory unit. The proposed modifications allow for detections of aging while having a minimized impact on area and performance of a standard 6T SRAM cell.
Download or read book Aging Degradation and Countermeasures written by Shailesh More and published by Sudwestdeutscher Verlag Fur Hochschulschriften AG. This book was released on 2012 with total page 140 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book summarizes the outcome of investigations on the effects of aging mechanisms induced parameter shifts and performance degradation in analog and mixed signal integrated circuits. Degradation induced due to aging mechanisms like bias temperature instability, conducting and non-conducting hot carrier injection in NMOS and PMOS devices leads to increased challenges in design of reliable circuits in deep-submicrometer CMOS technologies. The lifetime degradation induces threshold voltage and drain current shifts that can result into mismatch in matched transistor pairs which is especially important for analog and mixed signal circuit's accuracy. The investigations are done based on analytical evaluation, aging simulation and measurements using sample circuits implemented in state-of-the-art 32nm high-k metal gate CMOS technology. Calibration and correction techniques suitable for overcoming time varying aging induced circuit performance degradation are proposed and investigated. This book is structured to guide the reader from important aging mechanisms, over to aging degradation in analog and mixed signal building blocks and countermeasures to overcome these effects.
Download or read book Analog IC Reliability in Nanometer CMOS written by Elie Maricau and published by Springer. This book was released on 2013-01-09 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.
Download or read book Variation aware and Aging aware Design Tools and Techniques for Nanometer scale Integrated Circuits written by Saket Gupta and published by . This book was released on 2012 with total page 153 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book An Evaluation of High Temperature Accelerated Aging Tests Used on Integrated Circuits written by J. P. Gracey and published by . This book was released on 1986 with total page 49 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Aging Degradation and Countermeasures in Deep submicrometer Analog and Mixed Signal Integrated Circuits written by Shailesh More and published by . This book was released on 2012 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Finding All Possible Critical Paths for On line Monitoring of Aging in Integrated Circuits written by Dominik Lorenz and published by . This book was released on 2011 with total page 20 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Encyclopedia of Integrated Circuits written by Walter H. Buchsbaum and published by Prentice Hall. This book was released on 1981 with total page 452 pages. Available in PDF, EPUB and Kindle. Book excerpt: